Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants
The critical thickness condition of the misfit dislocation formation in the system of a nanowire surrounded by a co-axial film with different elastic constants is investigated. The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowi...
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Veröffentlicht in: | Physica. B, Condensed matter Condensed matter, 2009-07, Vol.404 (14), p.1897-1900 |
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container_title | Physica. B, Condensed matter |
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creator | Fang, Q.H. Song, H.P. Liu, Y.W. |
description | The critical thickness condition of the misfit dislocation formation in the system of a nanowire surrounded by a co-axial film with different elastic constants is investigated. The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowire on the critical thickness of the film is discussed. The results show that the critical thickness of the film for the formation of the MDs decreases monotonically with the increment of the ratio of the shear modulus. However, if the ratio of the shear modulus is reached at a certain value, the generation of MDs is energetically favorable only when the film thickness is in some range. At last, the generation of MDs is energetically unfavorable at any value of the film thickness with the ratio of the shear modulus larger than a critical value. |
doi_str_mv | 10.1016/j.physb.2008.12.009 |
format | Article |
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The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowire on the critical thickness of the film is discussed. The results show that the critical thickness of the film for the formation of the MDs decreases monotonically with the increment of the ratio of the shear modulus. However, if the ratio of the shear modulus is reached at a certain value, the generation of MDs is energetically favorable only when the film thickness is in some range. At last, the generation of MDs is energetically unfavorable at any value of the film thickness with the ratio of the shear modulus larger than a critical value.</description><identifier>ISSN: 0921-4526</identifier><identifier>EISSN: 1873-2135</identifier><identifier>DOI: 10.1016/j.physb.2008.12.009</identifier><language>eng</language><publisher>Kidlington: Elsevier B.V</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Critical film thickness ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Materials science ; Misfit dislocations ; Nanoscale materials and structures: fabrication and characterization ; Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals ; Nanowire ; Physics ; Quantum wires ; Structure of solids and liquids; crystallography</subject><ispartof>Physica. B, Condensed matter, 2009-07, Vol.404 (14), p.1897-1900</ispartof><rights>2008 Elsevier B.V.</rights><rights>2009 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-9105c787850f55f09a6c731a1ce0f5fce32f2d8036f859235217984e626194d43</citedby><cites>FETCH-LOGICAL-c364t-9105c787850f55f09a6c731a1ce0f5fce32f2d8036f859235217984e626194d43</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.physb.2008.12.009$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21652779$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Fang, Q.H.</creatorcontrib><creatorcontrib>Song, H.P.</creatorcontrib><creatorcontrib>Liu, Y.W.</creatorcontrib><title>Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants</title><title>Physica. B, Condensed matter</title><description>The critical thickness condition of the misfit dislocation formation in the system of a nanowire surrounded by a co-axial film with different elastic constants is investigated. The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowire on the critical thickness of the film is discussed. The results show that the critical thickness of the film for the formation of the MDs decreases monotonically with the increment of the ratio of the shear modulus. However, if the ratio of the shear modulus is reached at a certain value, the generation of MDs is energetically favorable only when the film thickness is in some range. At last, the generation of MDs is energetically unfavorable at any value of the film thickness with the ratio of the shear modulus larger than a critical value.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Critical film thickness</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Materials science</subject><subject>Misfit dislocations</subject><subject>Nanoscale materials and structures: fabrication and characterization</subject><subject>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</subject><subject>Nanowire</subject><subject>Physics</subject><subject>Quantum wires</subject><subject>Structure of solids and liquids; crystallography</subject><issn>0921-4526</issn><issn>1873-2135</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9kE-LFDEQxYMoOK5-Ai-56K17U0mn_xw8yOKqsOJFzyGmk90aMsmYyjjMtzfjLB63KCgo3ntF_Rh7C6IHAeP1tt8_nOhXL4WYe5C9EMsztoF5Up0EpZ-zjVgkdIOW40v2imgrWsEEG3b_DSlg5StSzM5WzIk4Jm7PnQ7RFh4w7vh9ycfEc9tyd4qY1oLORp5sykcsnh-xPrSQEHzxqXIfLVV03LW4alOl1-xFsJH8m8d5xX7efvpx86W7-_75683Hu86pcajdAkK7aZ5mLYLWQSx2dJMCC863RXBeySDXWagxzHqRSkuYlnnwoxxhGdZBXbH3l9x9yb8PnqrZITkfo00-H8ioQYtmgyZUF6Ermaj4YPYFd7acDAhzhmq25h9Uc4ZqQJoGtbnePcZbav-HYpND-m-VMGo5TWfdh4vOt1__oC-GHPrk_NpguWrWjE_e-Qtgeo7O</recordid><startdate>20090701</startdate><enddate>20090701</enddate><creator>Fang, Q.H.</creator><creator>Song, H.P.</creator><creator>Liu, Y.W.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20090701</creationdate><title>Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants</title><author>Fang, Q.H. ; Song, H.P. ; Liu, Y.W.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-9105c787850f55f09a6c731a1ce0f5fce32f2d8036f859235217984e626194d43</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Critical film thickness</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Materials science</topic><topic>Misfit dislocations</topic><topic>Nanoscale materials and structures: fabrication and characterization</topic><topic>Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals</topic><topic>Nanowire</topic><topic>Physics</topic><topic>Quantum wires</topic><topic>Structure of solids and liquids; crystallography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fang, Q.H.</creatorcontrib><creatorcontrib>Song, H.P.</creatorcontrib><creatorcontrib>Liu, Y.W.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fang, Q.H.</au><au>Song, H.P.</au><au>Liu, Y.W.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants</atitle><jtitle>Physica. B, Condensed matter</jtitle><date>2009-07-01</date><risdate>2009</risdate><volume>404</volume><issue>14</issue><spage>1897</spage><epage>1900</epage><pages>1897-1900</pages><issn>0921-4526</issn><eissn>1873-2135</eissn><abstract>The critical thickness condition of the misfit dislocation formation in the system of a nanowire surrounded by a co-axial film with different elastic constants is investigated. The influence of the shear modulus ratio of the film to the nanowire (cylinder), the misfit strain and the radius of nanowire on the critical thickness of the film is discussed. The results show that the critical thickness of the film for the formation of the MDs decreases monotonically with the increment of the ratio of the shear modulus. However, if the ratio of the shear modulus is reached at a certain value, the generation of MDs is energetically favorable only when the film thickness is in some range. At last, the generation of MDs is energetically unfavorable at any value of the film thickness with the ratio of the shear modulus larger than a critical value.</abstract><cop>Kidlington</cop><pub>Elsevier B.V</pub><doi>10.1016/j.physb.2008.12.009</doi><tpages>4</tpages></addata></record> |
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subjects | Condensed matter: structure, mechanical and thermal properties Critical film thickness Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Misfit dislocations Nanoscale materials and structures: fabrication and characterization Nanoscale materials: clusters, nanoparticles, nanotubes, and nanocrystals Nanowire Physics Quantum wires Structure of solids and liquids crystallography |
title | Misfit dislocations in an annular film grown on a cylindrical nanowire with different elastic constants |
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