6H-SiC Lateral JFETs for Analog Integrated Circuits
This paper reports fabrication and electrical characterization of 6H-SiC n-channel, depletion-mode, junction-field-effect transistors (JFETs) for use in high-temperature analog integrated circuits for sensing and control in propulsion, power systems, and geothermal exploration. Electrical characteri...
Gespeichert in:
Hauptverfasser: | , , , , , |
---|---|
Format: | Tagungsbericht |
Sprache: | eng |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1102 |
---|---|
container_issue | |
container_start_page | 1099 |
container_title | |
container_volume | 600-603 |
creator | Mehregany, Mehran Garverick, Steven Fu, Xiao An Patil, Amita Neudeck, Philip G. Beheim, Glenn M. |
description | This paper reports fabrication and electrical characterization of 6H-SiC n-channel,
depletion-mode, junction-field-effect transistors (JFETs) for use in high-temperature analog
integrated circuits for sensing and control in propulsion, power systems, and geothermal exploration.
Electrical characteristics of the resulting JFET devices have been measured across the wafer as a
function of temperature, from room temperature to 450oC. The results indicate that the JFETs are
suitable for high-gain amplifiers in high-temperature sensor signal processing circuits. |
doi_str_mv | 10.4028/www.scientific.net/MSF.600-603.1099 |
format | Conference Proceeding |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_36281391</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>36281391</sourcerecordid><originalsourceid>FETCH-LOGICAL-c378t-3d9680433f92c9307f84658dc6c6d5134b6ec1da3813586118b248d7a44a7d53</originalsourceid><addsrcrecordid>eNqV0L1OwzAUBWALgUQpvEMmFuTUjn9ij1XU0qIihna3XMcprtKk2I4i3h5XRWJmuLrDPfcMHwAvGOUUFWI2jmMejLNddI0zeWfj7H27zDlCkCOSYyTlDZhgzgsoS1bcggkqGIOMlvwePIRwRIhggfkEEL6CW1dlGx2t1232tlzsQtb0Ppt3uu0P2bqL9uDTtc4q583gYngEd41ug3363VOwS1_VCm4-XtfVfAMNKUWEpJZcIEpIIwsjCSobQTkTteGG1wwTuufW4FoTgQkTHGOxL6ioS02pLmtGpuD5Wnv2_ddgQ1QnF4xtW93ZfgiK8CJ9SpyC1TVofB-Ct406e3fS_lthpC5eKnmpPy-VvFTyUskrDVEXr9SyuLZEr7sQrflUx37wSSH8q-cHV857uw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>36281391</pqid></control><display><type>conference_proceeding</type><title>6H-SiC Lateral JFETs for Analog Integrated Circuits</title><source>Scientific.net Journals</source><creator>Mehregany, Mehran ; Garverick, Steven ; Fu, Xiao An ; Patil, Amita ; Neudeck, Philip G. ; Beheim, Glenn M.</creator><creatorcontrib>Mehregany, Mehran ; Garverick, Steven ; Fu, Xiao An ; Patil, Amita ; Neudeck, Philip G. ; Beheim, Glenn M.</creatorcontrib><description>This paper reports fabrication and electrical characterization of 6H-SiC n-channel,
depletion-mode, junction-field-effect transistors (JFETs) for use in high-temperature analog
integrated circuits for sensing and control in propulsion, power systems, and geothermal exploration.
Electrical characteristics of the resulting JFET devices have been measured across the wafer as a
function of temperature, from room temperature to 450oC. The results indicate that the JFETs are
suitable for high-gain amplifiers in high-temperature sensor signal processing circuits.</description><identifier>ISSN: 0255-5476</identifier><identifier>ISSN: 1662-9752</identifier><identifier>EISSN: 1662-9752</identifier><identifier>DOI: 10.4028/www.scientific.net/MSF.600-603.1099</identifier><language>eng</language><publisher>Trans Tech Publications Ltd</publisher><ispartof>Materials science forum, 2009, Vol.600-603, p.1099-1102</ispartof><rights>2009 Trans Tech Publications Ltd</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><orcidid>0000-0002-2968-4712</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/768?width=600</thumbnail><link.rule.ids>314,778,782,27911,27912</link.rule.ids></links><search><creatorcontrib>Mehregany, Mehran</creatorcontrib><creatorcontrib>Garverick, Steven</creatorcontrib><creatorcontrib>Fu, Xiao An</creatorcontrib><creatorcontrib>Patil, Amita</creatorcontrib><creatorcontrib>Neudeck, Philip G.</creatorcontrib><creatorcontrib>Beheim, Glenn M.</creatorcontrib><title>6H-SiC Lateral JFETs for Analog Integrated Circuits</title><title>Materials science forum</title><description>This paper reports fabrication and electrical characterization of 6H-SiC n-channel,
depletion-mode, junction-field-effect transistors (JFETs) for use in high-temperature analog
integrated circuits for sensing and control in propulsion, power systems, and geothermal exploration.
Electrical characteristics of the resulting JFET devices have been measured across the wafer as a
function of temperature, from room temperature to 450oC. The results indicate that the JFETs are
suitable for high-gain amplifiers in high-temperature sensor signal processing circuits.</description><issn>0255-5476</issn><issn>1662-9752</issn><issn>1662-9752</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNqV0L1OwzAUBWALgUQpvEMmFuTUjn9ij1XU0qIihna3XMcprtKk2I4i3h5XRWJmuLrDPfcMHwAvGOUUFWI2jmMejLNddI0zeWfj7H27zDlCkCOSYyTlDZhgzgsoS1bcggkqGIOMlvwePIRwRIhggfkEEL6CW1dlGx2t1232tlzsQtb0Ppt3uu0P2bqL9uDTtc4q583gYngEd41ug3363VOwS1_VCm4-XtfVfAMNKUWEpJZcIEpIIwsjCSobQTkTteGG1wwTuufW4FoTgQkTHGOxL6ioS02pLmtGpuD5Wnv2_ddgQ1QnF4xtW93ZfgiK8CJ9SpyC1TVofB-Ct406e3fS_lthpC5eKnmpPy-VvFTyUskrDVEXr9SyuLZEr7sQrflUx37wSSH8q-cHV857uw</recordid><startdate>20090101</startdate><enddate>20090101</enddate><creator>Mehregany, Mehran</creator><creator>Garverick, Steven</creator><creator>Fu, Xiao An</creator><creator>Patil, Amita</creator><creator>Neudeck, Philip G.</creator><creator>Beheim, Glenn M.</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0002-2968-4712</orcidid></search><sort><creationdate>20090101</creationdate><title>6H-SiC Lateral JFETs for Analog Integrated Circuits</title><author>Mehregany, Mehran ; Garverick, Steven ; Fu, Xiao An ; Patil, Amita ; Neudeck, Philip G. ; Beheim, Glenn M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c378t-3d9680433f92c9307f84658dc6c6d5134b6ec1da3813586118b248d7a44a7d53</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Mehregany, Mehran</creatorcontrib><creatorcontrib>Garverick, Steven</creatorcontrib><creatorcontrib>Fu, Xiao An</creatorcontrib><creatorcontrib>Patil, Amita</creatorcontrib><creatorcontrib>Neudeck, Philip G.</creatorcontrib><creatorcontrib>Beheim, Glenn M.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Mehregany, Mehran</au><au>Garverick, Steven</au><au>Fu, Xiao An</au><au>Patil, Amita</au><au>Neudeck, Philip G.</au><au>Beheim, Glenn M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>6H-SiC Lateral JFETs for Analog Integrated Circuits</atitle><btitle>Materials science forum</btitle><date>2009-01-01</date><risdate>2009</risdate><volume>600-603</volume><spage>1099</spage><epage>1102</epage><pages>1099-1102</pages><issn>0255-5476</issn><issn>1662-9752</issn><eissn>1662-9752</eissn><abstract>This paper reports fabrication and electrical characterization of 6H-SiC n-channel,
depletion-mode, junction-field-effect transistors (JFETs) for use in high-temperature analog
integrated circuits for sensing and control in propulsion, power systems, and geothermal exploration.
Electrical characteristics of the resulting JFET devices have been measured across the wafer as a
function of temperature, from room temperature to 450oC. The results indicate that the JFETs are
suitable for high-gain amplifiers in high-temperature sensor signal processing circuits.</abstract><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/MSF.600-603.1099</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-2968-4712</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0255-5476 |
ispartof | Materials science forum, 2009, Vol.600-603, p.1099-1102 |
issn | 0255-5476 1662-9752 1662-9752 |
language | eng |
recordid | cdi_proquest_miscellaneous_36281391 |
source | Scientific.net Journals |
title | 6H-SiC Lateral JFETs for Analog Integrated Circuits |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T22%3A55%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=6H-SiC%20Lateral%20JFETs%20for%20Analog%20Integrated%20Circuits&rft.btitle=Materials%20science%20forum&rft.au=Mehregany,%20Mehran&rft.date=2009-01-01&rft.volume=600-603&rft.spage=1099&rft.epage=1102&rft.pages=1099-1102&rft.issn=0255-5476&rft.eissn=1662-9752&rft_id=info:doi/10.4028/www.scientific.net/MSF.600-603.1099&rft_dat=%3Cproquest_cross%3E36281391%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=36281391&rft_id=info:pmid/&rfr_iscdi=true |