12 GHz [F_{rm MAX}] @@iGaN/AlN/AlGaN@ Nanowire MISFET
GaN/AlN/AlGaN/GaN nanowire metal-insulator-semiconductor field-effect transistors (MISFETs) have been fabricated for the first time with submicrometer gate lengths. Their microwave performances were investigated. An intrinsic current-gain cutoff frequency (@@iF@ @@dT@) of 5 GHz as well as an intrins...
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Veröffentlicht in: | IEEE electron device letters 2009-04, Vol.30 (4), p.322-324 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | GaN/AlN/AlGaN/GaN nanowire metal-insulator-semiconductor field-effect transistors (MISFETs) have been fabricated for the first time with submicrometer gate lengths. Their microwave performances were investigated. An intrinsic current-gain cutoff frequency (@@iF@ @@dT@) of 5 GHz as well as an intrinsic maximum available gain (@@iF@ @@dMAX@) cutoff frequency of 12 GHz have been obtained for the first time and associated with a gate length of 0.5 mum. These results show the great potentiality of GaN-based nanowire FETs for microwave applications. |
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ISSN: | 0741-3106 |
DOI: | 10.1109/LED.2009.2014791 |