Three-dimensional particle imaging by wavefront sensing

We present two methods for three-dimensional particle metrology from a single two-dimensional view. The techniques are based on wavefront sensing where the three-dimensional location of a particle is encoded into a single image plane. The first technique is based on multiplanar imaging, and the seco...

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Bibliographische Detailangaben

Veröffentlicht in:	Optics letters 2006-05, Vol.31 (9), p.1220-1222
Hauptverfasser:	TOWERS, Catherine E, TOWERS, David P, CAMPBELL, Heather I, SIJIONG ZHANG, GREENAWAY, Alan H
Format:	Artikel
Sprache:	eng
Schlagworte:	Exact sciences and technology Fundamental areas of phenomenology (including applications) Image forming and processing Imaging and optical processing Optics Physics
Online-Zugang:	Volltext
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