Transformation behavior of Ni-Mn-Ga/Si(100) thin film composites with different film thicknesses

. A series of Ni 51.4 Mn 28.3 Ga 20.3 /Si(100) thin film composites with different film thicknesses varying from 0.1 to 5 μm have been prepared by magnetron sputtering and subsequently annealed. X-ray powder diffraction patterns of the films show the features associated with the lattice-modulated ma...

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Veröffentlicht in:	The European physical journal. ST, Special topics Special topics, 2008-05, Vol.158 (1), p.179-185
Hauptverfasser:	Besseghini, S., Gambardella, A., Chernenko, V. A., Hagler, M., Pohl, C., Müllner, P., Ohtsuka, M., Doyle, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic Classical and Continuum Physics Condensed Matter Physics Materials Science Measurement Science and Instrumentation Molecular Optical and Plasma Physics Physics Physics and Astronomy
Online-Zugang:	Volltext
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