A comparison of the KOSSEL and the X-ray Rotation-Tilt Technique

There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are compared to...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Crystal research and technology (1979) 2003-06, Vol.38 (6), p.440-449
Hauptverfasser:	Bauch, J., Ullrich, H.-J., Böhling, M., Reiche, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties determination of lattice parameters Exact sciences and technology KOSSEL technique Physics Single-crystal and powder diffraction stress Structure of solids and liquids crystallography synchrotron radiation X-ray diffraction and scattering X-ray microdiffraction X-ray rotation-tilt technique (XRT)
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	There are world‐wide efforts to analyse micron regions of compact samples by means of X‐ray diffraction (“X‐ray Microdiffraction”). Two micro diffraction procedures, the KOSSEL technique excited by electron or synchrotron radiation beams and the new X‐ray Rotation‐Tilt Method (XRT), are compared to show their possibilities and limitations. Some selected examples of new applications are presented.
ISSN:	0232-1300 1521-4079
DOI:	10.1002/crat.200310055