Advanced detection systems for X-ray fluorescence excitation spectroscopy
This paper accounts for selected detector developments carried out over the past 15 years within the ESRF X‐ray Absorption Spectroscopy group. This includes various types of photodiodes used as integrated current detectors. Special emphasis is put on the long‐standing development of a Si drift‐diode...
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| Veröffentlicht in: | Journal of synchrotron radiation 2005-01, Vol.12 (1), p.57-69 |
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| creator | Goulon, J. Rogalev, A. Goujon, G. Gauthier, Ch Moguiline, E. Solé, A. Feite, S. Wilhelm, F. Jaouen, N. Goulon-Ginet, Ch Dressler, P. Rohr, P. Lampert, M.-O. Henck, R. |
| description | This paper accounts for selected detector developments carried out over the past 15 years within the ESRF X‐ray Absorption Spectroscopy group. This includes various types of photodiodes used as integrated current detectors. Special emphasis is put on the long‐standing development of a Si drift‐diode array suitable for energy‐dispersive detection of X‐ray fluorescence. This detector, which is now operational, was used to record high‐quality XMCD/XAFS spectra on [Fe70Pt30] nanoparticles highly dispersed on a Si wafer. Using numerically deconvoluted spectra, energy resolution was decreased to 82 eV for the Si Kαβ line, 126 eV for the Fe Kα line and 176 eV for the Pt Lα line. A high‐vacuum‐compatible high‐energy‐resolution crystal analyzer was also installed on ID12, making it possible to record X‐ray fluorescence excitation spectra in the photon‐in/photon‐out mode over a wide spectral range. Prospects of adapting these methods in order to investigate biological samples are briefly discussed. |
| doi_str_mv | 10.1107/S090904950402878X |
| format | Article |
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Synchrotron Rad</addtitle><description>This paper accounts for selected detector developments carried out over the past 15 years within the ESRF X‐ray Absorption Spectroscopy group. This includes various types of photodiodes used as integrated current detectors. Special emphasis is put on the long‐standing development of a Si drift‐diode array suitable for energy‐dispersive detection of X‐ray fluorescence. This detector, which is now operational, was used to record high‐quality XMCD/XAFS spectra on [Fe70Pt30] nanoparticles highly dispersed on a Si wafer. Using numerically deconvoluted spectra, energy resolution was decreased to 82 eV for the Si Kαβ line, 126 eV for the Fe Kα line and 176 eV for the Pt Lα line. A high‐vacuum‐compatible high‐energy‐resolution crystal analyzer was also installed on ID12, making it possible to record X‐ray fluorescence excitation spectra in the photon‐in/photon‐out mode over a wide spectral range. Prospects of adapting these methods in order to investigate biological samples are briefly discussed.</description><subject>Applied sciences</subject><subject>digital filtering</subject><subject>Electronics</subject><subject>Equipment Design</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Optoelectronic devices</subject><subject>Photons</subject><subject>Physics</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>silicon drift-diodes</subject><subject>Spectrometry, Fluorescence - instrumentation</subject><subject>Spectrum Analysis - instrumentation</subject><subject>Synchrotron radiation instrumentation</subject><subject>X- and γ-ray instruments and techniques</subject><subject>X-ray absorption spectroscopy</subject><subject>X-ray detectors</subject><subject>X-Rays</subject><issn>1600-5775</issn><issn>0909-0495</issn><issn>1600-5775</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNqFkclOwzAQhi0EgrI8ABeUC9wC4zheckQVLUUsh7KUk-U4jhRIm2InQN4eR4kAiQOyRp7D98_yD0KHGE4xBn42h8S_OKEQQyS4WGygEWYAIeWcbv7Kd9Cucy8AmPGIbKMdTBlmhLERmp1n72qlTRZkpja6LqpV4FpXm6UL8soGi9CqNsjLprLGaePJwHzqolY9ufYSWzldrdt9tJWr0pmD4d9DD5OL-_FleH03nY3Pr0NNgYswjlJBVRRn2tAkFSZKsOJAMCc694FFlAPLFRc4pUwRHKcUjAbKQGRMCEH20Elfd22rt8a4Wi4LP1lZqpWpGicZJ4SSCDyIe1D7CZ01uVzbYqlsKzHIzj_5xz-vORqKN-nSZD-KwTAPHA-AclqVufXmFe6HY5TRmHTNRc99FKVp_-8sr-bPlzPAuFsw7KWFP8Pnt1TZ1243TuXT7VQmMXmckOmVvCFfZP6Wtw</recordid><startdate>200501</startdate><enddate>200501</enddate><creator>Goulon, J.</creator><creator>Rogalev, A.</creator><creator>Goujon, G.</creator><creator>Gauthier, Ch</creator><creator>Moguiline, E.</creator><creator>Solé, A.</creator><creator>Feite, S.</creator><creator>Wilhelm, F.</creator><creator>Jaouen, N.</creator><creator>Goulon-Ginet, Ch</creator><creator>Dressler, P.</creator><creator>Rohr, P.</creator><creator>Lampert, M.-O.</creator><creator>Henck, R.</creator><general>Munksgaard International Publishers</general><general>Blackwell</general><scope>BSCLL</scope><scope>IQODW</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>200501</creationdate><title>Advanced detection systems for X-ray fluorescence excitation spectroscopy</title><author>Goulon, J. ; Rogalev, A. ; Goujon, G. ; Gauthier, Ch ; Moguiline, E. ; Solé, A. ; Feite, S. ; Wilhelm, F. ; Jaouen, N. ; Goulon-Ginet, Ch ; Dressler, P. ; Rohr, P. ; Lampert, M.-O. ; Henck, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c5078-42b85a24dce59b8e291a703173cf73c182f06fa781b56a314b50ec05608d68883</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Applied sciences</topic><topic>digital filtering</topic><topic>Electronics</topic><topic>Equipment Design</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Optoelectronic devices</topic><topic>Photons</topic><topic>Physics</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>silicon drift-diodes</topic><topic>Spectrometry, Fluorescence - instrumentation</topic><topic>Spectrum Analysis - instrumentation</topic><topic>Synchrotron radiation instrumentation</topic><topic>X- and γ-ray instruments and techniques</topic><topic>X-ray absorption spectroscopy</topic><topic>X-ray detectors</topic><topic>X-Rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Goulon, J.</creatorcontrib><creatorcontrib>Rogalev, A.</creatorcontrib><creatorcontrib>Goujon, G.</creatorcontrib><creatorcontrib>Gauthier, Ch</creatorcontrib><creatorcontrib>Moguiline, E.</creatorcontrib><creatorcontrib>Solé, A.</creatorcontrib><creatorcontrib>Feite, S.</creatorcontrib><creatorcontrib>Wilhelm, F.</creatorcontrib><creatorcontrib>Jaouen, N.</creatorcontrib><creatorcontrib>Goulon-Ginet, Ch</creatorcontrib><creatorcontrib>Dressler, P.</creatorcontrib><creatorcontrib>Rohr, P.</creatorcontrib><creatorcontrib>Lampert, M.-O.</creatorcontrib><creatorcontrib>Henck, R.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Journal of synchrotron radiation</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Goulon, J.</au><au>Rogalev, A.</au><au>Goujon, G.</au><au>Gauthier, Ch</au><au>Moguiline, E.</au><au>Solé, A.</au><au>Feite, S.</au><au>Wilhelm, F.</au><au>Jaouen, N.</au><au>Goulon-Ginet, Ch</au><au>Dressler, P.</au><au>Rohr, P.</au><au>Lampert, M.-O.</au><au>Henck, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Advanced detection systems for X-ray fluorescence excitation spectroscopy</atitle><jtitle>Journal of synchrotron radiation</jtitle><addtitle>J. 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| identifier | ISSN: 1600-5775 |
| ispartof | Journal of synchrotron radiation, 2005-01, Vol.12 (1), p.57-69 |
| issn | 1600-5775 0909-0495 1600-5775 |
| language | eng |
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| source | Wiley Online Library Open Access |
| subjects | Applied sciences digital filtering Electronics Equipment Design Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Optoelectronic devices Photons Physics Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices silicon drift-diodes Spectrometry, Fluorescence - instrumentation Spectrum Analysis - instrumentation Synchrotron radiation instrumentation X- and γ-ray instruments and techniques X-ray absorption spectroscopy X-ray detectors X-Rays |
| title | Advanced detection systems for X-ray fluorescence excitation spectroscopy |
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