Electron irradiation-induced destruction of carbon nanotubes in electron microscopes

Observations of carbon nanotubes under exposure to electron beam irradiation in standard transmission electron microscope (TEM) and scanning electron microscope (SEM) systems show that such treatment in some cases can cause severe damage of the nanotube structure, even at electron energies far below...

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Veröffentlicht in:	Ultramicroscopy 2007-12, Vol.108 (1), p.52-57
Hauptverfasser:	Mølhave, Kristian, Gudnason, Sven Bjarke, Pedersen, Anders Tegtmeier, Clausen, Casper Hyttel, Horsewell, Andy, Bøggild, Peter
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron beam-induced reaction Electron irradiation Multi-wall carbon nanotube SEM TEM
Online-Zugang:	Volltext
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