Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield

The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the im...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Applied Optics 2009-03, Vol.48 (7), p.1382-1388
Hauptverfasser: Federici, John F, Wample, Robert L, Rodriguez, David, Mukherjee, Suman
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1388
container_issue 7
container_start_page 1382
container_title Applied Optics
container_volume 48
creator Federici, John F
Wample, Robert L
Rodriguez, David
Mukherjee, Suman
description The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates.
doi_str_mv 10.1364/ao.48.001382
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_66973365</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>66973365</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-d585cbd39359e1269d6974346e377af1eedc3a94b4d425b7e34ee84f8c29a3ba3</originalsourceid><addsrcrecordid>eNpFkM1LwzAYh4Mobk5vniUnT3YmzUeb4xCdwmAXPXkIafKGVbqlJq0w_3ojG3p6eeHh4eGH0DUlc8okvzdhzus5IZTV5QmallSIglEpTtGUEMIKqZiYoIuUPvInuKrO0YSqUpSSkyl6X_R911oztGGHg8cDRLOBOHzjZRj3uN-YBDhtWj9gH8MW2zF-gcNpjN5YSNiHiCEN7fbPYGPo8b6Fzl2iM2-6BFfHO0NvT4-vD8_Far18eVisCsuEGAonamEbx3KnAlpK5aSqOOMSWFUZTwGcZUbxhjteiqYCxgFq7mtbKsMaw2bo9uDtY_gcc43etslC15kdhDFpmX2MSZHBuwOYG1OK4HUfc3nca0r075h6sda81ocxM35z9I7NFtw_fFyP_QANfnBn</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>66973365</pqid></control><display><type>article</type><title>Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield</title><source>OSA Publishing</source><source>Alma/SFX Local Collection</source><creator>Federici, John F ; Wample, Robert L ; Rodriguez, David ; Mukherjee, Suman</creator><creatorcontrib>Federici, John F ; Wample, Robert L ; Rodriguez, David ; Mukherjee, Suman</creatorcontrib><description>The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates.</description><identifier>ISSN: 0003-6935</identifier><identifier>EISSN: 2155-3165</identifier><identifier>EISSN: 1539-4522</identifier><identifier>DOI: 10.1364/ao.48.001382</identifier><identifier>PMID: 19252640</identifier><language>eng</language><publisher>United States</publisher><ispartof>Applied Optics, 2009-03, Vol.48 (7), p.1382-1388</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-d585cbd39359e1269d6974346e377af1eedc3a94b4d425b7e34ee84f8c29a3ba3</citedby><cites>FETCH-LOGICAL-c355t-d585cbd39359e1269d6974346e377af1eedc3a94b4d425b7e34ee84f8c29a3ba3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/19252640$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Federici, John F</creatorcontrib><creatorcontrib>Wample, Robert L</creatorcontrib><creatorcontrib>Rodriguez, David</creatorcontrib><creatorcontrib>Mukherjee, Suman</creatorcontrib><title>Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield</title><title>Applied Optics</title><addtitle>Appl Opt</addtitle><description>The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates.</description><issn>0003-6935</issn><issn>2155-3165</issn><issn>1539-4522</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNpFkM1LwzAYh4Mobk5vniUnT3YmzUeb4xCdwmAXPXkIafKGVbqlJq0w_3ojG3p6eeHh4eGH0DUlc8okvzdhzus5IZTV5QmallSIglEpTtGUEMIKqZiYoIuUPvInuKrO0YSqUpSSkyl6X_R911oztGGHg8cDRLOBOHzjZRj3uN-YBDhtWj9gH8MW2zF-gcNpjN5YSNiHiCEN7fbPYGPo8b6Fzl2iM2-6BFfHO0NvT4-vD8_Far18eVisCsuEGAonamEbx3KnAlpK5aSqOOMSWFUZTwGcZUbxhjteiqYCxgFq7mtbKsMaw2bo9uDtY_gcc43etslC15kdhDFpmX2MSZHBuwOYG1OK4HUfc3nca0r075h6sda81ocxM35z9I7NFtw_fFyP_QANfnBn</recordid><startdate>20090301</startdate><enddate>20090301</enddate><creator>Federici, John F</creator><creator>Wample, Robert L</creator><creator>Rodriguez, David</creator><creator>Mukherjee, Suman</creator><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20090301</creationdate><title>Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield</title><author>Federici, John F ; Wample, Robert L ; Rodriguez, David ; Mukherjee, Suman</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-d585cbd39359e1269d6974346e377af1eedc3a94b4d425b7e34ee84f8c29a3ba3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Federici, John F</creatorcontrib><creatorcontrib>Wample, Robert L</creatorcontrib><creatorcontrib>Rodriguez, David</creatorcontrib><creatorcontrib>Mukherjee, Suman</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Applied Optics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Federici, John F</au><au>Wample, Robert L</au><au>Rodriguez, David</au><au>Mukherjee, Suman</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield</atitle><jtitle>Applied Optics</jtitle><addtitle>Appl Opt</addtitle><date>2009-03-01</date><risdate>2009</risdate><volume>48</volume><issue>7</issue><spage>1382</spage><epage>1388</epage><pages>1382-1388</pages><issn>0003-6935</issn><eissn>2155-3165</eissn><eissn>1539-4522</eissn><abstract>The application of terahertz time-domain spectroscopy (THz-TDS) and imaging to differentiate flat and curved surfaces in reflection via the THz Gouy phase shift is demonstrated. For a THz-TDS system that is aligned for reflection from a flat surface, the presence of a curved surface displaces the image focal plane from the detector plane, resulting in a Gouy phase shift. The potential of utilizing this configuration for estimating the number and size of curved objects is discussed with particular emphasis on agriculture crop yield estimates.</abstract><cop>United States</cop><pmid>19252640</pmid><doi>10.1364/ao.48.001382</doi><tpages>7</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0003-6935
ispartof Applied Optics, 2009-03, Vol.48 (7), p.1382-1388
issn 0003-6935
2155-3165
1539-4522
language eng
recordid cdi_proquest_miscellaneous_66973365
source OSA Publishing; Alma/SFX Local Collection
title Application of terahertz Gouy phase shift from curved surfaces for estimation of crop yield
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T08%3A54%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Application%20of%20terahertz%20Gouy%20phase%20shift%20from%20curved%20surfaces%20for%20estimation%20of%20crop%20yield&rft.jtitle=Applied%20Optics&rft.au=Federici,%20John%20F&rft.date=2009-03-01&rft.volume=48&rft.issue=7&rft.spage=1382&rft.epage=1388&rft.pages=1382-1388&rft.issn=0003-6935&rft.eissn=2155-3165&rft_id=info:doi/10.1364/ao.48.001382&rft_dat=%3Cproquest_cross%3E66973365%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=66973365&rft_id=info:pmid/19252640&rfr_iscdi=true