A novel method for measuring continuous dispersion spectrum of electro-optic coefficients of nonlinear materials
We report, for the first time to our knowledge, a novel and simple method for measuring continuous dispersion spectrum of unclamped linear electro-optic (EO) coefficient using a white-light interferometry. This method detects phase changes of the interference patterns with and without an applied ele...
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Veröffentlicht in: | Optics express 2009-06, Vol.17 (12), p.9828-9833 |
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creator | Lee, Seoung Hun Kim, Seung Hwan Kim, Kyong Hon Lee, Min Hee Lee, El-Hang |
description | We report, for the first time to our knowledge, a novel and simple method for measuring continuous dispersion spectrum of unclamped linear electro-optic (EO) coefficient using a white-light interferometry. This method detects phase changes of the interference patterns with and without an applied electric voltage, and allows a simultaneous measurement of wavelength and polarization dependent EO coefficients of birefringent materials. Both of the unclamped EO coefficients, r(13) (T) and r(33) (T), of a congruent LiNbO(3) (LN) crystal have been measured simultaneously with the method, and their continuous dispersion curves have been also obtained. |
doi_str_mv | 10.1364/oe.17.009828 |
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Both of the unclamped EO coefficients, r(13) (T) and r(33) (T), of a congruent LiNbO(3) (LN) crystal have been measured simultaneously with the method, and their continuous dispersion curves have been also obtained.</description><identifier>ISSN: 1094-4087</identifier><identifier>EISSN: 1094-4087</identifier><identifier>DOI: 10.1364/oe.17.009828</identifier><identifier>PMID: 19506632</identifier><language>eng</language><publisher>United States</publisher><subject>Electromagnetic Fields ; Interferometry - methods ; Light ; Lighting - methods ; Manufactured Materials ; Materials Testing - methods ; Refractometry - methods ; Scattering, Radiation</subject><ispartof>Optics express, 2009-06, Vol.17 (12), p.9828-9833</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c393t-8acf18cbfcf95b2569fa927aef53d5e896ee6a9d62ae9b39fb7ae6e7a88f2dd93</citedby><cites>FETCH-LOGICAL-c393t-8acf18cbfcf95b2569fa927aef53d5e896ee6a9d62ae9b39fb7ae6e7a88f2dd93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,864,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/19506632$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Lee, Seoung Hun</creatorcontrib><creatorcontrib>Kim, Seung Hwan</creatorcontrib><creatorcontrib>Kim, Kyong Hon</creatorcontrib><creatorcontrib>Lee, Min Hee</creatorcontrib><creatorcontrib>Lee, El-Hang</creatorcontrib><title>A novel method for measuring continuous dispersion spectrum of electro-optic coefficients of nonlinear materials</title><title>Optics express</title><addtitle>Opt Express</addtitle><description>We report, for the first time to our knowledge, a novel and simple method for measuring continuous dispersion spectrum of unclamped linear electro-optic (EO) coefficient using a white-light interferometry. 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This method detects phase changes of the interference patterns with and without an applied electric voltage, and allows a simultaneous measurement of wavelength and polarization dependent EO coefficients of birefringent materials. Both of the unclamped EO coefficients, r(13) (T) and r(33) (T), of a congruent LiNbO(3) (LN) crystal have been measured simultaneously with the method, and their continuous dispersion curves have been also obtained.</abstract><cop>United States</cop><pmid>19506632</pmid><doi>10.1364/oe.17.009828</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Electromagnetic Fields Interferometry - methods Light Lighting - methods Manufactured Materials Materials Testing - methods Refractometry - methods Scattering, Radiation |
title | A novel method for measuring continuous dispersion spectrum of electro-optic coefficients of nonlinear materials |
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