Reliability Aspects of Microsystems for Automotive Applications
The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure...
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Veröffentlicht in: | Advanced engineering materials 2009-04, Vol.11 (4), p.316-323 |
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creator | Müller-Fiedler, Roland Nötzold, Kerstin Schneider, Arnold Rank, Holger Graf, Jürgen |
description | The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices.
The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper. |
doi_str_mv | 10.1002/adem.200800290 |
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The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</description><identifier>ISSN: 1438-1656</identifier><identifier>EISSN: 1527-2648</identifier><identifier>DOI: 10.1002/adem.200800290</identifier><language>eng</language><publisher>Weinheim: WILEY-VCH Verlag</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Integrated circuits ; MEMS ; Micro- and nanoelectromechanical devices (mems/nems) ; Microsystems ; Reliability ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Advanced engineering materials, 2009-04, Vol.11 (4), p.316-323</ispartof><rights>Copyright © 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><rights>2009 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</citedby><cites>FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadem.200800290$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadem.200800290$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27922,27923,45572,45573</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21365812$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Müller-Fiedler, Roland</creatorcontrib><creatorcontrib>Nötzold, Kerstin</creatorcontrib><creatorcontrib>Schneider, Arnold</creatorcontrib><creatorcontrib>Rank, Holger</creatorcontrib><creatorcontrib>Graf, Jürgen</creatorcontrib><title>Reliability Aspects of Microsystems for Automotive Applications</title><title>Advanced engineering materials</title><addtitle>Adv. Eng. Mater</addtitle><description>The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices.
The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</description><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>MEMS</subject><subject>Micro- and nanoelectromechanical devices (mems/nems)</subject><subject>Microsystems</subject><subject>Reliability</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>1438-1656</issn><issn>1527-2648</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqFkL1PwzAQxSMEEqWwMmeBLeX8EceZUFRKAbUgUBGj5aS2ZEjqYKdA_nsSparYmO5Oeu_d3S8IzhFMEAC-kmtVTTAA74YUDoIRinESYUb5YddTwiPEYnYcnHj_DoAQIDIKrl9UaWRuStO0YeZrVTQ-tDpcmsJZ3_pGVT7U1oXZtrGVbcyXCrO6Lk0hG2M3_jQ40rL06mxXx8Hr7Ww1vYsWT_P7abaICoo5RJpLLhGkiBGsSUqZTGSsEGEaawmoSEgCWMNa5RylOScY5UB0kmpK1jTHmIyDyyG3dvZzq3wjKuMLVZZyo-zWC0IJZQyjTjgZhP393iktamcq6VqBQPScRM9J7Dl1hotdsvSFLLWTm8L4vauLZDFH_QXpoPs2pWr_SRXZzWz5d0c0eE0H9Gfvle5DsO71WLw9zsVzHEOaPqwEJr-WDIdh</recordid><startdate>200904</startdate><enddate>200904</enddate><creator>Müller-Fiedler, Roland</creator><creator>Nötzold, Kerstin</creator><creator>Schneider, Arnold</creator><creator>Rank, Holger</creator><creator>Graf, Jürgen</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>200904</creationdate><title>Reliability Aspects of Microsystems for Automotive Applications</title><author>Müller-Fiedler, Roland ; Nötzold, Kerstin ; Schneider, Arnold ; Rank, Holger ; Graf, Jürgen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>MEMS</topic><topic>Micro- and nanoelectromechanical devices (mems/nems)</topic><topic>Microsystems</topic><topic>Reliability</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Müller-Fiedler, Roland</creatorcontrib><creatorcontrib>Nötzold, Kerstin</creatorcontrib><creatorcontrib>Schneider, Arnold</creatorcontrib><creatorcontrib>Rank, Holger</creatorcontrib><creatorcontrib>Graf, Jürgen</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Advanced engineering materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Müller-Fiedler, Roland</au><au>Nötzold, Kerstin</au><au>Schneider, Arnold</au><au>Rank, Holger</au><au>Graf, Jürgen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability Aspects of Microsystems for Automotive Applications</atitle><jtitle>Advanced engineering materials</jtitle><addtitle>Adv. Eng. Mater</addtitle><date>2009-04</date><risdate>2009</risdate><volume>11</volume><issue>4</issue><spage>316</spage><epage>323</epage><pages>316-323</pages><issn>1438-1656</issn><eissn>1527-2648</eissn><abstract>The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices.
The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</abstract><cop>Weinheim</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/adem.200800290</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Applied sciences Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuits MEMS Micro- and nanoelectromechanical devices (mems/nems) Microsystems Reliability Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Reliability Aspects of Microsystems for Automotive Applications |
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