PIXE analysis of a painting by Giorgio Vasari
Among ion beam analysis (IBA) techniques, particle induced x‐ray emission (PIXE) is the most widely used in the field of cultural heritage, providing the elemental composition of materials in a non‐invasive and non‐destructive way. This paper reports on the analysis by PIXE performed at one of the e...
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Veröffentlicht in: | X-ray spectrometry 2009-07, Vol.38 (4), p.301-307 |
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creator | Grassi, N. Bonanni, P. Mazzotta, C. Migliori, A. Mandò, P. A. |
description | Among ion beam analysis (IBA) techniques, particle induced x‐ray emission (PIXE) is the most widely used in the field of cultural heritage, providing the elemental composition of materials in a non‐invasive and non‐destructive way. This paper reports on the analysis by PIXE performed at one of the external beamlines of the 3 MV Tandetron accelerator of the LABEC laboratory (Istituto Nazionale di Fisica Nucleare (INFN)—Florence) on a wood painting by Giorgio Vasari, belonging to the altar‐piece ‘Pala Albergotti’ (church of Sts Flora and Lucilla, Arezzo). The measurements were taken in the framework of a campaign of scientific investigations, promoted by the Soprintendenza of Arezzo, preliminary to the restoration of the whole altar‐piece. PIXE was used to identify the elemental composition of the original materials and to characterise the alteration layer visible on the surface of the painting. Measurements on the same spot with proton beams of different energies (differential PIXE) also allowed us to get information on the depth distribution of elements and on the structure of layers without the need of picking up samples. Copyright © 2009 John Wiley & Sons, Ltd. |
doi_str_mv | 10.1002/xrs.1181 |
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PIXE was used to identify the elemental composition of the original materials and to characterise the alteration layer visible on the surface of the painting. Measurements on the same spot with proton beams of different energies (differential PIXE) also allowed us to get information on the depth distribution of elements and on the structure of layers without the need of picking up samples. 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A.</creatorcontrib><title>PIXE analysis of a painting by Giorgio Vasari</title><title>X-ray spectrometry</title><addtitle>X-Ray Spectrom</addtitle><description>Among ion beam analysis (IBA) techniques, particle induced x‐ray emission (PIXE) is the most widely used in the field of cultural heritage, providing the elemental composition of materials in a non‐invasive and non‐destructive way. This paper reports on the analysis by PIXE performed at one of the external beamlines of the 3 MV Tandetron accelerator of the LABEC laboratory (Istituto Nazionale di Fisica Nucleare (INFN)—Florence) on a wood painting by Giorgio Vasari, belonging to the altar‐piece ‘Pala Albergotti’ (church of Sts Flora and Lucilla, Arezzo). The measurements were taken in the framework of a campaign of scientific investigations, promoted by the Soprintendenza of Arezzo, preliminary to the restoration of the whole altar‐piece. PIXE was used to identify the elemental composition of the original materials and to characterise the alteration layer visible on the surface of the painting. Measurements on the same spot with proton beams of different energies (differential PIXE) also allowed us to get information on the depth distribution of elements and on the structure of layers without the need of picking up samples. 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The measurements were taken in the framework of a campaign of scientific investigations, promoted by the Soprintendenza of Arezzo, preliminary to the restoration of the whole altar‐piece. PIXE was used to identify the elemental composition of the original materials and to characterise the alteration layer visible on the surface of the painting. Measurements on the same spot with proton beams of different energies (differential PIXE) also allowed us to get information on the depth distribution of elements and on the structure of layers without the need of picking up samples. Copyright © 2009 John Wiley & Sons, Ltd.</abstract><cop>Chichester, UK</cop><pub>John Wiley & Sons, Ltd</pub><doi>10.1002/xrs.1181</doi><tpages>7</tpages></addata></record> |
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subjects | Analytical chemistry Chemistry Exact sciences and technology Spectrometric and optical methods |
title | PIXE analysis of a painting by Giorgio Vasari |
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