Structure Characterization of F-doped Silica Glass
Pure and fluorine-doped silica glass were fabricated by plasma chemical vapour deposition （PCVD） and characterized using Raman and infrared spectrum. The change in Raman intensity of 945 cm-1 peak, relating to ≡Si-F stretching vibration, agrees with the change of F content. Compared with measured wa...
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| Veröffentlicht in: | Journal of Wuhan University of Technology. Materials science edition 2009-02, Vol.24 (1), p.137-139 |
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| container_title | Journal of Wuhan University of Technology. Materials science edition |
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| creator | Xie, Junlin Deng, Tao Tu, Feng Luo, Jie Han, Qingrong |
| description | Pure and fluorine-doped silica glass were fabricated by plasma chemical vapour deposition （PCVD） and characterized using Raman and infrared spectrum. The change in Raman intensity of 945 cm-1 peak, relating to ≡Si-F stretching vibration, agrees with the change of F content. Compared with measured wavenumber in IR spectrum, the calculated absorption wavelength confirms the incorporation form of F into the glass, the detail of which is a tetrahedron with a Si atom in the center coupled with one F atom and three network O atoms. Such structure identification may be useful for explaining some properties of F-doping silica glass. |
| doi_str_mv | 10.1007/s11595-009-1137-1 |
| format | Article |
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| source | Springer Nature - Complete Springer Journals; Alma/SFX Local Collection |
| subjects | Atoms & subatomic particles Chemistry and Materials Science Glass Materials Science PCVD法 伸缩振动 拉曼光谱 氟掺杂 石英玻璃 等离子体化学气相沉积 红外光谱 结构表征 |
| title | Structure Characterization of F-doped Silica Glass |
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