Reliability Aspects of Microsystems for Automotive Applications

The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure...

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Veröffentlicht in:Advanced engineering materials 2009-04, Vol.11 (4), p.316-323
Hauptverfasser: Müller-Fiedler, Roland, Nötzold, Kerstin, Schneider, Arnold, Rank, Holger, Graf, Jürgen
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container_end_page 323
container_issue 4
container_start_page 316
container_title Advanced engineering materials
container_volume 11
creator Müller-Fiedler, Roland
Nötzold, Kerstin
Schneider, Arnold
Rank, Holger
Graf, Jürgen
description The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices. The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.
doi_str_mv 10.1002/adem.200800290
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_34346621</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>34346621</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</originalsourceid><addsrcrecordid>eNqFkL1PwzAQxSMEEqWwMmeBLeX8EceZUFRKAbUgUBGj5aS2ZEjqYKdA_nsSparYmO5Oeu_d3S8IzhFMEAC-kmtVTTAA74YUDoIRinESYUb5YddTwiPEYnYcnHj_DoAQIDIKrl9UaWRuStO0YeZrVTQ-tDpcmsJZ3_pGVT7U1oXZtrGVbcyXCrO6Lk0hG2M3_jQ40rL06mxXx8Hr7Ww1vYsWT_P7abaICoo5RJpLLhGkiBGsSUqZTGSsEGEaawmoSEgCWMNa5RylOScY5UB0kmpK1jTHmIyDyyG3dvZzq3wjKuMLVZZyo-zWC0IJZQyjTjgZhP393iktamcq6VqBQPScRM9J7Dl1hotdsvSFLLWTm8L4vauLZDFH_QXpoPs2pWr_SRXZzWz5d0c0eE0H9Gfvle5DsO71WLw9zsVzHEOaPqwEJr-WDIdh</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>34346621</pqid></control><display><type>article</type><title>Reliability Aspects of Microsystems for Automotive Applications</title><source>Wiley Online Library All Journals</source><creator>Müller-Fiedler, Roland ; Nötzold, Kerstin ; Schneider, Arnold ; Rank, Holger ; Graf, Jürgen</creator><creatorcontrib>Müller-Fiedler, Roland ; Nötzold, Kerstin ; Schneider, Arnold ; Rank, Holger ; Graf, Jürgen</creatorcontrib><description>The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices. The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</description><identifier>ISSN: 1438-1656</identifier><identifier>EISSN: 1527-2648</identifier><identifier>DOI: 10.1002/adem.200800290</identifier><language>eng</language><publisher>Weinheim: WILEY-VCH Verlag</publisher><subject>Applied sciences ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Integrated circuits ; MEMS ; Micro- and nanoelectromechanical devices (mems/nems) ; Microsystems ; Reliability ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Advanced engineering materials, 2009-04, Vol.11 (4), p.316-323</ispartof><rights>Copyright © 2009 WILEY‐VCH Verlag GmbH &amp; Co. KGaA, Weinheim</rights><rights>2009 INIST-CNRS</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</citedby><cites>FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1002%2Fadem.200800290$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1002%2Fadem.200800290$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1416,27922,27923,45572,45573</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=21365812$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Müller-Fiedler, Roland</creatorcontrib><creatorcontrib>Nötzold, Kerstin</creatorcontrib><creatorcontrib>Schneider, Arnold</creatorcontrib><creatorcontrib>Rank, Holger</creatorcontrib><creatorcontrib>Graf, Jürgen</creatorcontrib><title>Reliability Aspects of Microsystems for Automotive Applications</title><title>Advanced engineering materials</title><addtitle>Adv. Eng. Mater</addtitle><description>The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices. The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</description><subject>Applied sciences</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Integrated circuits</subject><subject>MEMS</subject><subject>Micro- and nanoelectromechanical devices (mems/nems)</subject><subject>Microsystems</subject><subject>Reliability</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>1438-1656</issn><issn>1527-2648</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNqFkL1PwzAQxSMEEqWwMmeBLeX8EceZUFRKAbUgUBGj5aS2ZEjqYKdA_nsSparYmO5Oeu_d3S8IzhFMEAC-kmtVTTAA74YUDoIRinESYUb5YddTwiPEYnYcnHj_DoAQIDIKrl9UaWRuStO0YeZrVTQ-tDpcmsJZ3_pGVT7U1oXZtrGVbcyXCrO6Lk0hG2M3_jQ40rL06mxXx8Hr7Ww1vYsWT_P7abaICoo5RJpLLhGkiBGsSUqZTGSsEGEaawmoSEgCWMNa5RylOScY5UB0kmpK1jTHmIyDyyG3dvZzq3wjKuMLVZZyo-zWC0IJZQyjTjgZhP393iktamcq6VqBQPScRM9J7Dl1hotdsvSFLLWTm8L4vauLZDFH_QXpoPs2pWr_SRXZzWz5d0c0eE0H9Gfvle5DsO71WLw9zsVzHEOaPqwEJr-WDIdh</recordid><startdate>200904</startdate><enddate>200904</enddate><creator>Müller-Fiedler, Roland</creator><creator>Nötzold, Kerstin</creator><creator>Schneider, Arnold</creator><creator>Rank, Holger</creator><creator>Graf, Jürgen</creator><general>WILEY-VCH Verlag</general><general>WILEY‐VCH Verlag</general><general>Wiley-VCH</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>200904</creationdate><title>Reliability Aspects of Microsystems for Automotive Applications</title><author>Müller-Fiedler, Roland ; Nötzold, Kerstin ; Schneider, Arnold ; Rank, Holger ; Graf, Jürgen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4280-f8a8a1091632f3946a7a5e136f2fa01c73702f0deb819b8321b03f79f43d4b223</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Applied sciences</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Integrated circuits</topic><topic>MEMS</topic><topic>Micro- and nanoelectromechanical devices (mems/nems)</topic><topic>Microsystems</topic><topic>Reliability</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Müller-Fiedler, Roland</creatorcontrib><creatorcontrib>Nötzold, Kerstin</creatorcontrib><creatorcontrib>Schneider, Arnold</creatorcontrib><creatorcontrib>Rank, Holger</creatorcontrib><creatorcontrib>Graf, Jürgen</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Advanced engineering materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Müller-Fiedler, Roland</au><au>Nötzold, Kerstin</au><au>Schneider, Arnold</au><au>Rank, Holger</au><au>Graf, Jürgen</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reliability Aspects of Microsystems for Automotive Applications</atitle><jtitle>Advanced engineering materials</jtitle><addtitle>Adv. Eng. Mater</addtitle><date>2009-04</date><risdate>2009</risdate><volume>11</volume><issue>4</issue><spage>316</spage><epage>323</epage><pages>316-323</pages><issn>1438-1656</issn><eissn>1527-2648</eissn><abstract>The implementation of microsystems in automotive applications is certainly one of the driving forces for the success of MEMS as an industrial technology on mass production level. In many cases, automotive systems based on microsensors are critical to safety. Consequently, microsystems have to assure an accurate, reliable, and failsafe operation during the entire lifetime of the vehicle. Since, the car represents a harsh environment for electronic or mechanical systems and components, reliability issues of MEMS have moved more and more into the focus of research and development. In particular, reliability aspects related to packaging and assembly have become a key issue in lifetime investigations. The packaging of microsystems comprises a variety of materials and material combinations, that directly affect the stability of MEMS components. Therefore, sophisticated characterization methods are needed to extract the reliability‐relevant material parameters. This paper gives an introduction into investigations of the stability assessment of glass frit bonding as well as new bonding technologies based on metallic sealing of MEMS devices. The reliability of hermetically encapsulated microsensors is a prerequisite in safety‐relevant applications for the automotive market and for consumer applications. The hermeticity and protection of the sensor structure against environmental influences are provided by a cap that is bonded to the substrate utilizing glass frit or metallic bonding technologies. The mechanical strength of these two types of bonding layers is discussed in the paper.</abstract><cop>Weinheim</cop><pub>WILEY-VCH Verlag</pub><doi>10.1002/adem.200800290</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record>
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subjects Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
MEMS
Micro- and nanoelectromechanical devices (mems/nems)
Microsystems
Reliability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Reliability Aspects of Microsystems for Automotive Applications
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T23%3A40%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reliability%20Aspects%20of%20Microsystems%20for%20Automotive%20Applications&rft.jtitle=Advanced%20engineering%20materials&rft.au=M%C3%BCller-Fiedler,%20Roland&rft.date=2009-04&rft.volume=11&rft.issue=4&rft.spage=316&rft.epage=323&rft.pages=316-323&rft.issn=1438-1656&rft.eissn=1527-2648&rft_id=info:doi/10.1002/adem.200800290&rft_dat=%3Cproquest_cross%3E34346621%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=34346621&rft_id=info:pmid/&rfr_iscdi=true