Roughness of pigment coatings and its influence on gloss
A robust method is used for analyzing roughness at a wide range of lateral length scales. The method is based on two-point correlation where both the amplitude and lateral spacing of surface heights are considered when determining the roughness. Atomic force microcopy and confocal optical microscopy...
Gespeichert in:
Veröffentlicht in: | Applied surface science 2008-07, Vol.254 (18), p.5741-5749 |
---|---|
Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 5749 |
---|---|
container_issue | 18 |
container_start_page | 5741 |
container_title | Applied surface science |
container_volume | 254 |
creator | Järnström, J. Ihalainen, P. Backfolk, K. Peltonen, J. |
description | A robust method is used for analyzing roughness at a wide range of lateral length scales. The method is based on two-point correlation where both the amplitude and lateral spacing of surface heights are considered when determining the roughness. Atomic force microcopy and confocal optical microscopy images were captured for a set of pigment-coated samples. The effects of sampling interval, image size and filtering on surface roughness were studied. Isotropy and periodicity of roughness were determined by analyzing the angular distribution of the correlation length (
T) and the autocorrelation function (ACF). A clear dependence of root mean square (RMS) roughness (
σ) on
T was established for randomly distributed surfaces. By taking into account the
σ–
T dependence it was possible to obtain
σ for various length scales for each sample and thus attaining the most relevant
σ for a certain surface function, which in this study was specular reflection of light (gloss). The roughness analysis showed that a small amount of DPP coating was sufficient to completely cover and change the surface of the substrate, while kaolin coatings gave a different response. |
doi_str_mv | 10.1016/j.apsusc.2008.03.043 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_33584586</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0169433208005990</els_id><sourcerecordid>33584586</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-6f1a5a5b1c1f65c4862e5c64b14b97a6460912cd7c033f62b5eb9424550a75203</originalsourceid><addsrcrecordid>eNp9kE1LxDAQhoMouH78Aw-96K01320vgix-wYIgeg5pmtQs3WTttIL_3pQuHj3NYZ55Z-ZB6IrggmAib7eF3sMEpqAYVwVmBebsCK1IVbJciIofo1XC6pwzRk_RGcAWY0JTd4Wqtzh1n8ECZNFle9_tbBgzE_XoQweZDm3mR8h8cP1kg7FZDFnXR4ALdOJ0D_byUM_Rx-PD-_o537w-vazvN7lhshxz6YgWWjTEECeF4ZWkVhjJG8KbutSSS1wTatrSYMacpI2wTc0pFwLrUlDMztHNkrsf4tdkYVQ7D8b2vQ42TqAYSw-KSiaQL6AZ0nmDdWo_-J0efhTBataktmrRpGZNCjOVNKWx60O-BqN7N-hgPPzN0sRgQef4u4Wz6dlvbwcFxs9GWj9YM6o2-v8X_QI7nH5y</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>33584586</pqid></control><display><type>article</type><title>Roughness of pigment coatings and its influence on gloss</title><source>Access via ScienceDirect (Elsevier)</source><creator>Järnström, J. ; Ihalainen, P. ; Backfolk, K. ; Peltonen, J.</creator><creatorcontrib>Järnström, J. ; Ihalainen, P. ; Backfolk, K. ; Peltonen, J.</creatorcontrib><description>A robust method is used for analyzing roughness at a wide range of lateral length scales. The method is based on two-point correlation where both the amplitude and lateral spacing of surface heights are considered when determining the roughness. Atomic force microcopy and confocal optical microscopy images were captured for a set of pigment-coated samples. The effects of sampling interval, image size and filtering on surface roughness were studied. Isotropy and periodicity of roughness were determined by analyzing the angular distribution of the correlation length (
T) and the autocorrelation function (ACF). A clear dependence of root mean square (RMS) roughness (
σ) on
T was established for randomly distributed surfaces. By taking into account the
σ–
T dependence it was possible to obtain
σ for various length scales for each sample and thus attaining the most relevant
σ for a certain surface function, which in this study was specular reflection of light (gloss). The roughness analysis showed that a small amount of DPP coating was sufficient to completely cover and change the surface of the substrate, while kaolin coatings gave a different response.</description><identifier>ISSN: 0169-4332</identifier><identifier>EISSN: 1873-5584</identifier><identifier>DOI: 10.1016/j.apsusc.2008.03.043</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Atomic force microscopy ; Autocorrelation function ; Condensed matter: structure, mechanical and thermal properties ; Confocal optical microscopy ; Correlation length ; Exact sciences and technology ; Gloss ; Physics ; Pigment coating ; Structure and morphology; thickness ; Surface roughness ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Topography</subject><ispartof>Applied surface science, 2008-07, Vol.254 (18), p.5741-5749</ispartof><rights>2008 Elsevier B.V.</rights><rights>2008 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-6f1a5a5b1c1f65c4862e5c64b14b97a6460912cd7c033f62b5eb9424550a75203</citedby><cites>FETCH-LOGICAL-c367t-6f1a5a5b1c1f65c4862e5c64b14b97a6460912cd7c033f62b5eb9424550a75203</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.apsusc.2008.03.043$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=20430526$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Järnström, J.</creatorcontrib><creatorcontrib>Ihalainen, P.</creatorcontrib><creatorcontrib>Backfolk, K.</creatorcontrib><creatorcontrib>Peltonen, J.</creatorcontrib><title>Roughness of pigment coatings and its influence on gloss</title><title>Applied surface science</title><description>A robust method is used for analyzing roughness at a wide range of lateral length scales. The method is based on two-point correlation where both the amplitude and lateral spacing of surface heights are considered when determining the roughness. Atomic force microcopy and confocal optical microscopy images were captured for a set of pigment-coated samples. The effects of sampling interval, image size and filtering on surface roughness were studied. Isotropy and periodicity of roughness were determined by analyzing the angular distribution of the correlation length (
T) and the autocorrelation function (ACF). A clear dependence of root mean square (RMS) roughness (
σ) on
T was established for randomly distributed surfaces. By taking into account the
σ–
T dependence it was possible to obtain
σ for various length scales for each sample and thus attaining the most relevant
σ for a certain surface function, which in this study was specular reflection of light (gloss). The roughness analysis showed that a small amount of DPP coating was sufficient to completely cover and change the surface of the substrate, while kaolin coatings gave a different response.</description><subject>Atomic force microscopy</subject><subject>Autocorrelation function</subject><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>Confocal optical microscopy</subject><subject>Correlation length</subject><subject>Exact sciences and technology</subject><subject>Gloss</subject><subject>Physics</subject><subject>Pigment coating</subject><subject>Structure and morphology; thickness</subject><subject>Surface roughness</subject><subject>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</subject><subject>Thin film structure and morphology</subject><subject>Topography</subject><issn>0169-4332</issn><issn>1873-5584</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LxDAQhoMouH78Aw-96K01320vgix-wYIgeg5pmtQs3WTttIL_3pQuHj3NYZ55Z-ZB6IrggmAib7eF3sMEpqAYVwVmBebsCK1IVbJciIofo1XC6pwzRk_RGcAWY0JTd4Wqtzh1n8ECZNFle9_tbBgzE_XoQweZDm3mR8h8cP1kg7FZDFnXR4ALdOJ0D_byUM_Rx-PD-_o537w-vazvN7lhshxz6YgWWjTEECeF4ZWkVhjJG8KbutSSS1wTatrSYMacpI2wTc0pFwLrUlDMztHNkrsf4tdkYVQ7D8b2vQ42TqAYSw-KSiaQL6AZ0nmDdWo_-J0efhTBataktmrRpGZNCjOVNKWx60O-BqN7N-hgPPzN0sRgQef4u4Wz6dlvbwcFxs9GWj9YM6o2-v8X_QI7nH5y</recordid><startdate>20080715</startdate><enddate>20080715</enddate><creator>Järnström, J.</creator><creator>Ihalainen, P.</creator><creator>Backfolk, K.</creator><creator>Peltonen, J.</creator><general>Elsevier B.V</general><general>Elsevier Science</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SE</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20080715</creationdate><title>Roughness of pigment coatings and its influence on gloss</title><author>Järnström, J. ; Ihalainen, P. ; Backfolk, K. ; Peltonen, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-6f1a5a5b1c1f65c4862e5c64b14b97a6460912cd7c033f62b5eb9424550a75203</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Atomic force microscopy</topic><topic>Autocorrelation function</topic><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>Confocal optical microscopy</topic><topic>Correlation length</topic><topic>Exact sciences and technology</topic><topic>Gloss</topic><topic>Physics</topic><topic>Pigment coating</topic><topic>Structure and morphology; thickness</topic><topic>Surface roughness</topic><topic>Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)</topic><topic>Thin film structure and morphology</topic><topic>Topography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Järnström, J.</creatorcontrib><creatorcontrib>Ihalainen, P.</creatorcontrib><creatorcontrib>Backfolk, K.</creatorcontrib><creatorcontrib>Peltonen, J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Corrosion Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied surface science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Järnström, J.</au><au>Ihalainen, P.</au><au>Backfolk, K.</au><au>Peltonen, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Roughness of pigment coatings and its influence on gloss</atitle><jtitle>Applied surface science</jtitle><date>2008-07-15</date><risdate>2008</risdate><volume>254</volume><issue>18</issue><spage>5741</spage><epage>5749</epage><pages>5741-5749</pages><issn>0169-4332</issn><eissn>1873-5584</eissn><abstract>A robust method is used for analyzing roughness at a wide range of lateral length scales. The method is based on two-point correlation where both the amplitude and lateral spacing of surface heights are considered when determining the roughness. Atomic force microcopy and confocal optical microscopy images were captured for a set of pigment-coated samples. The effects of sampling interval, image size and filtering on surface roughness were studied. Isotropy and periodicity of roughness were determined by analyzing the angular distribution of the correlation length (
T) and the autocorrelation function (ACF). A clear dependence of root mean square (RMS) roughness (
σ) on
T was established for randomly distributed surfaces. By taking into account the
σ–
T dependence it was possible to obtain
σ for various length scales for each sample and thus attaining the most relevant
σ for a certain surface function, which in this study was specular reflection of light (gloss). The roughness analysis showed that a small amount of DPP coating was sufficient to completely cover and change the surface of the substrate, while kaolin coatings gave a different response.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.apsusc.2008.03.043</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0169-4332 |
ispartof | Applied surface science, 2008-07, Vol.254 (18), p.5741-5749 |
issn | 0169-4332 1873-5584 |
language | eng |
recordid | cdi_proquest_miscellaneous_33584586 |
source | Access via ScienceDirect (Elsevier) |
subjects | Atomic force microscopy Autocorrelation function Condensed matter: structure, mechanical and thermal properties Confocal optical microscopy Correlation length Exact sciences and technology Gloss Physics Pigment coating Structure and morphology thickness Surface roughness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology Topography |
title | Roughness of pigment coatings and its influence on gloss |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T23%3A49%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Roughness%20of%20pigment%20coatings%20and%20its%20influence%20on%20gloss&rft.jtitle=Applied%20surface%20science&rft.au=J%C3%A4rnstr%C3%B6m,%20J.&rft.date=2008-07-15&rft.volume=254&rft.issue=18&rft.spage=5741&rft.epage=5749&rft.pages=5741-5749&rft.issn=0169-4332&rft.eissn=1873-5584&rft_id=info:doi/10.1016/j.apsusc.2008.03.043&rft_dat=%3Cproquest_cross%3E33584586%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=33584586&rft_id=info:pmid/&rft_els_id=S0169433208005990&rfr_iscdi=true |