Three‐dimensional analysis of porous BaTiO3 ceramics using FIB nanotomography

Summary Three‐dimensional (3D) data represent the basis for reliable quantification of complex microstructures. Therefore, the development of high‐resolution tomography techniques is of major importance for many materials science disciplines. In this paper, we present a novel serial sectioning proce...

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Veröffentlicht in:	Journal of microscopy (Oxford) 2004-10, Vol.216 (1), p.84-95
Hauptverfasser:	HOLZER, L., INDUTNYI, F., GASSER, PH, MÜNCH, B., WEGMANN, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Focused ion beam (FIB) microstructure nanoparticles particle size distribution pore size distribution quantitative analysis serial sectioning tomography
Online-Zugang:	Volltext
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