Robust kernel distance multivariate control chart using support vector principles

It is important to monitor manufacturing processes in order to improve product quality and reduce production cost. Statistical Process Control (SPC) is the most commonly used method for process monitoring, in particular making distinctions between variations attributed to normal process variability...

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Veröffentlicht in:	International journal of production research 2008-09, Vol.46 (18), p.5075-5095
Hauptverfasser:	Camci, F., Chinnam, R. B., Ellis, R. D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Artificial intelligence Benchmarks Computer science control theory systems Control chart Control charts Control theory. Systems Exact sciences and technology Industrial metrology. Testing Kernel distance Learning and adaptive systems Manufacturing Mechanical engineering. Machine design Modelling and identification Process control. Computer integrated manufacturing Process controls Statistical process control Studies Support vector machines
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