Defect studies of hydrogen-loaded nanocrystalline Gd films

The present work reports on microstructure investigations of hydrogen-loaded nanocrystalline Gd films by means of slow positron implantation spectroscopy combined with in situ synchrotron radiation X-ray diffraction. It is found that the virgin films contain a high density of vacancy-like open volum...

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Veröffentlicht in:	Applied surface science 2008-10, Vol.255 (1), p.251-253
Hauptverfasser:	Cizek, J., Prochazka, I., Vlach, M., Zaludova, N., Danis, S., Brauer, G., Anwand, W., Mücklich, A., Gemma, R., Kirchheim, R., Pundt, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Defects and impurities in crystals microstructure Exact sciences and technology Hydrogen Nanocrystalline gadolinium films Phase transitions and critical phenomena Physics Point defects (vacancies, interstitials, color centers, etc.) and defect clusters Single-crystal and powder diffraction Slow positron implantation spectroscopy Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) X-ray diffraction X-ray diffraction and scattering
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