Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels
We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fadin...
Gespeichert in:
Veröffentlicht in: | IEEE communications letters 2008-11, Vol.12 (11), p.822-824 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 824 |
---|---|
container_issue | 11 |
container_start_page | 822 |
container_title | IEEE communications letters |
container_volume | 12 |
creator | Zlatanov, N. Hadzi-Velkov, Z. Karagiannidis, G. |
description | We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations. |
doi_str_mv | 10.1109/LCOMM.2008.081058 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_miscellaneous_34493173</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4717981</ieee_id><sourcerecordid>875055380</sourcerecordid><originalsourceid>FETCH-LOGICAL-c526t-84601a0154790766c60b941bef1552e293ecfe0f9e8c317885a37b10bbad274d3</originalsourceid><addsrcrecordid>eNqNkctu2zAQRYWiAZom_YCiG6JA25WcISW-loXRRwA73rRrgqJGNhOKckUrQD6g_x3aCrLoosiGz3PvzOAWxXsKC0pBX62Wm_V6wQDUAhQFrl4V55RzVbK8vM5nULqUUqs3xduUbiGDjNPz4u8K7zEQNw4p-bgloz0gsbEl9h5Hu0XS2RZJO-V3P0QydOSwy_dhagKSG3tnt7b3ZZ91sR16sh8HhynNDvt98G7W-UjW1-sNucOH3RBOrsdqbmdjxJAui7POhoTvnvaL4vf3b7-WP8vV5sf18uuqdJyJQ6lqAdQC5bXUIIVwAhpd0wa7PCpDpit0HUKnUbmKSqW4rWRDoWlsy2TdVhfFl9k39_lnwnQwvU8OQ7ARhykZJTkISrl6Ecl5pSCTn_9LVnWtczNVBj_-A94O0xjzvEYJJiWV9bEunaFTIiN2Zj_63o4PhoI5Jm1OSZtj0mZOOms-PRnb5GzochbOp2chA8UFEyJzH2bOI-Lzd50La0WrR3VRsQ0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>862771748</pqid></control><display><type>article</type><title>Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels</title><source>IEEE Electronic Library (IEL)</source><creator>Zlatanov, N. ; Hadzi-Velkov, Z. ; Karagiannidis, G.</creator><creatorcontrib>Zlatanov, N. ; Hadzi-Velkov, Z. ; Karagiannidis, G.</creatorcontrib><description>We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.</description><identifier>ISSN: 1089-7798</identifier><identifier>EISSN: 1558-2558</identifier><identifier>DOI: 10.1109/LCOMM.2008.081058</identifier><identifier>CODEN: ICLEF6</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Approximation ; average fade duration (AFD) ; Block codes ; cascaded fading ; Channels ; Coding, codes ; Computer simulation ; Exact sciences and technology ; Fading ; Information, signal and communications theory ; keyhole MIMO fading channels ; Keyholes ; Level crossing rate (LCR) ; Level crossings ; Mathematical analysis ; MIMO ; multiplicative fading ; Nakagami distribution ; Nakagami-m fading ; Random processes ; Rayleigh channels ; Scattering ; Signal and communications theory ; Statistics ; Systems, networks and services of telecommunications ; Telecommunications ; Telecommunications and information theory ; Transmission and modulation (techniques and equipments)</subject><ispartof>IEEE communications letters, 2008-11, Vol.12 (11), p.822-824</ispartof><rights>2008 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2008</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c526t-84601a0154790766c60b941bef1552e293ecfe0f9e8c317885a37b10bbad274d3</citedby><cites>FETCH-LOGICAL-c526t-84601a0154790766c60b941bef1552e293ecfe0f9e8c317885a37b10bbad274d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4717981$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4717981$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20856266$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Zlatanov, N.</creatorcontrib><creatorcontrib>Hadzi-Velkov, Z.</creatorcontrib><creatorcontrib>Karagiannidis, G.</creatorcontrib><title>Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels</title><title>IEEE communications letters</title><addtitle>COML</addtitle><description>We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.</description><subject>Applied sciences</subject><subject>Approximation</subject><subject>average fade duration (AFD)</subject><subject>Block codes</subject><subject>cascaded fading</subject><subject>Channels</subject><subject>Coding, codes</subject><subject>Computer simulation</subject><subject>Exact sciences and technology</subject><subject>Fading</subject><subject>Information, signal and communications theory</subject><subject>keyhole MIMO fading channels</subject><subject>Keyholes</subject><subject>Level crossing rate (LCR)</subject><subject>Level crossings</subject><subject>Mathematical analysis</subject><subject>MIMO</subject><subject>multiplicative fading</subject><subject>Nakagami distribution</subject><subject>Nakagami-m fading</subject><subject>Random processes</subject><subject>Rayleigh channels</subject><subject>Scattering</subject><subject>Signal and communications theory</subject><subject>Statistics</subject><subject>Systems, networks and services of telecommunications</subject><subject>Telecommunications</subject><subject>Telecommunications and information theory</subject><subject>Transmission and modulation (techniques and equipments)</subject><issn>1089-7798</issn><issn>1558-2558</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNqNkctu2zAQRYWiAZom_YCiG6JA25WcISW-loXRRwA73rRrgqJGNhOKckUrQD6g_x3aCrLoosiGz3PvzOAWxXsKC0pBX62Wm_V6wQDUAhQFrl4V55RzVbK8vM5nULqUUqs3xduUbiGDjNPz4u8K7zEQNw4p-bgloz0gsbEl9h5Hu0XS2RZJO-V3P0QydOSwy_dhagKSG3tnt7b3ZZ91sR16sh8HhynNDvt98G7W-UjW1-sNucOH3RBOrsdqbmdjxJAui7POhoTvnvaL4vf3b7-WP8vV5sf18uuqdJyJQ6lqAdQC5bXUIIVwAhpd0wa7PCpDpit0HUKnUbmKSqW4rWRDoWlsy2TdVhfFl9k39_lnwnQwvU8OQ7ARhykZJTkISrl6Ecl5pSCTn_9LVnWtczNVBj_-A94O0xjzvEYJJiWV9bEunaFTIiN2Zj_63o4PhoI5Jm1OSZtj0mZOOms-PRnb5GzochbOp2chA8UFEyJzH2bOI-Lzd50La0WrR3VRsQ0</recordid><startdate>20081101</startdate><enddate>20081101</enddate><creator>Zlatanov, N.</creator><creator>Hadzi-Velkov, Z.</creator><creator>Karagiannidis, G.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20081101</creationdate><title>Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels</title><author>Zlatanov, N. ; Hadzi-Velkov, Z. ; Karagiannidis, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c526t-84601a0154790766c60b941bef1552e293ecfe0f9e8c317885a37b10bbad274d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Approximation</topic><topic>average fade duration (AFD)</topic><topic>Block codes</topic><topic>cascaded fading</topic><topic>Channels</topic><topic>Coding, codes</topic><topic>Computer simulation</topic><topic>Exact sciences and technology</topic><topic>Fading</topic><topic>Information, signal and communications theory</topic><topic>keyhole MIMO fading channels</topic><topic>Keyholes</topic><topic>Level crossing rate (LCR)</topic><topic>Level crossings</topic><topic>Mathematical analysis</topic><topic>MIMO</topic><topic>multiplicative fading</topic><topic>Nakagami distribution</topic><topic>Nakagami-m fading</topic><topic>Random processes</topic><topic>Rayleigh channels</topic><topic>Scattering</topic><topic>Signal and communications theory</topic><topic>Statistics</topic><topic>Systems, networks and services of telecommunications</topic><topic>Telecommunications</topic><topic>Telecommunications and information theory</topic><topic>Transmission and modulation (techniques and equipments)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zlatanov, N.</creatorcontrib><creatorcontrib>Hadzi-Velkov, Z.</creatorcontrib><creatorcontrib>Karagiannidis, G.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE communications letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zlatanov, N.</au><au>Hadzi-Velkov, Z.</au><au>Karagiannidis, G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels</atitle><jtitle>IEEE communications letters</jtitle><stitle>COML</stitle><date>2008-11-01</date><risdate>2008</risdate><volume>12</volume><issue>11</issue><spage>822</spage><epage>824</epage><pages>822-824</pages><issn>1089-7798</issn><eissn>1558-2558</eissn><coden>ICLEF6</coden><abstract>We present novel exact expressions and accurate closed-form approximations for the level crossing rate (LCR) and the average fade duration (AFD) of the double Nakagami-m random process. These results are used to study the second order statistics of multiple input multiple output (MIMO) keyhole fading channels with space-time block coding. Numerical and computer simulation examples validate the accuracy of the presented mathematical analysis and show the tightness of the proposed approximations.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/LCOMM.2008.081058</doi><tpages>3</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1089-7798 |
ispartof | IEEE communications letters, 2008-11, Vol.12 (11), p.822-824 |
issn | 1089-7798 1558-2558 |
language | eng |
recordid | cdi_proquest_miscellaneous_34493173 |
source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Approximation average fade duration (AFD) Block codes cascaded fading Channels Coding, codes Computer simulation Exact sciences and technology Fading Information, signal and communications theory keyhole MIMO fading channels Keyholes Level crossing rate (LCR) Level crossings Mathematical analysis MIMO multiplicative fading Nakagami distribution Nakagami-m fading Random processes Rayleigh channels Scattering Signal and communications theory Statistics Systems, networks and services of telecommunications Telecommunications Telecommunications and information theory Transmission and modulation (techniques and equipments) |
title | Level crossing rate and average fade duration of the double Nakagami-m random process and application in MIMO keyhole fading channels |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T12%3A27%3A55IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Level%20crossing%20rate%20and%20average%20fade%20duration%20of%20the%20double%20Nakagami-m%20random%20process%20and%20application%20in%20MIMO%20keyhole%20fading%20channels&rft.jtitle=IEEE%20communications%20letters&rft.au=Zlatanov,%20N.&rft.date=2008-11-01&rft.volume=12&rft.issue=11&rft.spage=822&rft.epage=824&rft.pages=822-824&rft.issn=1089-7798&rft.eissn=1558-2558&rft.coden=ICLEF6&rft_id=info:doi/10.1109/LCOMM.2008.081058&rft_dat=%3Cproquest_RIE%3E875055380%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=862771748&rft_id=info:pmid/&rft_ieee_id=4717981&rfr_iscdi=true |