Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra
This paper reports on the effect of random Gaussian roughness with rms roughness values of 5-20 microm on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximati...
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| Veröffentlicht in: | Optics letters 2009-07, Vol.34 (13), p.1927-1929 |
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| container_end_page | 1929 |
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| container_issue | 13 |
| container_start_page | 1927 |
| container_title | Optics letters |
| container_volume | 34 |
| creator | JAGANNATHAN, Arunkumar GATESMAN, Andrew J GILES, Robert H |
| description | This paper reports on the effect of random Gaussian roughness with rms roughness values of 5-20 microm on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 microm. |
| doi_str_mv | 10.1364/ol.34.001927 |
| format | Article |
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By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. 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By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 microm.</description><subject>Diffraction and scattering</subject><subject>Exact sciences and technology</subject><subject>Fundamental areas of phenomenology (including applications)</subject><subject>Optics</subject><subject>Physics</subject><subject>Wave optics</subject><issn>0146-9592</issn><issn>1539-4794</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNpFkEtPwzAQhC0EouVx44xygRMpduzE8RFVvKRKvcA5bBy7DXIeeJMD_fW4NILDakc7n0arIeSK0QXjmbjv3IKLBaVMJfKIzFnKVSykEsdkTpnIYpWqZEbOED8ppZnk_JTMmEplGDEnH8steNCD8fUOhrpro85Gvhs329YgRn0wGxNc3N-DAudqHeHoLWiD0Yh1u4mCD1vjh13kjXVG_-ZgH4SHC3JiwaG5nPY5eX96fFu-xKv18-vyYRVrnqdDnII0FVUAwDNdUm4FWEoTYDatspIBV7ZSotJKQyUzMNImeSJySDQHkZYJPye3h9zed1-jwaFoatTGOWhNN2KRSSHSXNEA3h1A7TvE8HDR-7oB_10wWuwbLdargovi0GjAr6fcsWxM9Q9PFQbgZgIANTjrodU1_nEJk7nKqOQ_wsCBGg</recordid><startdate>20090701</startdate><enddate>20090701</enddate><creator>JAGANNATHAN, Arunkumar</creator><creator>GATESMAN, Andrew J</creator><creator>GILES, Robert H</creator><general>Optical Society of America</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20090701</creationdate><title>Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra</title><author>JAGANNATHAN, Arunkumar ; GATESMAN, Andrew J ; GILES, Robert H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-5a7ed09aaa36cb03f4af002a1f5d6b1a39fd94dc9cad76ae7f28248a2c3a45b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Diffraction and scattering</topic><topic>Exact sciences and technology</topic><topic>Fundamental areas of phenomenology (including applications)</topic><topic>Optics</topic><topic>Physics</topic><topic>Wave optics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>JAGANNATHAN, Arunkumar</creatorcontrib><creatorcontrib>GATESMAN, Andrew J</creatorcontrib><creatorcontrib>GILES, Robert H</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Optics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>JAGANNATHAN, Arunkumar</au><au>GATESMAN, Andrew J</au><au>GILES, Robert H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra</atitle><jtitle>Optics letters</jtitle><addtitle>Opt Lett</addtitle><date>2009-07-01</date><risdate>2009</risdate><volume>34</volume><issue>13</issue><spage>1927</spage><epage>1929</epage><pages>1927-1929</pages><issn>0146-9592</issn><eissn>1539-4794</eissn><coden>OPLEDP</coden><abstract>This paper reports on the effect of random Gaussian roughness with rms roughness values of 5-20 microm on the terahertz reflection spectra of metallic aluminum surfaces using Fourier transform IR spectroscopy. By comparing experimental data with a theoretical model based on the Kirchhoff approximation, the rms roughness of a surface is accurately determined. The rms roughness determined by this method is in good agreement with the rms roughness measured using a stylus surface profilometer. In addition, we demonstrate that this method can be used to clearly resolve rough surfaces that differ in rms roughness by approximately 1 microm.</abstract><cop>Washington, DC</cop><pub>Optical Society of America</pub><pmid>19571954</pmid><doi>10.1364/ol.34.001927</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0146-9592 |
| ispartof | Optics letters, 2009-07, Vol.34 (13), p.1927-1929 |
| issn | 0146-9592 1539-4794 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_67445890 |
| source | Optica Publishing Group Journals |
| subjects | Diffraction and scattering Exact sciences and technology Fundamental areas of phenomenology (including applications) Optics Physics Wave optics |
| title | Characterization of roughness parameters of metallic surfaces using terahertz reflection spectra |
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