Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels

We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fadin...

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Veröffentlicht in:IEEE communications letters 2008-11, Vol.12 (11), p.822-824
Hauptverfasser: Zlatanov, N., Hadzi-Velkov, Z., Karagiannidis, G.
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Hadzi-Velkov, Z.
Karagiannidis, G.
description We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.
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source IEEE Electronic Library (IEL)
subjects Applied sciences
Approximation
average fade duration (AFD)
Block codes
cascaded fading
Channels
Coding, codes
Computer simulation
Exact sciences and technology
Fading
Information, signal and communications theory
keyhole MIMO fading channels
Keyholes
Level crossing rate (LCR)
Level crossings
Mathematical analysis
MIMO
multiplicative fading
Nakagami distribution
Nakagami-m fading
Random processes
Rayleigh channels
Scattering
Signal and communications theory
Statistics
Systems, networks and services of telecommunications
Telecommunications
Telecommunications and information theory
Transmission and modulation (techniques and equipments)
title Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels
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