Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays

Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 TH...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Physical review letters 2004-11, Vol.93 (19), p.196804.1-196804.4, Article 196804
Hauptverfasser:	DONGXIA QU, GRISCHKOWSKY, D
Format:	Artikel
Sprache:	eng
Schlagworte:	Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	196804.4
container_issue	19
container_start_page	196804.1
container_title	Physical review letters
container_volume	93
creator	DONGXIA QU GRISCHKOWSKY, D
description	Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. A well-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data.
doi_str_mv	10.1103/physrevlett.93.196804
format	Article
fullrecord	<record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_67179063</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>67179063</sourcerecordid><originalsourceid>FETCH-LOGICAL-c455t-a3874df8aa2efa695a4dd0aca88d72e1f3433c60d0a338024055f33177a402253</originalsourceid><addsrcrecordid>eNpFkE1LAzEQhoMotlZ_gpKL3rZONtkke5SiVihUpJ6XcTfRleyHybZSf73RFnrKZHjemeEh5JLBlDHgt_3HNnizcWYYpjmfslxqEEdkzEDliWJMHJMxAGdJDqBG5CyETwBgqdSnZMQyCaClGJNq-RaM3-BQdy3tLEXamm86bHvz91vNf6g3oWuxLf8bYe0txrJ3GJquDbT3XY_vMd6-0zihMQO6xNauoR-dMxS9x204JycWXTAX-3dCXh_uV7N5slg-Ps3uFkkpsmxIkGslKqsRU2NR5hmKqgIsUetKpYZZLjgvJcQe5xpSAVlmOWdKoYA0zfiE3Ozmxqu-1iYMRVOH0jiHrenWoZCKqRwkj2C2A0vfhajRFr2vG_TbgkHxp7d4jnpfzGYR9RY5L3Z6Y-5qv2D91pjqkNr7jMD1HsBQorM-iqvDgZMcciY0_wWWwocI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>67179063</pqid></control><display><type>article</type><title>Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays</title><source>American Physical Society Journals</source><creator>DONGXIA QU ; GRISCHKOWSKY, D</creator><creatorcontrib>DONGXIA QU ; GRISCHKOWSKY, D</creatorcontrib><description>Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. A well-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data.</description><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/physrevlett.93.196804</identifier><identifier>PMID: 15600864</identifier><identifier>CODEN: PRLTAO</identifier><language>eng</language><publisher>Ridge, NY: American Physical Society</publisher><subject>Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Physics ; Surface and interface electron states</subject><ispartof>Physical review letters, 2004-11, Vol.93 (19), p.196804.1-196804.4, Article 196804</ispartof><rights>2005 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c455t-a3874df8aa2efa695a4dd0aca88d72e1f3433c60d0a338024055f33177a402253</citedby><cites>FETCH-LOGICAL-c455t-a3874df8aa2efa695a4dd0aca88d72e1f3433c60d0a338024055f33177a402253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2867,2868,27915,27916</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=16309148$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/15600864$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>DONGXIA QU</creatorcontrib><creatorcontrib>GRISCHKOWSKY, D</creatorcontrib><title>Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays</title><title>Physical review letters</title><addtitle>Phys Rev Lett</addtitle><description>Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. A well-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data.</description><subject>Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>Surface and interface electron states</subject><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNpFkE1LAzEQhoMotlZ_gpKL3rZONtkke5SiVihUpJ6XcTfRleyHybZSf73RFnrKZHjemeEh5JLBlDHgt_3HNnizcWYYpjmfslxqEEdkzEDliWJMHJMxAGdJDqBG5CyETwBgqdSnZMQyCaClGJNq-RaM3-BQdy3tLEXamm86bHvz91vNf6g3oWuxLf8bYe0txrJ3GJquDbT3XY_vMd6-0zihMQO6xNauoR-dMxS9x204JycWXTAX-3dCXh_uV7N5slg-Ps3uFkkpsmxIkGslKqsRU2NR5hmKqgIsUetKpYZZLjgvJcQe5xpSAVlmOWdKoYA0zfiE3Ozmxqu-1iYMRVOH0jiHrenWoZCKqRwkj2C2A0vfhajRFr2vG_TbgkHxp7d4jnpfzGYR9RY5L3Z6Y-5qv2D91pjqkNr7jMD1HsBQorM-iqvDgZMcciY0_wWWwocI</recordid><startdate>20041105</startdate><enddate>20041105</enddate><creator>DONGXIA QU</creator><creator>GRISCHKOWSKY, D</creator><general>American Physical Society</general><scope>IQODW</scope><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20041105</creationdate><title>Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays</title><author>DONGXIA QU ; GRISCHKOWSKY, D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c455t-a3874df8aa2efa695a4dd0aca88d72e1f3433c60d0a338024055f33177a402253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>Surface and interface electron states</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>DONGXIA QU</creatorcontrib><creatorcontrib>GRISCHKOWSKY, D</creatorcontrib><collection>Pascal-Francis</collection><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>DONGXIA QU</au><au>GRISCHKOWSKY, D</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays</atitle><jtitle>Physical review letters</jtitle><addtitle>Phys Rev Lett</addtitle><date>2004-11-05</date><risdate>2004</risdate><volume>93</volume><issue>19</issue><spage>196804.1</spage><epage>196804.4</epage><pages>196804.1-196804.4</pages><artnum>196804</artnum><issn>0031-9007</issn><eissn>1079-7114</eissn><coden>PRLTAO</coden><abstract>Highly conducting metal-film subwavelength hole arrays, lithographically fabricated on high-resistivity silicon wafers in optical contact with thick silicon plates, have been characterized by terahertz time-domain spectroscopy with subpicosecond resolution and over a frequency range from 0.5 to 3 THz with 5 GHz resolution. A well-defined ringing structure extending to more than 250 psec is observed on the trailing edge of the transmitted THz pulse. In the frequency domain this ringing structure corresponds to a new type of extremely sharp resonant line structure between the fundamental surface plasmon modes of the hole array. A simple theoretical model is presented and shows good agreement with the experimental data.</abstract><cop>Ridge, NY</cop><pub>American Physical Society</pub><pmid>15600864</pmid><doi>10.1103/physrevlett.93.196804</doi><tpages>1</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0031-9007
ispartof	Physical review letters, 2004-11, Vol.93 (19), p.196804.1-196804.4, Article 196804
issn	0031-9007 1079-7114
language	eng
recordid	cdi_proquest_miscellaneous_67179063
source	American Physical Society Journals
subjects	Collective excitations (including excitons, polarons, plasmons and other charge-density excitations) Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states
title	Observation of a new type of THz resonance of surface plasmons propagating on metal-film hole arrays
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-14T20%3A23%3A58IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Observation%20of%20a%20new%20type%20of%20THz%20resonance%20of%20surface%20plasmons%20propagating%20on%20metal-film%20hole%20arrays&rft.jtitle=Physical%20review%20letters&rft.au=DONGXIA%20QU&rft.date=2004-11-05&rft.volume=93&rft.issue=19&rft.spage=196804.1&rft.epage=196804.4&rft.pages=196804.1-196804.4&rft.artnum=196804&rft.issn=0031-9007&rft.eissn=1079-7114&rft.coden=PRLTAO&rft_id=info:doi/10.1103/physrevlett.93.196804&rft_dat=%3Cproquest_cross%3E67179063%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=67179063&rft_id=info:pmid/15600864&rfr_iscdi=true