Lateral Force Microscopy with micrometer-sized particles: Effect of wear on adhesion and friction

In this work, Lateral Force Microscopy (LFM) has been used to measure the frictional characteristics of the contact of 20 μ m glass beads and UO 3 particles attached to silicon tapping mode cantilevers. The substrates used were glass, mica and UO 2 single crystals cleaved to form flat surfaces. Flat...

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Veröffentlicht in:Wear 2010-01, Vol.268 (1), p.277-286
Hauptverfasser: Quintanilla, M.A.S., Goddard, D.T.
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Sprache:eng
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