Assessment of Beam Damage in Polymers Caused by in situ ESEM Analysis using IR Spectroscopy

The environmental scanning electron microscope (ESEM) enables in situ analyses of non-conducting samples such as polymers, thus allowing microscopic phenomena to be correlated to macroscopic measurement data. Unfortunately, irradiation of polymers with electrons always causes beam damage1 and it is...

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Veröffentlicht in:	Macromolecular symposia 2008-05, Vol.265 (1), p.156-165
Hauptverfasser:	Zankel, Armin, Chernev, Boril, Brandl, Christian, Poelt, Peter, Wilhelm, Peter, Nase, Michael, Langer, Beate, Grellmann, Wolfgang, Baumann, Hans Joachim
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Assessments Beams (radiation) Damage electron beam irradiation ESEM Exact sciences and technology FT-IR Infrared spectroscopy Irradiation Mechanical properties Organic polymers PE/PB-1 blends peel test Physicochemistry of polymers Polymers Properties and characterization Scanning electron microscopy Tensile tests
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