Measurement of polyamide and polystyrene adhesion with coated-tip atomic force microscopy

This work presents atomic force microscopy (AFM) measurements of adhesion forces between polyamides, polystyrene and AFM tips coated with the same materials. The polymers employed were polyamide 6 (PA6), PA66, PA12 and polystyrene (PS). All adhesion forces between the various unmodified or modified...

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Veröffentlicht in:	Journal of colloid and interface science 2007-10, Vol.314 (1), p.52-62
Hauptverfasser:	Thio, Beng Joo Reginald, Meredith, J. Carson
Format:	Artikel
Sprache:	eng
Schlagworte:	Adhesion AFM Chemistry Colloidal state and disperse state Exact sciences and technology General and physical chemistry Intermolecular force Nylon Polyamide Surface physical chemistry Van der Waals
Online-Zugang:	Volltext
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