Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices

This paper deals with the design of single-stage differential low-noise amplifiers for ultra-wideband (UWB) applications, comparing state-of-the-art planar bulk and silicon-on-insulator (SOI) FinFET CMOS technologies featuring 45-nm gate length. To ensure a broadband input impedance matching, the g...

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Veröffentlicht in:IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2009-05, Vol.56 (5), p.920-932
Hauptverfasser: Ponton, D., Palestri, P., Esseni, D., Selmi, L., Tiebout, M., Parvais, B., Siprak, D., Knoblinger, G.
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container_end_page 932
container_issue 5
container_start_page 920
container_title IEEE transactions on circuits and systems. I, Regular papers
container_volume 56
creator Ponton, D.
Palestri, P.
Esseni, D.
Selmi, L.
Tiebout, M.
Parvais, B.
Siprak, D.
Knoblinger, G.
description This paper deals with the design of single-stage differential low-noise amplifiers for ultra-wideband (UWB) applications, comparing state-of-the-art planar bulk and silicon-on-insulator (SOI) FinFET CMOS technologies featuring 45-nm gate length. To ensure a broadband input impedance matching, the g m -boosted topology has been chosen. Furthermore, the amplifiers have been designed to work over the whole UWB band (3.1-10.6 GHz), while driving a capacitive load, which is a realistic assumption for direct conversion receivers where the amplifier directly drives a mixer. The simulations (based on compact models obtained from preliminary measurements) highlight that, at the present stage of the technology development, the planar version of the circuit appears to outperform the FinFET one. The main reason is the superior cutoff frequency of planar devices in the inversion region, which allows the achievement of noise figure and voltage gain comparable to the FinFET counterpart, with a smaller power consumption.
doi_str_mv 10.1109/TCSI.2009.2015178
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fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_34860306</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4783012</ieee_id><sourcerecordid>34860306</sourcerecordid><originalsourceid>FETCH-LOGICAL-c422t-e38d11ab26bfccd1aea53fb54ce60425b132a793cde807a1459b4933137171393</originalsourceid><addsrcrecordid>eNp9kU1v1DAQhiMEEqXwAyouFgfEJcXjj8Tm1qYtrLSwlXYrjpHjTIpLYi_2bqse-O842ooDBy4zI80zr2bmLYoToKcAVH_cNOvFKaNU5wASavWsOAIpVUkVrZ7PtdCl4ky9LF6ldEcp05TDUfH7ApO79SQM5GbcRVN-dz12xvdkGR7Kb8ElJGfTdnSDw5iI80TI0k-k-bpakw3aHz6M4fbxE2nCtDXRpeDJOe4eED25Ho03kZzvx59kVlyvFuTK-avLDbnAe2cxvS5eDGZM-OYpHxc3udt8KZerz4vmbFlawdiuRK56ANOxqhus7cGgkXzopLBYUcFkB5yZWnPbo6K1ASF1JzTnwGuogWt-XLw_6G5j-LXHtGsnlyyOeUEM-9RyoSrKaZXBD_8FIT-NacVAZvTdP-hd2Eefz2hVBXXm5KwHB8jGkFLEod1GN5n4mJXa2bh2Nq6djWufjMszbw8zDhH_8iJ3KDD-B17lkaE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>861731256</pqid></control><display><type>article</type><title>Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices</title><source>IEEE Electronic Library (IEL)</source><creator>Ponton, D. ; Palestri, P. ; Esseni, D. ; Selmi, L. ; Tiebout, M. ; Parvais, B. ; Siprak, D. ; Knoblinger, G.</creator><creatorcontrib>Ponton, D. ; Palestri, P. ; Esseni, D. ; Selmi, L. ; Tiebout, M. ; Parvais, B. ; Siprak, D. ; Knoblinger, G.</creatorcontrib><description>This paper deals with the design of single-stage differential low-noise amplifiers for ultra-wideband (UWB) applications, comparing state-of-the-art planar bulk and silicon-on-insulator (SOI) FinFET CMOS technologies featuring 45-nm gate length. To ensure a broadband input impedance matching, the g m -boosted topology has been chosen. Furthermore, the amplifiers have been designed to work over the whole UWB band (3.1-10.6 GHz), while driving a capacitive load, which is a realistic assumption for direct conversion receivers where the amplifier directly drives a mixer. The simulations (based on compact models obtained from preliminary measurements) highlight that, at the present stage of the technology development, the planar version of the circuit appears to outperform the FinFET one. The main reason is the superior cutoff frequency of planar devices in the inversion region, which allows the achievement of noise figure and voltage gain comparable to the FinFET counterpart, with a smaller power consumption.</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2009.2015178</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplifiers ; Broadband ; Broadband amplifiers ; Circuit simulation ; Circuits ; CMOS ; CMOS technology ; Design engineering ; Devices ; FinFETs ; g_{m} -boosted ; Impedance matching ; Inversions ; low-noise amplifier (LNA) ; Low-noise amplifiers ; Mixers ; multi resonance ; planar bulk ; RFCMOS ; Silicon on insulator technology ; silicon-on-insulator (SOI) FinFET ; Topology ; Ultra wideband technology ; ultra-wideband (UWB)</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2009-05, Vol.56 (5), p.920-932</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c422t-e38d11ab26bfccd1aea53fb54ce60425b132a793cde807a1459b4933137171393</citedby><cites>FETCH-LOGICAL-c422t-e38d11ab26bfccd1aea53fb54ce60425b132a793cde807a1459b4933137171393</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4783012$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4783012$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ponton, D.</creatorcontrib><creatorcontrib>Palestri, P.</creatorcontrib><creatorcontrib>Esseni, D.</creatorcontrib><creatorcontrib>Selmi, L.</creatorcontrib><creatorcontrib>Tiebout, M.</creatorcontrib><creatorcontrib>Parvais, B.</creatorcontrib><creatorcontrib>Siprak, D.</creatorcontrib><creatorcontrib>Knoblinger, G.</creatorcontrib><title>Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description>This paper deals with the design of single-stage differential low-noise amplifiers for ultra-wideband (UWB) applications, comparing state-of-the-art planar bulk and silicon-on-insulator (SOI) FinFET CMOS technologies featuring 45-nm gate length. To ensure a broadband input impedance matching, the g m -boosted topology has been chosen. Furthermore, the amplifiers have been designed to work over the whole UWB band (3.1-10.6 GHz), while driving a capacitive load, which is a realistic assumption for direct conversion receivers where the amplifier directly drives a mixer. The simulations (based on compact models obtained from preliminary measurements) highlight that, at the present stage of the technology development, the planar version of the circuit appears to outperform the FinFET one. The main reason is the superior cutoff frequency of planar devices in the inversion region, which allows the achievement of noise figure and voltage gain comparable to the FinFET counterpart, with a smaller power consumption.</description><subject>Amplifiers</subject><subject>Broadband</subject><subject>Broadband amplifiers</subject><subject>Circuit simulation</subject><subject>Circuits</subject><subject>CMOS</subject><subject>CMOS technology</subject><subject>Design engineering</subject><subject>Devices</subject><subject>FinFETs</subject><subject>g_{m} -boosted</subject><subject>Impedance matching</subject><subject>Inversions</subject><subject>low-noise amplifier (LNA)</subject><subject>Low-noise amplifiers</subject><subject>Mixers</subject><subject>multi resonance</subject><subject>planar bulk</subject><subject>RFCMOS</subject><subject>Silicon on insulator technology</subject><subject>silicon-on-insulator (SOI) FinFET</subject><subject>Topology</subject><subject>Ultra wideband technology</subject><subject>ultra-wideband (UWB)</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kU1v1DAQhiMEEqXwAyouFgfEJcXjj8Tm1qYtrLSwlXYrjpHjTIpLYi_2bqse-O842ooDBy4zI80zr2bmLYoToKcAVH_cNOvFKaNU5wASavWsOAIpVUkVrZ7PtdCl4ky9LF6ldEcp05TDUfH7ApO79SQM5GbcRVN-dz12xvdkGR7Kb8ElJGfTdnSDw5iI80TI0k-k-bpakw3aHz6M4fbxE2nCtDXRpeDJOe4eED25Ho03kZzvx59kVlyvFuTK-avLDbnAe2cxvS5eDGZM-OYpHxc3udt8KZerz4vmbFlawdiuRK56ANOxqhus7cGgkXzopLBYUcFkB5yZWnPbo6K1ASF1JzTnwGuogWt-XLw_6G5j-LXHtGsnlyyOeUEM-9RyoSrKaZXBD_8FIT-NacVAZvTdP-hd2Eefz2hVBXXm5KwHB8jGkFLEod1GN5n4mJXa2bh2Nq6djWufjMszbw8zDhH_8iJ3KDD-B17lkaE</recordid><startdate>20090501</startdate><enddate>20090501</enddate><creator>Ponton, D.</creator><creator>Palestri, P.</creator><creator>Esseni, D.</creator><creator>Selmi, L.</creator><creator>Tiebout, M.</creator><creator>Parvais, B.</creator><creator>Siprak, D.</creator><creator>Knoblinger, G.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20090501</creationdate><title>Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices</title><author>Ponton, D. ; Palestri, P. ; Esseni, D. ; Selmi, L. ; Tiebout, M. ; Parvais, B. ; Siprak, D. ; Knoblinger, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c422t-e38d11ab26bfccd1aea53fb54ce60425b132a793cde807a1459b4933137171393</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Amplifiers</topic><topic>Broadband</topic><topic>Broadband amplifiers</topic><topic>Circuit simulation</topic><topic>Circuits</topic><topic>CMOS</topic><topic>CMOS technology</topic><topic>Design engineering</topic><topic>Devices</topic><topic>FinFETs</topic><topic>g_{m} -boosted</topic><topic>Impedance matching</topic><topic>Inversions</topic><topic>low-noise amplifier (LNA)</topic><topic>Low-noise amplifiers</topic><topic>Mixers</topic><topic>multi resonance</topic><topic>planar bulk</topic><topic>RFCMOS</topic><topic>Silicon on insulator technology</topic><topic>silicon-on-insulator (SOI) FinFET</topic><topic>Topology</topic><topic>Ultra wideband technology</topic><topic>ultra-wideband (UWB)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ponton, D.</creatorcontrib><creatorcontrib>Palestri, P.</creatorcontrib><creatorcontrib>Esseni, D.</creatorcontrib><creatorcontrib>Selmi, L.</creatorcontrib><creatorcontrib>Tiebout, M.</creatorcontrib><creatorcontrib>Parvais, B.</creatorcontrib><creatorcontrib>Siprak, D.</creatorcontrib><creatorcontrib>Knoblinger, G.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ponton, D.</au><au>Palestri, P.</au><au>Esseni, D.</au><au>Selmi, L.</au><au>Tiebout, M.</au><au>Parvais, B.</au><au>Siprak, D.</au><au>Knoblinger, G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2009-05-01</date><risdate>2009</risdate><volume>56</volume><issue>5</issue><spage>920</spage><epage>932</epage><pages>920-932</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>This paper deals with the design of single-stage differential low-noise amplifiers for ultra-wideband (UWB) applications, comparing state-of-the-art planar bulk and silicon-on-insulator (SOI) FinFET CMOS technologies featuring 45-nm gate length. To ensure a broadband input impedance matching, the g m -boosted topology has been chosen. Furthermore, the amplifiers have been designed to work over the whole UWB band (3.1-10.6 GHz), while driving a capacitive load, which is a realistic assumption for direct conversion receivers where the amplifier directly drives a mixer. The simulations (based on compact models obtained from preliminary measurements) highlight that, at the present stage of the technology development, the planar version of the circuit appears to outperform the FinFET one. The main reason is the superior cutoff frequency of planar devices in the inversion region, which allows the achievement of noise figure and voltage gain comparable to the FinFET counterpart, with a smaller power consumption.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2009.2015178</doi><tpages>13</tpages></addata></record>
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recordid cdi_proquest_miscellaneous_34860306
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subjects Amplifiers
Broadband
Broadband amplifiers
Circuit simulation
Circuits
CMOS
CMOS technology
Design engineering
Devices
FinFETs
g_{m} -boosted
Impedance matching
Inversions
low-noise amplifier (LNA)
Low-noise amplifiers
Mixers
multi resonance
planar bulk
RFCMOS
Silicon on insulator technology
silicon-on-insulator (SOI) FinFET
Topology
Ultra wideband technology
ultra-wideband (UWB)
title Design of Ultra-Wideband Low-Noise Amplifiers in 45-nm CMOS Technology: Comparison Between Planar Bulk and SOI FinFET Devices
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T05%3A50%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Design%20of%20Ultra-Wideband%20Low-Noise%20Amplifiers%20in%2045-nm%20CMOS%20Technology:%20Comparison%20Between%20Planar%20Bulk%20and%20SOI%20FinFET%20Devices&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Ponton,%20D.&rft.date=2009-05-01&rft.volume=56&rft.issue=5&rft.spage=920&rft.epage=932&rft.pages=920-932&rft.issn=1549-8328&rft.eissn=1558-0806&rft.coden=ITCSCH&rft_id=info:doi/10.1109/TCSI.2009.2015178&rft_dat=%3Cproquest_RIE%3E34860306%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=861731256&rft_id=info:pmid/&rft_ieee_id=4783012&rfr_iscdi=true