Reduction of time-varying nanotesla magnetic fields from electric power lines by twisting

Time-varying magnetic fields generated by electrical power lines in the laboratory can disturb electron microscope imaging. Modern microscopes require these fields to be below 10 nT [2]. We calculated and measured magnetic fields from straight and twisted current-carrying wires, and show that withou...

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Veröffentlicht in:	Journal of electron microscopy 2009-08, Vol.58 (4), p.251-252
Hauptverfasser:	Been, Auke J., Folkertsma, Gerrit A., Verputten, Hein H.J., Bolhuis, Thijs, Abelmann, Leon
Format:	Artikel
Sprache:	eng
Schlagworte:	calculations disturbance electric circuitry Electric currents Electron microscopes electron microscopy instrumentation Laboratories Magnetic fields
Online-Zugang:	Volltext
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