Energy surfaces of rare-earth silicide films on Si(1 1 1)
We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1 1 1), taken with a toroidal analyzer allowing to image the energy surfaces in k || -space. At monolayer dysprosium coverages, where hexagonal DySi 2 grows with a 1 × 1 superstructure, ele...
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| Veröffentlicht in: | Surface science 2009-09, Vol.603 (17), p.2808-2814 |
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| creator | Wanke, M. Franz, M. Vetterlein, M. Pruskil, G. Höpfner, B. Prohl, C. Engelhardt, I. Stojanov, P. Huwald, E. Riley, J.D. Dähne, M. |
| description | We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1
1
1), taken with a toroidal analyzer allowing to image the energy surfaces in
k
||
-space. At monolayer dysprosium coverages, where hexagonal DySi
2 grows with a
1
×
1
superstructure, electron pockets are observed at the
M
¯
points with highly anisotropic effective masses, and around a hole pocket at the
Γ
¯
point also an anisotropic dispersion is found. The band filling of these two bands amounts to one, indicating an even number of electrons assigned to the surface unit cell. Similar features are found for multilayer coverages, where hexagonal Dy
3Si
5 layers are formed with a
3
×
3
R
30
°
superstructure. Here, the influence of zone folding effects due to the
3
×
3
R
30
°
reconstructed layers in the bulk silicide is only weak because of the high surface sensitivity of the experiments. |
| doi_str_mv | 10.1016/j.susc.2009.07.026 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_34897716</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S003960280900507X</els_id><sourcerecordid>34897716</sourcerecordid><originalsourceid>FETCH-LOGICAL-c361t-d9621930f441cef5eb5230ac343ec3d2c4d2026bded88d3ce7732177227de2023</originalsourceid><addsrcrecordid>eNp9UDtPwzAQthBIlMIfYMoCgiHBjySOJRZUlYdUiQGYLdc-g6s0Kb4Uqf8eR60YuRtuuO9x9xFyyWjBKKvvVgVu0RacUlVQWVBeH5EJa6TKuayaYzKhVKi8prw5JWeIK5qqVNWEqHkH8XOX4TZ6YwGz3mfRRMjBxOErw9AGGxxkPrTrtOyyt3DDstS35-TEmxbh4jCn5ONx_j57zhevTy-zh0VuRc2G3KmaMyWoL0tmwVewrLigxopSgBWO29LxdO7SgWsaJyxIKTiTknPpIG3ElFzvdTex_94CDnod0ELbmg76LWpRNkpKVicg3wNt7BEjeL2JYW3iTjOqx5T0So8p6TElTaVOtol0dVA3aE3ro-lswD_meLqiNU24-z0O0qs_AaJGG6Cz4EIEO2jXh_9sfgF--XsF</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>34897716</pqid></control><display><type>article</type><title>Energy surfaces of rare-earth silicide films on Si(1 1 1)</title><source>ScienceDirect Journals (5 years ago - present)</source><creator>Wanke, M. ; Franz, M. ; Vetterlein, M. ; Pruskil, G. ; Höpfner, B. ; Prohl, C. ; Engelhardt, I. ; Stojanov, P. ; Huwald, E. ; Riley, J.D. ; Dähne, M.</creator><creatorcontrib>Wanke, M. ; Franz, M. ; Vetterlein, M. ; Pruskil, G. ; Höpfner, B. ; Prohl, C. ; Engelhardt, I. ; Stojanov, P. ; Huwald, E. ; Riley, J.D. ; Dähne, M.</creatorcontrib><description>We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1
1
1), taken with a toroidal analyzer allowing to image the energy surfaces in
k
||
-space. At monolayer dysprosium coverages, where hexagonal DySi
2 grows with a
1
×
1
superstructure, electron pockets are observed at the
M
¯
points with highly anisotropic effective masses, and around a hole pocket at the
Γ
¯
point also an anisotropic dispersion is found. The band filling of these two bands amounts to one, indicating an even number of electrons assigned to the surface unit cell. Similar features are found for multilayer coverages, where hexagonal Dy
3Si
5 layers are formed with a
3
×
3
R
30
°
superstructure. Here, the influence of zone folding effects due to the
3
×
3
R
30
°
reconstructed layers in the bulk silicide is only weak because of the high surface sensitivity of the experiments.</description><identifier>ISSN: 0039-6028</identifier><identifier>EISSN: 1879-2758</identifier><identifier>DOI: 10.1016/j.susc.2009.07.026</identifier><identifier>CODEN: SUSCAS</identifier><language>eng</language><publisher>Kidlington: Elsevier B.V</publisher><subject>Angle-resolved photoelectron spectroscopy ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Lanthanides ; Physics ; Silicides ; Silicon ; Thin film structures</subject><ispartof>Surface science, 2009-09, Vol.603 (17), p.2808-2814</ispartof><rights>2009 Elsevier B.V.</rights><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c361t-d9621930f441cef5eb5230ac343ec3d2c4d2026bded88d3ce7732177227de2023</citedby><cites>FETCH-LOGICAL-c361t-d9621930f441cef5eb5230ac343ec3d2c4d2026bded88d3ce7732177227de2023</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.susc.2009.07.026$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3548,27923,27924,45994</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21939060$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Wanke, M.</creatorcontrib><creatorcontrib>Franz, M.</creatorcontrib><creatorcontrib>Vetterlein, M.</creatorcontrib><creatorcontrib>Pruskil, G.</creatorcontrib><creatorcontrib>Höpfner, B.</creatorcontrib><creatorcontrib>Prohl, C.</creatorcontrib><creatorcontrib>Engelhardt, I.</creatorcontrib><creatorcontrib>Stojanov, P.</creatorcontrib><creatorcontrib>Huwald, E.</creatorcontrib><creatorcontrib>Riley, J.D.</creatorcontrib><creatorcontrib>Dähne, M.</creatorcontrib><title>Energy surfaces of rare-earth silicide films on Si(1 1 1)</title><title>Surface science</title><description>We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1
1
1), taken with a toroidal analyzer allowing to image the energy surfaces in
k
||
-space. At monolayer dysprosium coverages, where hexagonal DySi
2 grows with a
1
×
1
superstructure, electron pockets are observed at the
M
¯
points with highly anisotropic effective masses, and around a hole pocket at the
Γ
¯
point also an anisotropic dispersion is found. The band filling of these two bands amounts to one, indicating an even number of electrons assigned to the surface unit cell. Similar features are found for multilayer coverages, where hexagonal Dy
3Si
5 layers are formed with a
3
×
3
R
30
°
superstructure. Here, the influence of zone folding effects due to the
3
×
3
R
30
°
reconstructed layers in the bulk silicide is only weak because of the high surface sensitivity of the experiments.</description><subject>Angle-resolved photoelectron spectroscopy</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Lanthanides</subject><subject>Physics</subject><subject>Silicides</subject><subject>Silicon</subject><subject>Thin film structures</subject><issn>0039-6028</issn><issn>1879-2758</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9UDtPwzAQthBIlMIfYMoCgiHBjySOJRZUlYdUiQGYLdc-g6s0Kb4Uqf8eR60YuRtuuO9x9xFyyWjBKKvvVgVu0RacUlVQWVBeH5EJa6TKuayaYzKhVKi8prw5JWeIK5qqVNWEqHkH8XOX4TZ6YwGz3mfRRMjBxOErw9AGGxxkPrTrtOyyt3DDstS35-TEmxbh4jCn5ONx_j57zhevTy-zh0VuRc2G3KmaMyWoL0tmwVewrLigxopSgBWO29LxdO7SgWsaJyxIKTiTknPpIG3ElFzvdTex_94CDnod0ELbmg76LWpRNkpKVicg3wNt7BEjeL2JYW3iTjOqx5T0So8p6TElTaVOtol0dVA3aE3ro-lswD_meLqiNU24-z0O0qs_AaJGG6Cz4EIEO2jXh_9sfgF--XsF</recordid><startdate>20090901</startdate><enddate>20090901</enddate><creator>Wanke, M.</creator><creator>Franz, M.</creator><creator>Vetterlein, M.</creator><creator>Pruskil, G.</creator><creator>Höpfner, B.</creator><creator>Prohl, C.</creator><creator>Engelhardt, I.</creator><creator>Stojanov, P.</creator><creator>Huwald, E.</creator><creator>Riley, J.D.</creator><creator>Dähne, M.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20090901</creationdate><title>Energy surfaces of rare-earth silicide films on Si(1 1 1)</title><author>Wanke, M. ; Franz, M. ; Vetterlein, M. ; Pruskil, G. ; Höpfner, B. ; Prohl, C. ; Engelhardt, I. ; Stojanov, P. ; Huwald, E. ; Riley, J.D. ; Dähne, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c361t-d9621930f441cef5eb5230ac343ec3d2c4d2026bded88d3ce7732177227de2023</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Angle-resolved photoelectron spectroscopy</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Lanthanides</topic><topic>Physics</topic><topic>Silicides</topic><topic>Silicon</topic><topic>Thin film structures</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wanke, M.</creatorcontrib><creatorcontrib>Franz, M.</creatorcontrib><creatorcontrib>Vetterlein, M.</creatorcontrib><creatorcontrib>Pruskil, G.</creatorcontrib><creatorcontrib>Höpfner, B.</creatorcontrib><creatorcontrib>Prohl, C.</creatorcontrib><creatorcontrib>Engelhardt, I.</creatorcontrib><creatorcontrib>Stojanov, P.</creatorcontrib><creatorcontrib>Huwald, E.</creatorcontrib><creatorcontrib>Riley, J.D.</creatorcontrib><creatorcontrib>Dähne, M.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wanke, M.</au><au>Franz, M.</au><au>Vetterlein, M.</au><au>Pruskil, G.</au><au>Höpfner, B.</au><au>Prohl, C.</au><au>Engelhardt, I.</au><au>Stojanov, P.</au><au>Huwald, E.</au><au>Riley, J.D.</au><au>Dähne, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Energy surfaces of rare-earth silicide films on Si(1 1 1)</atitle><jtitle>Surface science</jtitle><date>2009-09-01</date><risdate>2009</risdate><volume>603</volume><issue>17</issue><spage>2808</spage><epage>2814</epage><pages>2808-2814</pages><issn>0039-6028</issn><eissn>1879-2758</eissn><coden>SUSCAS</coden><abstract>We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1
1
1), taken with a toroidal analyzer allowing to image the energy surfaces in
k
||
-space. At monolayer dysprosium coverages, where hexagonal DySi
2 grows with a
1
×
1
superstructure, electron pockets are observed at the
M
¯
points with highly anisotropic effective masses, and around a hole pocket at the
Γ
¯
point also an anisotropic dispersion is found. The band filling of these two bands amounts to one, indicating an even number of electrons assigned to the surface unit cell. Similar features are found for multilayer coverages, where hexagonal Dy
3Si
5 layers are formed with a
3
×
3
R
30
°
superstructure. Here, the influence of zone folding effects due to the
3
×
3
R
30
°
reconstructed layers in the bulk silicide is only weak because of the high surface sensitivity of the experiments.</abstract><cop>Kidlington</cop><pub>Elsevier B.V</pub><doi>10.1016/j.susc.2009.07.026</doi><tpages>7</tpages></addata></record> |
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| ispartof | Surface science, 2009-09, Vol.603 (17), p.2808-2814 |
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| source | ScienceDirect Journals (5 years ago - present) |
| subjects | Angle-resolved photoelectron spectroscopy Condensed matter: electronic structure, electrical, magnetic, and optical properties Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Lanthanides Physics Silicides Silicon Thin film structures |
| title | Energy surfaces of rare-earth silicide films on Si(1 1 1) |
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