Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces

We measured the adsorption characteristics of trinitrotoluene (TNT) on piezoresistive silicon microcantilever surfaces under ambient air using a well-characterized TNT vapor generator. This allowed us to quantify the adsorption parameters and to estimate the sticking coefficient. The sticking coeffi...

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Veröffentlicht in:Langmuir 2004-03, Vol.20 (7), p.2690-2694
Hauptverfasser: Pinnaduwage, L. A, Yi, D, Tian, F, Thundat, T, Lareau, R. T
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container_issue 7
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container_title Langmuir
container_volume 20
creator Pinnaduwage, L. A
Yi, D
Tian, F
Thundat, T
Lareau, R. T
description We measured the adsorption characteristics of trinitrotoluene (TNT) on piezoresistive silicon microcantilever surfaces under ambient air using a well-characterized TNT vapor generator. This allowed us to quantify the adsorption parameters and to estimate the sticking coefficient. The sticking coefficient initially increases with TNT exposure time and then levels off around 0.3. Atomic force microscopy images of silicon surfaces exposed to TNT revealed “island” formation of the adsorbate on the silicon surface. At low exposure times, mainly the number density of islands increased with exposure time; at longer exposure times, the size (in particular, height) of the islands grew, corresponding to the higher sticking coefficients. These observations can be qualitatively explained via the difference between TNT−surface and TNT−TNT interactions mediated by water molecules.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_67276128</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>67276128</sourcerecordid><originalsourceid>FETCH-LOGICAL-a349t-421214f0c3dd38f55297a6e7ca2866ca4c952a560b9b060565482ea1ddd9d5b63</originalsourceid><addsrcrecordid>eNptkEtPwzAQhC0EoqVw4A-gXEDiEPAjdpxj1VIKKg-p7YWL5dqO5JLGxU4Q_HuMUpULp5VmP83sDgDnCN4giNFtJSGhjPLyAPQRxTClHOeHoA_zjKR5xkgPnISwhhAWJCuOQQ9RTigivA8ehzo4v22sqxNXJgtva9t417iqNbVJorqslZON0cncVlZF4ckq75SsG1uZT-OTeetLqUw4BUelrII5280BWE7uFqNpOnu5fxgNZ6mM4U2aYYRRVkJFtCa8pBQXuWQmVxJzxpTMVEGxpAyuihVkMP6VcWwk0loXmq4YGYCrznfr3UdrQiM2NihTVbI2rg2C5ThnCPMIXndgvDcEb0qx9XYj_bdAUPwWJ_bFRfZiZ9quNkb_kbumIpB2gA2N-drvpX-PgSSnYvE6F-xtMZ7w8bOYRv6y46UKYu1aX8dO_gn-AaL_g8M</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>67276128</pqid></control><display><type>article</type><title>Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces</title><source>MEDLINE</source><source>ACS Publications</source><creator>Pinnaduwage, L. A ; Yi, D ; Tian, F ; Thundat, T ; Lareau, R. T</creator><creatorcontrib>Pinnaduwage, L. A ; Yi, D ; Tian, F ; Thundat, T ; Lareau, R. T</creatorcontrib><description>We measured the adsorption characteristics of trinitrotoluene (TNT) on piezoresistive silicon microcantilever surfaces under ambient air using a well-characterized TNT vapor generator. This allowed us to quantify the adsorption parameters and to estimate the sticking coefficient. The sticking coefficient initially increases with TNT exposure time and then levels off around 0.3. Atomic force microscopy images of silicon surfaces exposed to TNT revealed “island” formation of the adsorbate on the silicon surface. At low exposure times, mainly the number density of islands increased with exposure time; at longer exposure times, the size (in particular, height) of the islands grew, corresponding to the higher sticking coefficients. These observations can be qualitatively explained via the difference between TNT−surface and TNT−TNT interactions mediated by water molecules.</description><identifier>ISSN: 0743-7463</identifier><identifier>EISSN: 1520-5827</identifier><identifier>DOI: 10.1021/la035658f</identifier><identifier>PMID: 15835138</identifier><language>eng</language><publisher>United States: American Chemical Society</publisher><subject>Adsorption ; Microchemistry ; Microscopy, Atomic Force - methods ; Sensitivity and Specificity ; Silicon - chemistry ; Surface Properties ; Time Factors ; Trinitrotoluene - chemistry</subject><ispartof>Langmuir, 2004-03, Vol.20 (7), p.2690-2694</ispartof><rights>Copyright © 2004 American Chemical Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a349t-421214f0c3dd38f55297a6e7ca2866ca4c952a560b9b060565482ea1ddd9d5b63</citedby><cites>FETCH-LOGICAL-a349t-421214f0c3dd38f55297a6e7ca2866ca4c952a560b9b060565482ea1ddd9d5b63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://pubs.acs.org/doi/pdf/10.1021/la035658f$$EPDF$$P50$$Gacs$$H</linktopdf><linktohtml>$$Uhttps://pubs.acs.org/doi/10.1021/la035658f$$EHTML$$P50$$Gacs$$H</linktohtml><link.rule.ids>314,780,784,2765,27076,27924,27925,56738,56788</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/15835138$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Pinnaduwage, L. A</creatorcontrib><creatorcontrib>Yi, D</creatorcontrib><creatorcontrib>Tian, F</creatorcontrib><creatorcontrib>Thundat, T</creatorcontrib><creatorcontrib>Lareau, R. T</creatorcontrib><title>Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces</title><title>Langmuir</title><addtitle>Langmuir</addtitle><description>We measured the adsorption characteristics of trinitrotoluene (TNT) on piezoresistive silicon microcantilever surfaces under ambient air using a well-characterized TNT vapor generator. This allowed us to quantify the adsorption parameters and to estimate the sticking coefficient. The sticking coefficient initially increases with TNT exposure time and then levels off around 0.3. Atomic force microscopy images of silicon surfaces exposed to TNT revealed “island” formation of the adsorbate on the silicon surface. At low exposure times, mainly the number density of islands increased with exposure time; at longer exposure times, the size (in particular, height) of the islands grew, corresponding to the higher sticking coefficients. These observations can be qualitatively explained via the difference between TNT−surface and TNT−TNT interactions mediated by water molecules.</description><subject>Adsorption</subject><subject>Microchemistry</subject><subject>Microscopy, Atomic Force - methods</subject><subject>Sensitivity and Specificity</subject><subject>Silicon - chemistry</subject><subject>Surface Properties</subject><subject>Time Factors</subject><subject>Trinitrotoluene - chemistry</subject><issn>0743-7463</issn><issn>1520-5827</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><sourceid>EIF</sourceid><recordid>eNptkEtPwzAQhC0EoqVw4A-gXEDiEPAjdpxj1VIKKg-p7YWL5dqO5JLGxU4Q_HuMUpULp5VmP83sDgDnCN4giNFtJSGhjPLyAPQRxTClHOeHoA_zjKR5xkgPnISwhhAWJCuOQQ9RTigivA8ehzo4v22sqxNXJgtva9t417iqNbVJorqslZON0cncVlZF4ckq75SsG1uZT-OTeetLqUw4BUelrII5280BWE7uFqNpOnu5fxgNZ6mM4U2aYYRRVkJFtCa8pBQXuWQmVxJzxpTMVEGxpAyuihVkMP6VcWwk0loXmq4YGYCrznfr3UdrQiM2NihTVbI2rg2C5ThnCPMIXndgvDcEb0qx9XYj_bdAUPwWJ_bFRfZiZ9quNkb_kbumIpB2gA2N-drvpX-PgSSnYvE6F-xtMZ7w8bOYRv6y46UKYu1aX8dO_gn-AaL_g8M</recordid><startdate>20040330</startdate><enddate>20040330</enddate><creator>Pinnaduwage, L. A</creator><creator>Yi, D</creator><creator>Tian, F</creator><creator>Thundat, T</creator><creator>Lareau, R. T</creator><general>American Chemical Society</general><scope>BSCLL</scope><scope>CGR</scope><scope>CUY</scope><scope>CVF</scope><scope>ECM</scope><scope>EIF</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20040330</creationdate><title>Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces</title><author>Pinnaduwage, L. A ; Yi, D ; Tian, F ; Thundat, T ; Lareau, R. T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a349t-421214f0c3dd38f55297a6e7ca2866ca4c952a560b9b060565482ea1ddd9d5b63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Adsorption</topic><topic>Microchemistry</topic><topic>Microscopy, Atomic Force - methods</topic><topic>Sensitivity and Specificity</topic><topic>Silicon - chemistry</topic><topic>Surface Properties</topic><topic>Time Factors</topic><topic>Trinitrotoluene - chemistry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pinnaduwage, L. A</creatorcontrib><creatorcontrib>Yi, D</creatorcontrib><creatorcontrib>Tian, F</creatorcontrib><creatorcontrib>Thundat, T</creatorcontrib><creatorcontrib>Lareau, R. T</creatorcontrib><collection>Istex</collection><collection>Medline</collection><collection>MEDLINE</collection><collection>MEDLINE (Ovid)</collection><collection>MEDLINE</collection><collection>MEDLINE</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Langmuir</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pinnaduwage, L. A</au><au>Yi, D</au><au>Tian, F</au><au>Thundat, T</au><au>Lareau, R. T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces</atitle><jtitle>Langmuir</jtitle><addtitle>Langmuir</addtitle><date>2004-03-30</date><risdate>2004</risdate><volume>20</volume><issue>7</issue><spage>2690</spage><epage>2694</epage><pages>2690-2694</pages><issn>0743-7463</issn><eissn>1520-5827</eissn><abstract>We measured the adsorption characteristics of trinitrotoluene (TNT) on piezoresistive silicon microcantilever surfaces under ambient air using a well-characterized TNT vapor generator. This allowed us to quantify the adsorption parameters and to estimate the sticking coefficient. The sticking coefficient initially increases with TNT exposure time and then levels off around 0.3. Atomic force microscopy images of silicon surfaces exposed to TNT revealed “island” formation of the adsorbate on the silicon surface. At low exposure times, mainly the number density of islands increased with exposure time; at longer exposure times, the size (in particular, height) of the islands grew, corresponding to the higher sticking coefficients. These observations can be qualitatively explained via the difference between TNT−surface and TNT−TNT interactions mediated by water molecules.</abstract><cop>United States</cop><pub>American Chemical Society</pub><pmid>15835138</pmid><doi>10.1021/la035658f</doi><tpages>5</tpages></addata></record>
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subjects Adsorption
Microchemistry
Microscopy, Atomic Force - methods
Sensitivity and Specificity
Silicon - chemistry
Surface Properties
Time Factors
Trinitrotoluene - chemistry
title Adsorption of Trinitrotoluene on Uncoated Silicon Microcantilever Surfaces
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T20%3A37%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Adsorption%20of%20Trinitrotoluene%20on%20Uncoated%20Silicon%20Microcantilever%20Surfaces&rft.jtitle=Langmuir&rft.au=Pinnaduwage,%20L.%20A&rft.date=2004-03-30&rft.volume=20&rft.issue=7&rft.spage=2690&rft.epage=2694&rft.pages=2690-2694&rft.issn=0743-7463&rft.eissn=1520-5827&rft_id=info:doi/10.1021/la035658f&rft_dat=%3Cproquest_cross%3E67276128%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=67276128&rft_id=info:pmid/15835138&rfr_iscdi=true