Electric-field-induced internal deformation in piezoelectric BiB3O6 crystals
For the first time electric‐field‐induced atomic displacements (internal strains) in non‐ferroelectric polar BiB3O6 single crystal plates (point symmetry 2) were investigated using X‐ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different...
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| Veröffentlicht in: | Crystal research and technology (1979) 2008-11, Vol.43 (11), p.1126-1132 |
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| container_title | Crystal research and technology (1979) |
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| creator | Schmidt, O. Gorfman, S. Pietsch, U. |
| description | For the first time electric‐field‐induced atomic displacements (internal strains) in non‐ferroelectric polar BiB3O6 single crystal plates (point symmetry 2) were investigated using X‐ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB3O6. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B3O6 sublattice relative to the Bi one. In addition, we considered the deformation of the Bi‐O, B(1)‐O and B(2)‐O bond lengths and identified the [B(2)O3] group as the most sensitive structural unit to an external electric perturbation. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim) |
| doi_str_mv | 10.1002/crat.200800335 |
| format | Article |
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The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB3O6. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B3O6 sublattice relative to the Bi one. In addition, we considered the deformation of the Bi‐O, B(1)‐O and B(2)‐O bond lengths and identified the [B(2)O3] group as the most sensitive structural unit to an external electric perturbation. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><identifier>ISSN: 0232-1300</identifier><identifier>EISSN: 1521-4079</identifier><identifier>DOI: 10.1002/crat.200800335</identifier><language>eng</language><publisher>Berlin: WILEY-VCH Verlag</publisher><subject>atomic response to an external electric field ; bithmut triborate (BiB3O6) ; dielectric polarization ; piezoelectric effect ; X-ray diffraction</subject><ispartof>Crystal research and technology (1979), 2008-11, Vol.43 (11), p.1126-1132</ispartof><rights>Copyright © 2008 WILEY‐VCH Verlag GmbH & Co. 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Technol</addtitle><description>For the first time electric‐field‐induced atomic displacements (internal strains) in non‐ferroelectric polar BiB3O6 single crystal plates (point symmetry 2) were investigated using X‐ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB3O6. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B3O6 sublattice relative to the Bi one. In addition, we considered the deformation of the Bi‐O, B(1)‐O and B(2)‐O bond lengths and identified the [B(2)O3] group as the most sensitive structural unit to an external electric perturbation. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</description><subject>atomic response to an external electric field</subject><subject>bithmut triborate (BiB3O6)</subject><subject>dielectric polarization</subject><subject>piezoelectric effect</subject><subject>X-ray diffraction</subject><issn>0232-1300</issn><issn>1521-4079</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LAzEURYMoWKtb17NyN_UlmXwt21KrUCxIxWVIM28gOp2pyRStv94pLV1d7uOetziE3FMYUQD26KPrRgxAA3AuLsiACkbzApS5JANgnOWUA1yTm5Q-AcDIgg3IYlaj72LweRWwLvPQlDuPZRaaDmPj6qzEqo0b14W26Y_ZNuBfiycmm4QJX8rMx33qXJ1uyVXVB96dckjen2ar6XO-WM5fpuNFHhgUIndrUzBjjKh0Jbn24FCJQiqhQWstjeS0UqBE6dalV145RKZZgeiKioKifEgejn-3sf3eYersJiSPde0abHfJcqG5plT0Q3Mc_oQa93Ybw8bFvaVgD8bswZg9G7PTt_Hq3Ho2P7Ihdfh7Zl38slJxJezH69xONYdCyycL_B_4pnBT</recordid><startdate>200811</startdate><enddate>200811</enddate><creator>Schmidt, O.</creator><creator>Gorfman, S.</creator><creator>Pietsch, U.</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><scope>BSCLL</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>200811</creationdate><title>Electric-field-induced internal deformation in piezoelectric BiB3O6 crystals</title><author>Schmidt, O. ; Gorfman, S. ; Pietsch, U.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2045-ab9429995f8f638c0ae7546758088869631f7075dabdc7c7aee2824eea4f10713</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>atomic response to an external electric field</topic><topic>bithmut triborate (BiB3O6)</topic><topic>dielectric polarization</topic><topic>piezoelectric effect</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Schmidt, O.</creatorcontrib><creatorcontrib>Gorfman, S.</creatorcontrib><creatorcontrib>Pietsch, U.</creatorcontrib><collection>Istex</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Crystal research and technology (1979)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Schmidt, O.</au><au>Gorfman, S.</au><au>Pietsch, U.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electric-field-induced internal deformation in piezoelectric BiB3O6 crystals</atitle><jtitle>Crystal research and technology (1979)</jtitle><addtitle>Cryst. Res. Technol</addtitle><date>2008-11</date><risdate>2008</risdate><volume>43</volume><issue>11</issue><spage>1126</spage><epage>1132</epage><pages>1126-1132</pages><issn>0232-1300</issn><eissn>1521-4079</eissn><abstract>For the first time electric‐field‐induced atomic displacements (internal strains) in non‐ferroelectric polar BiB3O6 single crystal plates (point symmetry 2) were investigated using X‐ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB3O6. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B3O6 sublattice relative to the Bi one. In addition, we considered the deformation of the Bi‐O, B(1)‐O and B(2)‐O bond lengths and identified the [B(2)O3] group as the most sensitive structural unit to an external electric perturbation. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)</abstract><cop>Berlin</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/crat.200800335</doi><tpages>7</tpages></addata></record> |
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| language | eng |
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| subjects | atomic response to an external electric field bithmut triborate (BiB3O6) dielectric polarization piezoelectric effect X-ray diffraction |
| title | Electric-field-induced internal deformation in piezoelectric BiB3O6 crystals |
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