Spreading profile of dopant solution on pre-sintered silica layers for selective area doping of integrated optic planar glass samples
The spread profile of potassium-permanganate (KMnO 4) dye on a porous pre-sintered silica layer deposited via Flame Hydrolysis Deposition is presented. The work is aimed at controlling the dopant profile on the resulting glass layer for optically passive and active devices integration. KMnO 4 is use...
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| Veröffentlicht in: | Thin solid films 2009-11, Vol.518 (1), p.378-382 |
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| creator | Leong, W.C. Tho, S.Y. Law, A.W.P. Chong, W.Y. Pua, C.H. Ahmad, H. Haseeb, A.S.M.A. Adikan, F.R. Mahamd |
| description | The spread profile of potassium-permanganate (KMnO
4) dye on a porous pre-sintered silica layer deposited via Flame Hydrolysis Deposition is presented. The work is aimed at controlling the dopant profile on the resulting glass layer for optically passive and active devices integration. KMnO
4 is used as it allows visual qualification of its spread on the soot layer. Pre-sintered silica layers allow for application of dopants into the glass matrix via adsorption and pore retention. Selective area doping is achieved by applying specific volumes of the dye onto pre-selected areas on the sample using a micropipette. Higher dye volumes applied would result in larger spread diameters. Furthermore, control of the spread is possible by heating the sample during the application of the dye. |
| doi_str_mv | 10.1016/j.tsf.2009.06.060 |
| format | Article |
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4 is used as it allows visual qualification of its spread on the soot layer. Pre-sintered silica layers allow for application of dopants into the glass matrix via adsorption and pore retention. Selective area doping is achieved by applying specific volumes of the dye onto pre-selected areas on the sample using a micropipette. Higher dye volumes applied would result in larger spread diameters. Furthermore, control of the spread is possible by heating the sample during the application of the dye.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Exact sciences and technology</subject><subject>Integrated optics devices</subject><subject>Physics</subject><subject>Planar waveguide</subject><subject>Selective area doping techniques</subject><subject>Solid surfaces and solid-solid interfaces</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><issn>0040-6090</issn><issn>1879-2731</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kEGLFDEUhIMoOK7-AG-56K3Hl6Q73Y0nWVwVFjys95BJXoYMmU6bl1nYH-D_Ns0sHoWCd_mqkirG3gvYCxD602lfKewlwLwH3QQv2E5M49zJUYmXbAfQQ6dhhtfsDdEJAISUasf-PKwFrY_Lka8lh5iQ58B9Xu1SOeV0qTEvvKlhHcWlYkHPKaboLE_2CQvxkAsnTOhqfERuW94WsEW2qM1yLLY2V15rdHxNdrGFH5Ml4mTPa0J6y14FmwjfPd8b9nD39dft9-7-57cft1_uO6eGqXZayMF5GPvBSy-Ux16rHg7DNDmnDzPqaWzFfN8oOIzCeTkNMwRAhZMI6oZ9vKa2pr8vSNWcIzlM7UOYL2RUP4lR6b6B4gq6kokKBrOWeLblyQgw29zmZNrcZpvbgG6C5vnwHG7J2RSKXVykf0bZWD31snGfrxy2no8RiyEXcXHoY2kLGp_jf175C8W1l38</recordid><startdate>20091102</startdate><enddate>20091102</enddate><creator>Leong, W.C.</creator><creator>Tho, S.Y.</creator><creator>Law, A.W.P.</creator><creator>Chong, W.Y.</creator><creator>Pua, C.H.</creator><creator>Ahmad, H.</creator><creator>Haseeb, A.S.M.A.</creator><creator>Adikan, F.R. Mahamd</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20091102</creationdate><title>Spreading profile of dopant solution on pre-sintered silica layers for selective area doping of integrated optic planar glass samples</title><author>Leong, W.C. ; Tho, S.Y. ; Law, A.W.P. ; Chong, W.Y. ; Pua, C.H. ; Ahmad, H. ; Haseeb, A.S.M.A. ; Adikan, F.R. Mahamd</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c358t-6125cd0745d2d13de46340b588cc6b9e687000d425c0b71cd28590f0e3e81f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Exact sciences and technology</topic><topic>Integrated optics devices</topic><topic>Physics</topic><topic>Planar waveguide</topic><topic>Selective area doping techniques</topic><topic>Solid surfaces and solid-solid interfaces</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Leong, W.C.</creatorcontrib><creatorcontrib>Tho, S.Y.</creatorcontrib><creatorcontrib>Law, A.W.P.</creatorcontrib><creatorcontrib>Chong, W.Y.</creatorcontrib><creatorcontrib>Pua, C.H.</creatorcontrib><creatorcontrib>Ahmad, H.</creatorcontrib><creatorcontrib>Haseeb, A.S.M.A.</creatorcontrib><creatorcontrib>Adikan, F.R. Mahamd</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Thin solid films</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Leong, W.C.</au><au>Tho, S.Y.</au><au>Law, A.W.P.</au><au>Chong, W.Y.</au><au>Pua, C.H.</au><au>Ahmad, H.</au><au>Haseeb, A.S.M.A.</au><au>Adikan, F.R. Mahamd</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Spreading profile of dopant solution on pre-sintered silica layers for selective area doping of integrated optic planar glass samples</atitle><jtitle>Thin solid films</jtitle><date>2009-11-02</date><risdate>2009</risdate><volume>518</volume><issue>1</issue><spage>378</spage><epage>382</epage><pages>378-382</pages><issn>0040-6090</issn><eissn>1879-2731</eissn><coden>THSFAP</coden><abstract>The spread profile of potassium-permanganate (KMnO
4) dye on a porous pre-sintered silica layer deposited via Flame Hydrolysis Deposition is presented. The work is aimed at controlling the dopant profile on the resulting glass layer for optically passive and active devices integration. KMnO
4 is used as it allows visual qualification of its spread on the soot layer. Pre-sintered silica layers allow for application of dopants into the glass matrix via adsorption and pore retention. Selective area doping is achieved by applying specific volumes of the dye onto pre-selected areas on the sample using a micropipette. Higher dye volumes applied would result in larger spread diameters. Furthermore, control of the spread is possible by heating the sample during the application of the dye.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.tsf.2009.06.060</doi><tpages>5</tpages></addata></record> |
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| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Integrated optics devices Physics Planar waveguide Selective area doping techniques Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Spreading profile of dopant solution on pre-sintered silica layers for selective area doping of integrated optic planar glass samples |
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