Optoelectronic and electrochemical properties of nickel oxide (NiO) films deposited by DC reactive magnetron sputtering

Nickel oxide (NiO) thin films were deposited onto glass substrates by the DC reactive magnetron sputtering technique. The as-deposited films were post-annealed in air at 450–500 °C for 5 h. The effect of annealing on the structural, microstructural, electrical and optical properties were studied by...

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Veröffentlicht in:Physica. B, Condensed matter Condensed matter, 2008-11, Vol.403 (21), p.4104-4110
Hauptverfasser: Subramanian, B., Mohamed Ibrahim, M., Senthilkumar, V., Murali, K.R., Vidhya, VS, Sanjeeviraja, C., Jayachandran, M.
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Sprache:eng
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