The characterisation of rough particle contacts by atomic force microscopy
An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO 3 particles in contact with flat mica substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting...
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| Veröffentlicht in: | Journal of colloid and interface science 2006-07, Vol.299 (2), p.665-672 |
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| container_end_page | 672 |
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| container_issue | 2 |
| container_start_page | 665 |
| container_title | Journal of colloid and interface science |
| container_volume | 299 |
| creator | George, M. Goddard, D.T. |
| description | An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO
3 particles in contact with flat mica substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting particle. Application of the method has been found to be consistent with established contact mechanics models, for both glass and UO
3 particle probes that present significantly different surface roughness. The method proposed is straightforward to apply and offers a greater insight into the influence of particle micro- and nano-roughness on adhesion. This is important for applications that rely on the control of granular flow such as pellet or tablet manufacture. |
| doi_str_mv | 10.1016/j.jcis.2006.03.021 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_68042564</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0021979706002219</els_id><sourcerecordid>68042564</sourcerecordid><originalsourceid>FETCH-LOGICAL-c384t-9cf15cdb92e9e7f625d6e02a3a3e2fec66b3bf92e9c10faf368981dbeb1c58a23</originalsourceid><addsrcrecordid>eNp9kE1v2zAMhoWiRZu1_QM7DL50N3uiFMsWsMsQ7BMFeknPgkxTiwLHyiSnQP59ZSRYbz2RIB--IB7GPgKvgIP6sq226FMlOFcVlxUXcMEWwHVdNsDlJVvwPCp1o5sb9iGlLecAda2v2Q0oJQE0LNif9YYK3NhocaLok518GIvgihgOfzfF3sbJ45CRME4ZSUV3LOwUdh4LFyJSkbsYEob98Y5dOTskuj_XW_b84_t69at8fPr5e_XtsUTZLqdSo4Ma-04L0tQ4JepeERdWWknCESrVyc7NWwTurJOq1S30HXWAdWuFvGWfT7n7GP4dKE1m5xPSMNiRwiEZ1fKlqNUyg-IEzh-mSM7so9_ZeDTAzWzQbM1s0MwGDZcm68pHn87ph25H_dvJWVkGHs6ATWgHF-04Z_znmlbJWqvMfT1xlF28eIomoacRqfeRcDJ98O_98QobfpBV</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>68042564</pqid></control><display><type>article</type><title>The characterisation of rough particle contacts by atomic force microscopy</title><source>Elsevier ScienceDirect Journals</source><creator>George, M. ; Goddard, D.T.</creator><creatorcontrib>George, M. ; Goddard, D.T.</creatorcontrib><description>An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO
3 particles in contact with flat mica substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting particle. Application of the method has been found to be consistent with established contact mechanics models, for both glass and UO
3 particle probes that present significantly different surface roughness. The method proposed is straightforward to apply and offers a greater insight into the influence of particle micro- and nano-roughness on adhesion. This is important for applications that rely on the control of granular flow such as pellet or tablet manufacture.</description><identifier>ISSN: 0021-9797</identifier><identifier>EISSN: 1095-7103</identifier><identifier>DOI: 10.1016/j.jcis.2006.03.021</identifier><identifier>PMID: 16631191</identifier><identifier>CODEN: JCISA5</identifier><language>eng</language><publisher>San Diego, CA: Elsevier Inc</publisher><subject>Adhesion ; Atomic force microscopy ; Chemistry ; Contact radius ; Exact sciences and technology ; General and physical chemistry ; Surface roughness</subject><ispartof>Journal of colloid and interface science, 2006-07, Vol.299 (2), p.665-672</ispartof><rights>2006 Elsevier Inc.</rights><rights>2006 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c384t-9cf15cdb92e9e7f625d6e02a3a3e2fec66b3bf92e9c10faf368981dbeb1c58a23</citedby><cites>FETCH-LOGICAL-c384t-9cf15cdb92e9e7f625d6e02a3a3e2fec66b3bf92e9c10faf368981dbeb1c58a23</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0021979706002219$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,65309</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17863596$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/16631191$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>George, M.</creatorcontrib><creatorcontrib>Goddard, D.T.</creatorcontrib><title>The characterisation of rough particle contacts by atomic force microscopy</title><title>Journal of colloid and interface science</title><addtitle>J Colloid Interface Sci</addtitle><description>An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO
3 particles in contact with flat mica substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting particle. Application of the method has been found to be consistent with established contact mechanics models, for both glass and UO
3 particle probes that present significantly different surface roughness. The method proposed is straightforward to apply and offers a greater insight into the influence of particle micro- and nano-roughness on adhesion. This is important for applications that rely on the control of granular flow such as pellet or tablet manufacture.</description><subject>Adhesion</subject><subject>Atomic force microscopy</subject><subject>Chemistry</subject><subject>Contact radius</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Surface roughness</subject><issn>0021-9797</issn><issn>1095-7103</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNp9kE1v2zAMhoWiRZu1_QM7DL50N3uiFMsWsMsQ7BMFeknPgkxTiwLHyiSnQP59ZSRYbz2RIB--IB7GPgKvgIP6sq226FMlOFcVlxUXcMEWwHVdNsDlJVvwPCp1o5sb9iGlLecAda2v2Q0oJQE0LNif9YYK3NhocaLok518GIvgihgOfzfF3sbJ45CRME4ZSUV3LOwUdh4LFyJSkbsYEob98Y5dOTskuj_XW_b84_t69at8fPr5e_XtsUTZLqdSo4Ma-04L0tQ4JepeERdWWknCESrVyc7NWwTurJOq1S30HXWAdWuFvGWfT7n7GP4dKE1m5xPSMNiRwiEZ1fKlqNUyg-IEzh-mSM7so9_ZeDTAzWzQbM1s0MwGDZcm68pHn87ph25H_dvJWVkGHs6ATWgHF-04Z_znmlbJWqvMfT1xlF28eIomoacRqfeRcDJ98O_98QobfpBV</recordid><startdate>20060715</startdate><enddate>20060715</enddate><creator>George, M.</creator><creator>Goddard, D.T.</creator><general>Elsevier Inc</general><general>Elsevier</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20060715</creationdate><title>The characterisation of rough particle contacts by atomic force microscopy</title><author>George, M. ; Goddard, D.T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c384t-9cf15cdb92e9e7f625d6e02a3a3e2fec66b3bf92e9c10faf368981dbeb1c58a23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Adhesion</topic><topic>Atomic force microscopy</topic><topic>Chemistry</topic><topic>Contact radius</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Surface roughness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>George, M.</creatorcontrib><creatorcontrib>Goddard, D.T.</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of colloid and interface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>George, M.</au><au>Goddard, D.T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The characterisation of rough particle contacts by atomic force microscopy</atitle><jtitle>Journal of colloid and interface science</jtitle><addtitle>J Colloid Interface Sci</addtitle><date>2006-07-15</date><risdate>2006</risdate><volume>299</volume><issue>2</issue><spage>665</spage><epage>672</epage><pages>665-672</pages><issn>0021-9797</issn><eissn>1095-7103</eissn><coden>JCISA5</coden><abstract>An Atomic Force Microscopy (AFM) reverse imaging technique has been used to determine the contact zone topography of glass and UO
3 particles in contact with flat mica substrates. A method is proposed that uses this topography to determine an effective asperity radius of curvature for the contacting particle. Application of the method has been found to be consistent with established contact mechanics models, for both glass and UO
3 particle probes that present significantly different surface roughness. The method proposed is straightforward to apply and offers a greater insight into the influence of particle micro- and nano-roughness on adhesion. This is important for applications that rely on the control of granular flow such as pellet or tablet manufacture.</abstract><cop>San Diego, CA</cop><pub>Elsevier Inc</pub><pmid>16631191</pmid><doi>10.1016/j.jcis.2006.03.021</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-9797 |
| ispartof | Journal of colloid and interface science, 2006-07, Vol.299 (2), p.665-672 |
| issn | 0021-9797 1095-7103 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_68042564 |
| source | Elsevier ScienceDirect Journals |
| subjects | Adhesion Atomic force microscopy Chemistry Contact radius Exact sciences and technology General and physical chemistry Surface roughness |
| title | The characterisation of rough particle contacts by atomic force microscopy |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T03%3A57%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=The%20characterisation%20of%20rough%20particle%20contacts%20by%20atomic%20force%20microscopy&rft.jtitle=Journal%20of%20colloid%20and%20interface%20science&rft.au=George,%20M.&rft.date=2006-07-15&rft.volume=299&rft.issue=2&rft.spage=665&rft.epage=672&rft.pages=665-672&rft.issn=0021-9797&rft.eissn=1095-7103&rft.coden=JCISA5&rft_id=info:doi/10.1016/j.jcis.2006.03.021&rft_dat=%3Cproquest_cross%3E68042564%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=68042564&rft_id=info:pmid/16631191&rft_els_id=S0021979706002219&rfr_iscdi=true |