Development of fuel-model interfaces: Investigations by XPS, TEM, SEM and AFM

The presented work aims to reproducibly prepare UO 2–Pd thin film model systems for spent nuclear fuel in order to further investigate surface reactions of these films under relevant redox conditions. The sputter co-deposition of U and Pd (fission product) in the presence of O 2 results in the homog...

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Veröffentlicht in:Journal of nuclear materials 2009-03, Vol.385 (1), p.208-211
Hauptverfasser: Stumpf, S., Seibert, A., Gouder, T., Huber, F., Wiss, T., Römer, J.
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container_end_page 211
container_issue 1
container_start_page 208
container_title Journal of nuclear materials
container_volume 385
creator Stumpf, S.
Seibert, A.
Gouder, T.
Huber, F.
Wiss, T.
Römer, J.
description The presented work aims to reproducibly prepare UO 2–Pd thin film model systems for spent nuclear fuel in order to further investigate surface reactions of these films under relevant redox conditions. The sputter co-deposition of U and Pd (fission product) in the presence of O 2 results in the homogenous distribution of Pd in a crystalline UO 2 matrix. Heating the films causes the diffusion of film components. Hereby, the formation of ε-particles has to be clarified. First electrochemical studies show the influence of the nobel metal Pd on the redox behaviour of UO 2. With increasing Pd concentration the matrix dissolution is decreased. However, we could demonstrate that blocked oxidation processes are of temporary nature. The passivation of the Pd reactive sites with increasing number of cycles finally induces the approximation of the mixed system to the redox behaviour of the pure UO 2 system.
doi_str_mv 10.1016/j.jnucmat.2008.08.061
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subjects Applied sciences
Controled nuclear fusion plants
Energy
Energy. Thermal use of fuels
Exact sciences and technology
Fission nuclear power plants
Fuels
Installations for energy generation and conversion: thermal and electrical energy
Nuclear fuels
Preparation and processing of nuclear fuels
title Development of fuel-model interfaces: Investigations by XPS, TEM, SEM and AFM
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