Lateral Force Microscopy with micrometer-sized particles: Effect of wear on adhesion and friction
In this work, Lateral Force Microscopy (LFM) has been used to measure the frictional characteristics of the contact of 20 μ m glass beads and UO 3 particles attached to silicon tapping mode cantilevers. The substrates used were glass, mica and UO 2 single crystals cleaved to form flat surfaces. Flat...
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Veröffentlicht in: | Wear 2010-01, Vol.268 (1), p.277-286 |
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Format: | Artikel |
Sprache: | eng |
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