Probabilistic fatigue life prediction using an equivalent initial flaw size distribution
A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa–Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of appl...
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| Veröffentlicht in: | International journal of fatigue 2009-03, Vol.31 (3), p.476-487 |
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| container_title | International journal of fatigue |
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| creator | Liu, Yongming Mahadevan, Sankaran |
| description | A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa–Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials. |
| doi_str_mv | 10.1016/j.ijfatigue.2008.06.005 |
| format | Article |
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The proposed methodology is based on the Kitagawa–Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.</description><identifier>ISSN: 0142-1123</identifier><identifier>EISSN: 1879-3452</identifier><identifier>DOI: 10.1016/j.ijfatigue.2008.06.005</identifier><identifier>CODEN: IJFADB</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Applied sciences ; Crack growth ; Exact sciences and technology ; Fatigue ; Initial flaw ; Life prediction ; Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology ; Metals. Metallurgy ; Reliability</subject><ispartof>International journal of fatigue, 2009-03, Vol.31 (3), p.476-487</ispartof><rights>2008 Elsevier Ltd</rights><rights>2009 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c442t-8487b0e4f0fb048eb67fc70c8d721d72dd52dba084090004ce8cc3e7ebe01d633</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.ijfatigue.2008.06.005$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21267195$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Liu, Yongming</creatorcontrib><creatorcontrib>Mahadevan, Sankaran</creatorcontrib><title>Probabilistic fatigue life prediction using an equivalent initial flaw size distribution</title><title>International journal of fatigue</title><description>A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. The proposed methodology is based on the Kitagawa–Takahashi diagram. Unlike the commonly used back-extrapolation method for EIFS calculation, the proposed methodology is independent of applied load level and only uses fatigue limit and fatigue crack threshold stress intensity factor. The advantage of the proposed EIFS concept is that it is very efficient in calculating the statistics of EIFS. The developed EIFS methodology is combined with probabilistic crack growth analysis to predict the fatigue life of smooth specimens. Model predictions are compared with experimental observations for various metallic materials.</description><subject>Applied sciences</subject><subject>Crack growth</subject><subject>Exact sciences and technology</subject><subject>Fatigue</subject><subject>Initial flaw</subject><subject>Life prediction</subject><subject>Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology</subject><subject>Metals. Metallurgy</subject><subject>Reliability</subject><issn>0142-1123</issn><issn>1879-3452</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqFkEFr3DAQhUVoIdtNf0N1SW52R7JsaY8hpEkh0B4a6E3I8miZRWtvJDuh_fXVskuuPQxzee_NvI-xLwJqAaL7uqtpF9xM2wVrCWBq6GqA9oKthNGbqlGt_MBWIJSshJDNJfuU8w4ANqDbFfv9M0296ylSnsnzcxCPFJAfEg7kZ5pGvmQat9yNHF8WenURx5nTSDO5yEN0bzzTX-RDCUnUL0fLFfsYXMz4-bzX7Pnb_a-7x-rpx8P3u9unyisl58ooo3tAFSD0oAz2nQ5egzeDlqLMMLRy6B0YVR4GUB6N9w1q7BHE0DXNmt2ccg9pelkwz3ZP2WOMbsRpybZp29aUtkWoT0KfppwTBntItHfpjxVgjyTtzr6TtEeSFjpbSBbn9fmEy97FkNzoKb_bpZCdFpuj7vakw9L3lTDZ7AlHXygm9LMdJvrvrX9DsI_q</recordid><startdate>20090301</startdate><enddate>20090301</enddate><creator>Liu, Yongming</creator><creator>Mahadevan, Sankaran</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20090301</creationdate><title>Probabilistic fatigue life prediction using an equivalent initial flaw size distribution</title><author>Liu, Yongming ; Mahadevan, Sankaran</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c442t-8487b0e4f0fb048eb67fc70c8d721d72dd52dba084090004ce8cc3e7ebe01d633</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Crack growth</topic><topic>Exact sciences and technology</topic><topic>Fatigue</topic><topic>Initial flaw</topic><topic>Life prediction</topic><topic>Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology</topic><topic>Metals. Metallurgy</topic><topic>Reliability</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Liu, Yongming</creatorcontrib><creatorcontrib>Mahadevan, Sankaran</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>International journal of fatigue</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Liu, Yongming</au><au>Mahadevan, Sankaran</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Probabilistic fatigue life prediction using an equivalent initial flaw size distribution</atitle><jtitle>International journal of fatigue</jtitle><date>2009-03-01</date><risdate>2009</risdate><volume>31</volume><issue>3</issue><spage>476</spage><epage>487</epage><pages>476-487</pages><issn>0142-1123</issn><eissn>1879-3452</eissn><coden>IJFADB</coden><abstract>A new methodology is proposed in this paper to calculate the equivalent initial flaw size (EIFS) distribution. 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| ispartof | International journal of fatigue, 2009-03, Vol.31 (3), p.476-487 |
| issn | 0142-1123 1879-3452 |
| language | eng |
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| source | Elsevier ScienceDirect Journals Complete |
| subjects | Applied sciences Crack growth Exact sciences and technology Fatigue Initial flaw Life prediction Mechanical properties and methods of testing. Rheology. Fracture mechanics. Tribology Metals. Metallurgy Reliability |
| title | Probabilistic fatigue life prediction using an equivalent initial flaw size distribution |
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