Silica Nanorod-Array Films with Very Low Refractive Indices
The refractive-index contrast is an important figure of merit for dielectric multilayer structures, optical resonators, and photonic crystals. This represents a strong driving force for novel materials that have refractive indices lower than those of conventional optically transparent materials. Sil...
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| Veröffentlicht in: | Nano letters 2005-07, Vol.5 (7), p.1385-1387 |
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| container_title | Nano letters |
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| creator | Xi, J.-Q Kim, Jong Kyu Schubert, E. F |
| description | The refractive-index contrast is an important figure of merit for dielectric multilayer structures, optical resonators, and photonic crystals. This represents a strong driving force for novel materials that have refractive indices lower than those of conventional optically transparent materials. Silica nanorod-array dielectric films with unprecedented low refractive indices of 1.08 are demonstrated and shown to have viable optical properties including enhanced reflectivity of a single-pair distributed Bragg reflector. |
| doi_str_mv | 10.1021/nl050698k |
| format | Article |
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F</creatorcontrib><title>Silica Nanorod-Array Films with Very Low Refractive Indices</title><title>Nano letters</title><addtitle>Nano Lett</addtitle><description>The refractive-index contrast is an important figure of merit for dielectric multilayer structures, optical resonators, and photonic crystals. This represents a strong driving force for novel materials that have refractive indices lower than those of conventional optically transparent materials. Silica nanorod-array dielectric films with unprecedented low refractive indices of 1.08 are demonstrated and shown to have viable optical properties including enhanced reflectivity of a single-pair distributed Bragg reflector.</description><subject>Applied sciences</subject><subject>Birefringence</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Materials Testing</subject><subject>Membranes, Artificial</subject><subject>Microelectronic fabrication (materials and surfaces technology)</subject><subject>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</subject><subject>Nanotubes - analysis</subject><subject>Nanotubes - chemistry</subject><subject>Nanotubes - ultrastructure</subject><subject>Optics and Photonics - instrumentation</subject><subject>Particle Size</subject><subject>Physics</subject><subject>Refractometry</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Silicon Dioxide - analysis</subject><subject>Silicon Dioxide - chemistry</subject><subject>Structure of solids and liquids; crystallography</subject><issn>1530-6984</issn><issn>1530-6992</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNptkD1PwzAQhi0EoqUw8AdQFpAYAnbs2LGYqopCpQokqFijs-MIl3wUO2nVf0-gUWFguhseve_dg9A5wTcER-S2KnCMuUw-DtCQxBSHXMrocL8nbIBOvF9ijCWN8TEaEE5EEjE6RHevtrAagieoaldn4dg52AZTW5Q-2NjmPXgzbhvM603wYnIHurFrE8yqzGrjT9FRDoU3Z_0cocX0fjF5DOfPD7PJeB4CZbQJE62VULmESElFgKoEgBPJskximTEjuqNAcIoNE4QCCMWUFJrJOM-kFnSErnaxK1d_tsY3aWm9NkUBlalbn_KEEyoj3oHXO1C72ntn8nTlbAlumxKcfotK96I69qIPbVVpsl-yN9MBlz0AXkPR_V5p6_9wMo6Sn9KeA-3TZd26qlPxT-EXf057LQ</recordid><startdate>20050701</startdate><enddate>20050701</enddate><creator>Xi, J.-Q</creator><creator>Kim, Jong Kyu</creator><creator>Schubert, E. 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F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a343t-8ccb7bf9a2b9b1a3b8aa6194dd909d4e7935a7630e4713aa7b4b97c495fd9c73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Birefringence</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Materials Testing</topic><topic>Membranes, Artificial</topic><topic>Microelectronic fabrication (materials and surfaces technology)</topic><topic>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</topic><topic>Nanotubes - analysis</topic><topic>Nanotubes - chemistry</topic><topic>Nanotubes - ultrastructure</topic><topic>Optics and Photonics - instrumentation</topic><topic>Particle Size</topic><topic>Physics</topic><topic>Refractometry</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Silicon Dioxide - analysis</topic><topic>Silicon Dioxide - chemistry</topic><topic>Structure of solids and liquids; crystallography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Xi, J.-Q</creatorcontrib><creatorcontrib>Kim, Jong Kyu</creatorcontrib><creatorcontrib>Schubert, E. F</creatorcontrib><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Nano letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Xi, J.-Q</au><au>Kim, Jong Kyu</au><au>Schubert, E. F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Silica Nanorod-Array Films with Very Low Refractive Indices</atitle><jtitle>Nano letters</jtitle><addtitle>Nano Lett</addtitle><date>2005-07-01</date><risdate>2005</risdate><volume>5</volume><issue>7</issue><spage>1385</spage><epage>1387</epage><pages>1385-1387</pages><issn>1530-6984</issn><eissn>1530-6992</eissn><abstract>The refractive-index contrast is an important figure of merit for dielectric multilayer structures, optical resonators, and photonic crystals. This represents a strong driving force for novel materials that have refractive indices lower than those of conventional optically transparent materials. 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| identifier | ISSN: 1530-6984 |
| ispartof | Nano letters, 2005-07, Vol.5 (7), p.1385-1387 |
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| language | eng |
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| source | MEDLINE; American Chemical Society Journals |
| subjects | Applied sciences Birefringence Condensed matter: structure, mechanical and thermal properties Electronics Exact sciences and technology Materials Testing Membranes, Artificial Microelectronic fabrication (materials and surfaces technology) Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Nanotubes - analysis Nanotubes - chemistry Nanotubes - ultrastructure Optics and Photonics - instrumentation Particle Size Physics Refractometry Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Silicon Dioxide - analysis Silicon Dioxide - chemistry Structure of solids and liquids crystallography |
| title | Silica Nanorod-Array Films with Very Low Refractive Indices |
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