Preparation of cobalt oxide thin films and its use in supercapacitor application
Present work explored a room temperature, simple and low cost chemical route for the cobalt oxide film onto copper substrate from cobalt chloride (CoCl 2·6H 2O) precursor and characterization for its structural and electrochemical properties for supercapacitor application. The morphology and crystal...
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Veröffentlicht in: | Applied surface science 2008-06, Vol.254 (17), p.5540-5544 |
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creator | Kandalkar, S.G. Gunjakar, J.L. Lokhande, C.D. |
description | Present work explored a room temperature, simple and low cost chemical route for the cobalt oxide film onto copper substrate from cobalt chloride (CoCl
2·6H
2O) precursor and characterization for its structural and electrochemical properties for supercapacitor application. The morphology and crystal structure of the film were investigated by scanning electron microscopy and X-ray diffraction techniques, respectively. The electrochemical supercapacitive properties of cobalt oxide film were evaluated using cyclic voltammetry and galvanostatic charge–discharge methods. The film showed maximum specific capacitance of (165
F/g) in 1.0
M aqueous KOH electrolyte at scan rate 10
mV/s. |
doi_str_mv | 10.1016/j.apsusc.2008.02.163 |
format | Article |
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2·6H
2O) precursor and characterization for its structural and electrochemical properties for supercapacitor application. The morphology and crystal structure of the film were investigated by scanning electron microscopy and X-ray diffraction techniques, respectively. The electrochemical supercapacitive properties of cobalt oxide film were evaluated using cyclic voltammetry and galvanostatic charge–discharge methods. The film showed maximum specific capacitance of (165
F/g) in 1.0
M aqueous KOH electrolyte at scan rate 10
mV/s.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2008.02.163</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Charge–discharge ; Chemistry ; Cobalt oxide ; Condensed matter: structure, mechanical and thermal properties ; Cyclic voltammetry ; Electrochemistry ; Electrodes: preparations and properties ; Exact sciences and technology ; General and physical chemistry ; Physics ; Single-crystal and powder diffraction ; Structure and morphology; thickness ; Structure of solids and liquids; crystallography ; Supercapacitor ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Thin films ; X-ray diffraction and scattering</subject><ispartof>Applied surface science, 2008-06, Vol.254 (17), p.5540-5544</ispartof><rights>2008 Elsevier B.V.</rights><rights>2008 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c433t-29479cd18b61f94ed1fad0ccfde759a31064b166f85a1fa3556e39a14bcd71843</citedby><cites>FETCH-LOGICAL-c433t-29479cd18b61f94ed1fad0ccfde759a31064b166f85a1fa3556e39a14bcd71843</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2008.02.163$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20429656$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kandalkar, S.G.</creatorcontrib><creatorcontrib>Gunjakar, J.L.</creatorcontrib><creatorcontrib>Lokhande, C.D.</creatorcontrib><title>Preparation of cobalt oxide thin films and its use in supercapacitor application</title><title>Applied surface science</title><description>Present work explored a room temperature, simple and low cost chemical route for the cobalt oxide film onto copper substrate from cobalt chloride (CoCl
2·6H
2O) precursor and characterization for its structural and electrochemical properties for supercapacitor application. The morphology and crystal structure of the film were investigated by scanning electron microscopy and X-ray diffraction techniques, respectively. The electrochemical supercapacitive properties of cobalt oxide film were evaluated using cyclic voltammetry and galvanostatic charge–discharge methods. The film showed maximum specific capacitance of (165
F/g) in 1.0
M aqueous KOH electrolyte at scan rate 10
mV/s.</description><subject>Charge–discharge</subject><subject>Chemistry</subject><subject>Cobalt oxide</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Cyclic voltammetry</subject><subject>Electrochemistry</subject><subject>Electrodes: preparations and properties</subject><subject>Exact sciences and technology</subject><subject>General and physical chemistry</subject><subject>Physics</subject><subject>Single-crystal and powder diffraction</subject><subject>Structure and morphology; thickness</subject><subject>Structure of solids and liquids; crystallography</subject><subject>Supercapacitor</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><subject>Thin films</subject><subject>X-ray diffraction and scattering</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp9kE9P3DAQxS1UpG6h36AHX8otwY4db3ypVKH-QUKCA5yt2bEtvMrGqSdB8O1ruqhHTiPN_N6bmcfYFylaKaS53Lcw00rYdkIMrehaadQJ28hhq5q-H_QHtqmYbbRS3Uf2iWgvhOzqdMPu7kqYocCS8sRz5Jh3MC48Pycf-PKYJh7TeCAOk-dpIb5S4LVJ6xwKwgyYllw4zPOY8J_JOTuNMFL4_FbP2MPPH_dXv5ub21_XV99vGqxXLE1n9dail8POyGh18DKCF4jRh21vQUlh9E4aE4ce6kj1vQnKgtQ79Fs5aHXGLo6-c8l_1kCLOyTCMI4whbySU6q3yihbQX0EsWSiEqKbSzpAeXFSuNf43N4d43Ov8TnRuRpflX198wdCGGOBCRP913ZCd9b0pnLfjlyozz6lUBxhChMGn0rAxfmc3l_0F8PDiLI</recordid><startdate>20080630</startdate><enddate>20080630</enddate><creator>Kandalkar, S.G.</creator><creator>Gunjakar, J.L.</creator><creator>Lokhande, C.D.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20080630</creationdate><title>Preparation of cobalt oxide thin films and its use in supercapacitor application</title><author>Kandalkar, S.G. ; Gunjakar, J.L. ; Lokhande, C.D.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c433t-29479cd18b61f94ed1fad0ccfde759a31064b166f85a1fa3556e39a14bcd71843</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Charge–discharge</topic><topic>Chemistry</topic><topic>Cobalt oxide</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Cyclic voltammetry</topic><topic>Electrochemistry</topic><topic>Electrodes: preparations and properties</topic><topic>Exact sciences and technology</topic><topic>General and physical chemistry</topic><topic>Physics</topic><topic>Single-crystal and powder diffraction</topic><topic>Structure and morphology; thickness</topic><topic>Structure of solids and liquids; crystallography</topic><topic>Supercapacitor</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><topic>Thin films</topic><topic>X-ray diffraction and scattering</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kandalkar, S.G.</creatorcontrib><creatorcontrib>Gunjakar, J.L.</creatorcontrib><creatorcontrib>Lokhande, C.D.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kandalkar, S.G.</au><au>Gunjakar, J.L.</au><au>Lokhande, C.D.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Preparation of cobalt oxide thin films and its use in supercapacitor application</atitle><jtitle>Applied surface science</jtitle><date>2008-06-30</date><risdate>2008</risdate><volume>254</volume><issue>17</issue><spage>5540</spage><epage>5544</epage><pages>5540-5544</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>Present work explored a room temperature, simple and low cost chemical route for the cobalt oxide film onto copper substrate from cobalt chloride (CoCl
2·6H
2O) precursor and characterization for its structural and electrochemical properties for supercapacitor application. The morphology and crystal structure of the film were investigated by scanning electron microscopy and X-ray diffraction techniques, respectively. The electrochemical supercapacitive properties of cobalt oxide film were evaluated using cyclic voltammetry and galvanostatic charge–discharge methods. The film showed maximum specific capacitance of (165
F/g) in 1.0
M aqueous KOH electrolyte at scan rate 10
mV/s.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2008.02.163</doi><tpages>5</tpages></addata></record> |
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source | Elsevier ScienceDirect Journals Complete |
subjects | Charge–discharge Chemistry Cobalt oxide Condensed matter: structure, mechanical and thermal properties Cyclic voltammetry Electrochemistry Electrodes: preparations and properties Exact sciences and technology General and physical chemistry Physics Single-crystal and powder diffraction Structure and morphology thickness Structure of solids and liquids crystallography Supercapacitor Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Thin films X-ray diffraction and scattering |
title | Preparation of cobalt oxide thin films and its use in supercapacitor application |
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