Nanotribology of Octadecyltrichlorosilane Monolayers and Silicon:  Self-Mated versus Unmated Interfaces and Local Packing Density Effects

We use atomic force microscopy (AFM) to determine the frictional properties of nanoscale single-asperity contacts involving octadecyltrichlorosilane (OTS) monolayers and silicon. Quantitative AFM measurements in the wearless regime are performed using both uncoated and OTS-coated silicon AFM tips in...

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Veröffentlicht in:Langmuir 2007-08, Vol.23 (18), p.9242-9252
Hauptverfasser: Flater, Erin E, Ashurst, W. Robert, Carpick, Robert W
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Sprache:eng
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