Single atomic contact adhesion and dissipation in dynamic force microscopy

By combining dynamic force microscopy experiments and first-principles calculations, we have studied the adhesion associated with a single atomic contact between a nanoasperity--the tip apex--and a semiconductor surface--the Ge(111)-c(2 x 8). The nanoasperity's termination has been atomically c...

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Veröffentlicht in:	Physical review letters 2006-03, Vol.96 (10), p.106101-106101, Article 106101
Hauptverfasser:	Oyabu, Noriaki, Pou, Pablo, Sugimoto, Yoshiaki, Jelinek, Pavel, Abe, Masayuki, Morita, Seizo, Pérez, Rubén, Custance, Oscar
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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