Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material
Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material's refractive index n >> 1.0) are demonstrated that incorporate...
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| Veröffentlicht in: | Optics letters 2005-06, Vol.30 (12), p.1518-1520 |
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| container_issue | 12 |
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| container_title | Optics letters |
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| creator | XI, J.-Q OJHA, Manas CHO, Woojin PLAWSKY, J. L GILL, W. N GESSMANN, Th SCHUBERT, E. F |
| description | Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material's refractive index n >> 1.0) are demonstrated that incorporate nanoporous SiO2, a low-refractive-index material (n = 1.23), as well as dense SiO2 (n = 1.46). GaP and Ag serve as the semiconductor and the metal layer, respectively. Reflectivity measurements, including angular dependence, are presented. Calculated angle-integrated TE and TM reflectivities for ODRs employing nanoporous SiO2 are R(int)/TE = 99.9% and R(int)/TM = 98.9%, respectively, indicating the high potential of the ODRs for low-loss waveguide structures. |
| doi_str_mv | 10.1364/OL.30.001518 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_pubme</sourceid><recordid>TN_cdi_proquest_miscellaneous_68022864</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>68022864</sourcerecordid><originalsourceid>FETCH-LOGICAL-p239t-c07055223f4bb2608c080931c621e081e3f5de6fd789abeef8a834796793f52b3</originalsourceid><addsrcrecordid>eNpN0EtLxDAQB_Agiruu3jxLLnrrOkmaNDnKsj5goeDjXNI2lUia1qT18e0NuIKnYeA3w_wHoXMCa8JEfl3u1gzWAIQTeYCWhDOV5YXKD9ESSC4yxRVdoJMY3wBAFIwdowURAEWh2BI9lr23rQ2mmezgtcPBdC41Q8BztP4Ve-2HcQjDHPGTLSnWEWvshs8swaDT1IfJrG_NF-71ZILV7hQdddpFc7avK_Ryu33e3Ge78u5hc7PLRsrUlDVQAOeUsi6vaypANiBBMdIISgxIYljHWyO6tpBK18Z0UkuWgol0d8dpzVbo6nfvGIb32cSp6m1sjHPam3RuJSRQKkWe4MUeznVv2moMttfhu_r7QgKXe6Bjo13K5Rsb_znJqUruB_g_au8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>68022864</pqid></control><display><type>article</type><title>Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material</title><source>Optica Publishing Group Journals</source><creator>XI, J.-Q ; OJHA, Manas ; CHO, Woojin ; PLAWSKY, J. L ; GILL, W. N ; GESSMANN, Th ; SCHUBERT, E. F</creator><creatorcontrib>XI, J.-Q ; OJHA, Manas ; CHO, Woojin ; PLAWSKY, J. L ; GILL, W. N ; GESSMANN, Th ; SCHUBERT, E. F</creatorcontrib><description>Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material's refractive index n >> 1.0) are demonstrated that incorporate nanoporous SiO2, a low-refractive-index material (n = 1.23), as well as dense SiO2 (n = 1.46). GaP and Ag serve as the semiconductor and the metal layer, respectively. Reflectivity measurements, including angular dependence, are presented. Calculated angle-integrated TE and TM reflectivities for ODRs employing nanoporous SiO2 are R(int)/TE = 99.9% and R(int)/TM = 98.9%, respectively, indicating the high potential of the ODRs for low-loss waveguide structures.</description><identifier>ISSN: 0146-9592</identifier><identifier>EISSN: 1539-4794</identifier><identifier>DOI: 10.1364/OL.30.001518</identifier><identifier>PMID: 16007793</identifier><identifier>CODEN: OPLEDP</identifier><language>eng</language><publisher>Washington, DC: Optical Society of America</publisher><subject>Applied sciences ; Electronics ; Exact sciences and technology ; Fundamental areas of phenomenology (including applications) ; Lenses, prisms and mirrors ; Light-emitting devices ; Optical elements, devices, and systems ; Optics ; Optoelectronic devices ; Physics ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Optics letters, 2005-06, Vol.30 (12), p.1518-1520</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16852993$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/16007793$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>XI, J.-Q</creatorcontrib><creatorcontrib>OJHA, Manas</creatorcontrib><creatorcontrib>CHO, Woojin</creatorcontrib><creatorcontrib>PLAWSKY, J. L</creatorcontrib><creatorcontrib>GILL, W. N</creatorcontrib><creatorcontrib>GESSMANN, Th</creatorcontrib><creatorcontrib>SCHUBERT, E. F</creatorcontrib><title>Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material</title><title>Optics letters</title><addtitle>Opt Lett</addtitle><description>Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material's refractive index n >> 1.0) are demonstrated that incorporate nanoporous SiO2, a low-refractive-index material (n = 1.23), as well as dense SiO2 (n = 1.46). GaP and Ag serve as the semiconductor and the metal layer, respectively. Reflectivity measurements, including angular dependence, are presented. Calculated angle-integrated TE and TM reflectivities for ODRs employing nanoporous SiO2 are R(int)/TE = 99.9% and R(int)/TM = 98.9%, respectively, indicating the high potential of the ODRs for low-loss waveguide structures.</description><subject>Applied sciences</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Lenses, prisms and mirrors</subject><subject>Light-emitting devices</subject><subject>Optical elements, devices, and systems</subject><subject>Optics</subject><subject>Optoelectronic devices</subject><subject>Physics</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0146-9592</issn><issn>1539-4794</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><recordid>eNpN0EtLxDAQB_Agiruu3jxLLnrrOkmaNDnKsj5goeDjXNI2lUia1qT18e0NuIKnYeA3w_wHoXMCa8JEfl3u1gzWAIQTeYCWhDOV5YXKD9ESSC4yxRVdoJMY3wBAFIwdowURAEWh2BI9lr23rQ2mmezgtcPBdC41Q8BztP4Ve-2HcQjDHPGTLSnWEWvshs8swaDT1IfJrG_NF-71ZILV7hQdddpFc7avK_Ryu33e3Ge78u5hc7PLRsrUlDVQAOeUsi6vaypANiBBMdIISgxIYljHWyO6tpBK18Z0UkuWgol0d8dpzVbo6nfvGIb32cSp6m1sjHPam3RuJSRQKkWe4MUeznVv2moMttfhu_r7QgKXe6Bjo13K5Rsb_znJqUruB_g_au8</recordid><startdate>20050615</startdate><enddate>20050615</enddate><creator>XI, J.-Q</creator><creator>OJHA, Manas</creator><creator>CHO, Woojin</creator><creator>PLAWSKY, J. L</creator><creator>GILL, W. N</creator><creator>GESSMANN, Th</creator><creator>SCHUBERT, E. F</creator><general>Optical Society of America</general><scope>IQODW</scope><scope>NPM</scope><scope>7X8</scope></search><sort><creationdate>20050615</creationdate><title>Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material</title><author>XI, J.-Q ; OJHA, Manas ; CHO, Woojin ; PLAWSKY, J. L ; GILL, W. N ; GESSMANN, Th ; SCHUBERT, E. F</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p239t-c07055223f4bb2608c080931c621e081e3f5de6fd789abeef8a834796793f52b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Lenses, prisms and mirrors</topic><topic>Light-emitting devices</topic><topic>Optical elements, devices, and systems</topic><topic>Optics</topic><topic>Optoelectronic devices</topic><topic>Physics</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>XI, J.-Q</creatorcontrib><creatorcontrib>OJHA, Manas</creatorcontrib><creatorcontrib>CHO, Woojin</creatorcontrib><creatorcontrib>PLAWSKY, J. L</creatorcontrib><creatorcontrib>GILL, W. N</creatorcontrib><creatorcontrib>GESSMANN, Th</creatorcontrib><creatorcontrib>SCHUBERT, E. F</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>MEDLINE - Academic</collection><jtitle>Optics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>XI, J.-Q</au><au>OJHA, Manas</au><au>CHO, Woojin</au><au>PLAWSKY, J. L</au><au>GILL, W. N</au><au>GESSMANN, Th</au><au>SCHUBERT, E. F</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material</atitle><jtitle>Optics letters</jtitle><addtitle>Opt Lett</addtitle><date>2005-06-15</date><risdate>2005</risdate><volume>30</volume><issue>12</issue><spage>1518</spage><epage>1520</epage><pages>1518-1520</pages><issn>0146-9592</issn><eissn>1539-4794</eissn><coden>OPLEDP</coden><abstract>Triple-layer omnidirectional reflectors (ODRs) consisting of a semiconductor, a quarter-wavelength transparent dielectric layer, and a metal have high reflectivities for all angles of incidence. Internal ODRs (ambient material's refractive index n >> 1.0) are demonstrated that incorporate nanoporous SiO2, a low-refractive-index material (n = 1.23), as well as dense SiO2 (n = 1.46). GaP and Ag serve as the semiconductor and the metal layer, respectively. Reflectivity measurements, including angular dependence, are presented. Calculated angle-integrated TE and TM reflectivities for ODRs employing nanoporous SiO2 are R(int)/TE = 99.9% and R(int)/TM = 98.9%, respectively, indicating the high potential of the ODRs for low-loss waveguide structures.</abstract><cop>Washington, DC</cop><pub>Optical Society of America</pub><pmid>16007793</pmid><doi>10.1364/OL.30.001518</doi><tpages>3</tpages></addata></record> |
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| ispartof | Optics letters, 2005-06, Vol.30 (12), p.1518-1520 |
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| source | Optica Publishing Group Journals |
| subjects | Applied sciences Electronics Exact sciences and technology Fundamental areas of phenomenology (including applications) Lenses, prisms and mirrors Light-emitting devices Optical elements, devices, and systems Optics Optoelectronic devices Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | Omnidirectional reflector using nanoporous SiO2 as a low-refractive-index material |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T04%3A35%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Omnidirectional%20reflector%20using%20nanoporous%20SiO2%20as%20a%20low-refractive-index%20material&rft.jtitle=Optics%20letters&rft.au=XI,%20J.-Q&rft.date=2005-06-15&rft.volume=30&rft.issue=12&rft.spage=1518&rft.epage=1520&rft.pages=1518-1520&rft.issn=0146-9592&rft.eissn=1539-4794&rft.coden=OPLEDP&rft_id=info:doi/10.1364/OL.30.001518&rft_dat=%3Cproquest_pubme%3E68022864%3C/proquest_pubme%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=68022864&rft_id=info:pmid/16007793&rfr_iscdi=true |