Fine structure and X-ray microanalysis of silicified woods from a Tertiary basin Pohang, Korea by scanning electron microscopy

Anatomical descriptions are provided on silicified woods from a Tertiary basin Pohang, Korea by scanning electron microscopy and X-ray microanalysis. The silicified woods appeared to retain the original exterior morphology of the once grown trees, and exhibited various colors on the surface. As a co...

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Veröffentlicht in:Micron (Oxford, England : 1993) England : 1993), 2009-07, Vol.40 (5), p.519-525
Hauptverfasser: Kim, Ki Woo, Yoon, Chul Jong, Kim, Pan-Gi, Lee, Myung Bo, Lim, Joo-Hoon
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Sprache:eng
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