The role of surface roughness in total internal reflection ellipsometry of hybrid systems
Total internal reflection ellipsometry (TIRE) technique was used to investigate the role of surface roughness in the hybrid system composed of octadecanethiole layer on Au thin film. The samples with Au films of different microstructure were explored. The experimental results were interpreted in the...
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| Veröffentlicht in: | Applied surface science 2009-11, Vol.256 (3), p.640-644 |
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| creator | Balevicius, Z. Vaicikauskas, V. Babonas, G.-J. |
| description | Total internal reflection ellipsometry (TIRE) technique was used to investigate the role of surface roughness in the hybrid system composed of octadecanethiole layer on Au thin film. The samples with Au films of different microstructure were explored. The experimental results were interpreted in the model, which took into account the surface roughness of Au film in the hybrid system. It was shown that optical parameters of octadecanethiole were in correspondence for samples of different microstructure in the case of adequate models used for interpretation of TIRE data. |
| doi_str_mv | 10.1016/j.apsusc.2009.08.033 |
| format | Article |
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The samples with Au films of different microstructure were explored. The experimental results were interpreted in the model, which took into account the surface roughness of Au film in the hybrid system. It was shown that optical parameters of octadecanethiole were in correspondence for samples of different microstructure in the case of adequate models used for interpretation of TIRE data.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2009.08.033</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Methods of nanofabrication ; Octadecanethiole ; Physics ; Self-assembled monolayers ; Self-assembly ; Spectroscopic ellipsometry ; Structure and morphology; thickness ; Surface plasmons ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Total internal reflection ellipsometry</subject><ispartof>Applied surface science, 2009-11, Vol.256 (3), p.640-644</ispartof><rights>2009 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-6978867873c212e6a6eab1a7ec0c39ea2fca791b7889ce7e707ee548d8a4d0b93</citedby><cites>FETCH-LOGICAL-c367t-6978867873c212e6a6eab1a7ec0c39ea2fca791b7889ce7e707ee548d8a4d0b93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2009.08.033$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=22203815$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Balevicius, Z.</creatorcontrib><creatorcontrib>Vaicikauskas, V.</creatorcontrib><creatorcontrib>Babonas, G.-J.</creatorcontrib><title>The role of surface roughness in total internal reflection ellipsometry of hybrid systems</title><title>Applied surface science</title><description>Total internal reflection ellipsometry (TIRE) technique was used to investigate the role of surface roughness in the hybrid system composed of octadecanethiole layer on Au thin film. 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| ispartof | Applied surface science, 2009-11, Vol.256 (3), p.640-644 |
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| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Methods of nanofabrication Octadecanethiole Physics Self-assembled monolayers Self-assembly Spectroscopic ellipsometry Structure and morphology thickness Surface plasmons Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Total internal reflection ellipsometry |
| title | The role of surface roughness in total internal reflection ellipsometry of hybrid systems |
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