Growth and characterization of BLZT–CFO composite thin films
Composite Ba 0.90La 0.067Zr 0.09Ti 0.91O 3–CoFe 2O 4 (BLZT–CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT–0.32 CFO mixed target at a substrate temperature of 1033 K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO 3 and Pt-coated Si subst...
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| Veröffentlicht in: | Materials chemistry and physics 2009-02, Vol.113 (2), p.702-706 |
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| creator | Delgado, E. Ostos, C. Martínez-Sarrión, M.L. Mestres, L. Lederman, D. Prieto, P. |
| description | Composite Ba
0.90La
0.067Zr
0.09Ti
0.91O
3–CoFe
2O
4 (BLZT–CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT–0.32 CFO mixed target at a substrate temperature of 1033
K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO
3 and Pt-coated Si substrates were used. X-ray diffraction (XRD) patterns revealed that the films had both BLZT and CFO phases. Scanning electron microscopy (SEM) showed that the CFO phase was intermixed into a BLZT matrix. X-ray photoelectron spectroscopy (XPS) data in depth profile mode showed that all constituent elements were present and confirmed the favourable TiO
6-octahedron distortion in the BLZT-perovskite structure. The Au/BLZT–CFO/substrate capacitors were ferroelectric and magnetic at room temperature. The magnetoelectric nature of the composite thin films was demonstrated through the reduction of measured ferroelectric polarization with the application of an external magnetic field. |
| doi_str_mv | 10.1016/j.matchemphys.2008.07.131 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_35936410</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0254058408005798</els_id><sourcerecordid>35936410</sourcerecordid><originalsourceid>FETCH-LOGICAL-c352t-fd47108b69287a193483183a600c610c6acd78d6481d8f94d35ac86e1b6049983</originalsourceid><addsrcrecordid>eNqNkLFOwzAYhC0EEqXwDmFhS_AfO4m9IEFEC1KlLmVhsVzbUVwlcbFdEEy8A2_Ik5CqDIwMp1vuTroPoUvAGWAorzdZL6NqTb9t30OWY8wyXGVA4AhNgFU8JQTyYzTBeUFTXDB6is5C2GAMFQCZoJu5d2-xTeSgE9VKL1U03n7IaN2QuCa5Wzyvvj-_6tkyUa7fumCjSWJrh6SxXR_O0Ukju2Aufn2Knmb3q_ohXSznj_XtIlWkyGPaaFoBZuuS56ySwAllBBiRJcaqhFFS6YrpkjLQrOFUk0IqVhpYl5hyzsgUXR12t9697EyIordBma6Tg3G7IEjBSUkBj0F-CCrvQvCmEVtve-nfBWCxJyY24g8xsScmcCVGYmO3PnTN-OTVGi-CsmZQRltvVBTa2X-s_ADpO3pb</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>35936410</pqid></control><display><type>article</type><title>Growth and characterization of BLZT–CFO composite thin films</title><source>Elsevier ScienceDirect Journals</source><creator>Delgado, E. ; Ostos, C. ; Martínez-Sarrión, M.L. ; Mestres, L. ; Lederman, D. ; Prieto, P.</creator><creatorcontrib>Delgado, E. ; Ostos, C. ; Martínez-Sarrión, M.L. ; Mestres, L. ; Lederman, D. ; Prieto, P.</creatorcontrib><description>Composite Ba
0.90La
0.067Zr
0.09Ti
0.91O
3–CoFe
2O
4 (BLZT–CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT–0.32 CFO mixed target at a substrate temperature of 1033
K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO
3 and Pt-coated Si substrates were used. X-ray diffraction (XRD) patterns revealed that the films had both BLZT and CFO phases. Scanning electron microscopy (SEM) showed that the CFO phase was intermixed into a BLZT matrix. X-ray photoelectron spectroscopy (XPS) data in depth profile mode showed that all constituent elements were present and confirmed the favourable TiO
6-octahedron distortion in the BLZT-perovskite structure. The Au/BLZT–CFO/substrate capacitors were ferroelectric and magnetic at room temperature. The magnetoelectric nature of the composite thin films was demonstrated through the reduction of measured ferroelectric polarization with the application of an external magnetic field.</description><identifier>ISSN: 0254-0584</identifier><identifier>EISSN: 1879-3312</identifier><identifier>DOI: 10.1016/j.matchemphys.2008.07.131</identifier><language>eng</language><publisher>Elsevier B.V</publisher><subject>Composite materials ; Magnetron sputtering ; Thin films</subject><ispartof>Materials chemistry and physics, 2009-02, Vol.113 (2), p.702-706</ispartof><rights>2008 Elsevier B.V.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c352t-fd47108b69287a193483183a600c610c6acd78d6481d8f94d35ac86e1b6049983</citedby><cites>FETCH-LOGICAL-c352t-fd47108b69287a193483183a600c610c6acd78d6481d8f94d35ac86e1b6049983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.matchemphys.2008.07.131$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,777,781,3537,27905,27906,45976</link.rule.ids></links><search><creatorcontrib>Delgado, E.</creatorcontrib><creatorcontrib>Ostos, C.</creatorcontrib><creatorcontrib>Martínez-Sarrión, M.L.</creatorcontrib><creatorcontrib>Mestres, L.</creatorcontrib><creatorcontrib>Lederman, D.</creatorcontrib><creatorcontrib>Prieto, P.</creatorcontrib><title>Growth and characterization of BLZT–CFO composite thin films</title><title>Materials chemistry and physics</title><description>Composite Ba
0.90La
0.067Zr
0.09Ti
0.91O
3–CoFe
2O
4 (BLZT–CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT–0.32 CFO mixed target at a substrate temperature of 1033
K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO
3 and Pt-coated Si substrates were used. X-ray diffraction (XRD) patterns revealed that the films had both BLZT and CFO phases. Scanning electron microscopy (SEM) showed that the CFO phase was intermixed into a BLZT matrix. X-ray photoelectron spectroscopy (XPS) data in depth profile mode showed that all constituent elements were present and confirmed the favourable TiO
6-octahedron distortion in the BLZT-perovskite structure. The Au/BLZT–CFO/substrate capacitors were ferroelectric and magnetic at room temperature. The magnetoelectric nature of the composite thin films was demonstrated through the reduction of measured ferroelectric polarization with the application of an external magnetic field.</description><subject>Composite materials</subject><subject>Magnetron sputtering</subject><subject>Thin films</subject><issn>0254-0584</issn><issn>1879-3312</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqNkLFOwzAYhC0EEqXwDmFhS_AfO4m9IEFEC1KlLmVhsVzbUVwlcbFdEEy8A2_Ik5CqDIwMp1vuTroPoUvAGWAorzdZL6NqTb9t30OWY8wyXGVA4AhNgFU8JQTyYzTBeUFTXDB6is5C2GAMFQCZoJu5d2-xTeSgE9VKL1U03n7IaN2QuCa5Wzyvvj-_6tkyUa7fumCjSWJrh6SxXR_O0Ukju2Aufn2Knmb3q_ohXSznj_XtIlWkyGPaaFoBZuuS56ySwAllBBiRJcaqhFFS6YrpkjLQrOFUk0IqVhpYl5hyzsgUXR12t9697EyIordBma6Tg3G7IEjBSUkBj0F-CCrvQvCmEVtve-nfBWCxJyY24g8xsScmcCVGYmO3PnTN-OTVGi-CsmZQRltvVBTa2X-s_ADpO3pb</recordid><startdate>20090215</startdate><enddate>20090215</enddate><creator>Delgado, E.</creator><creator>Ostos, C.</creator><creator>Martínez-Sarrión, M.L.</creator><creator>Mestres, L.</creator><creator>Lederman, D.</creator><creator>Prieto, P.</creator><general>Elsevier B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20090215</creationdate><title>Growth and characterization of BLZT–CFO composite thin films</title><author>Delgado, E. ; Ostos, C. ; Martínez-Sarrión, M.L. ; Mestres, L. ; Lederman, D. ; Prieto, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c352t-fd47108b69287a193483183a600c610c6acd78d6481d8f94d35ac86e1b6049983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Composite materials</topic><topic>Magnetron sputtering</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Delgado, E.</creatorcontrib><creatorcontrib>Ostos, C.</creatorcontrib><creatorcontrib>Martínez-Sarrión, M.L.</creatorcontrib><creatorcontrib>Mestres, L.</creatorcontrib><creatorcontrib>Lederman, D.</creatorcontrib><creatorcontrib>Prieto, P.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Materials chemistry and physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Delgado, E.</au><au>Ostos, C.</au><au>Martínez-Sarrión, M.L.</au><au>Mestres, L.</au><au>Lederman, D.</au><au>Prieto, P.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Growth and characterization of BLZT–CFO composite thin films</atitle><jtitle>Materials chemistry and physics</jtitle><date>2009-02-15</date><risdate>2009</risdate><volume>113</volume><issue>2</issue><spage>702</spage><epage>706</epage><pages>702-706</pages><issn>0254-0584</issn><eissn>1879-3312</eissn><abstract>Composite Ba
0.90La
0.067Zr
0.09Ti
0.91O
3–CoFe
2O
4 (BLZT–CFO) thin films were prepared by rf-magnetron sputtering from a 0.68 BLZT–0.32 CFO mixed target at a substrate temperature of 1033
K in a high oxygen pressure atmosphere. Single-crystal conducting Nb-doped (1%) SrTiO
3 and Pt-coated Si substrates were used. X-ray diffraction (XRD) patterns revealed that the films had both BLZT and CFO phases. Scanning electron microscopy (SEM) showed that the CFO phase was intermixed into a BLZT matrix. X-ray photoelectron spectroscopy (XPS) data in depth profile mode showed that all constituent elements were present and confirmed the favourable TiO
6-octahedron distortion in the BLZT-perovskite structure. The Au/BLZT–CFO/substrate capacitors were ferroelectric and magnetic at room temperature. The magnetoelectric nature of the composite thin films was demonstrated through the reduction of measured ferroelectric polarization with the application of an external magnetic field.</abstract><pub>Elsevier B.V</pub><doi>10.1016/j.matchemphys.2008.07.131</doi><tpages>5</tpages></addata></record> |
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| ispartof | Materials chemistry and physics, 2009-02, Vol.113 (2), p.702-706 |
| issn | 0254-0584 1879-3312 |
| language | eng |
| recordid | cdi_proquest_miscellaneous_35936410 |
| source | Elsevier ScienceDirect Journals |
| subjects | Composite materials Magnetron sputtering Thin films |
| title | Growth and characterization of BLZT–CFO composite thin films |
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