Multivariate Analysis of TOF-SIMS Spectra of Monolayers on Scribed Silicon

Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) was performed on monolayers on scribed silicon (Siscr) derived from 1-alkenes, 1-alkynes, 1-holoalkanes, aldehydes, and acid chlorides. To rapidly determine the variation in the data without introducing user bias, a multivariate analys...

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Veröffentlicht in:	Analytical chemistry (Washington) 2005-07, Vol.77 (14), p.4654-4661
Hauptverfasser:	Yang, Li, Lua, Yit-Yian, Jiang, Guilin, Tyler, Bonnie J, Linford, Matthew R
Format:	Artikel
Sprache:	eng
Schlagworte:	Analytical chemistry Carbon Chemistry Exact sciences and technology Ions Mass spectrometry Multivariate analysis Silicon Spectrometric and optical methods
Online-Zugang:	Volltext
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