X-ray Studies of Self-Assembled Organic Monolayers Grown on Hydrogen-Terminated Si(111)

The structure of self-assembled monolayers (SAMs) of undecylenic acid methyl ester (SAM-1) and undec-10-enoic acid 2-bromo-ethyl ester (SAM-2) grown on hydrogen-passivated Si(111) were studied by X-ray reflectivity (XRR), X-ray standing waves (XSW), X-ray fluorescence (XRF), atomic force microscopy,...

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Veröffentlicht in:	Langmuir 2004-07, Vol.20 (15), p.6252-6258
Hauptverfasser:	Jin, Hua, Kinser, C. Reagan, Bertin, Paul A, Kramer, Donald E, Libera, Joseph A, Hersam, Mark C, Nguyen, Sonbinh T, Bedzyk, Michael J
Format:	Artikel
Sprache:	eng
Schlagworte:	Hydrogen - chemistry Hydrogen - radiation effects Membranes, Artificial Microscopy, Atomic Force Organosilicon Compounds - chemical synthesis Organosilicon Compounds - chemistry Organosilicon Compounds - radiation effects Sensitivity and Specificity Silicon - chemistry Silicon - radiation effects Spectrometry, X-Ray Emission - methods Surface Properties Ultraviolet Rays X-Ray Diffraction - methods X-Rays
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