Use of thin collodion films to prevent recoil-ion contamination of alpha-spectrometry detectors

Recoil ions from alpha-particle emission can contaminate surface-barrier detection systems. This contamination results in increased measurement uncertainty, and may require the replacement of expensive detectors. Disposable thin Collodion films are easily prepared and effectively retard the recoil i...

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Veröffentlicht in:	Journal of radioanalytical and nuclear chemistry 2008-05, Vol.276 (2), p.385-390
Hauptverfasser:	Inn, K. G. W., Hall, E., Woodward, J. T., Stewart, B., Pollanen, R., Selvig, L., Turner, S., Outola, I., Nour, S., Kurosaki, H., LaRosa, J., Schultz, M., Lin, Z., Yu, Z., McMahon, C.
Format:	Artikel
Sprache:	eng
Schlagworte:	Alpha rays Chemistry Chemistry and Materials Science Contamination Detectors Diagnostic Radiology Foils Hadrons Heavy Ions Inorganic Chemistry Nuclear Chemistry Nuclear Physics Particle emission Physical Chemistry QA/AC and Radiological Emergency Response Measurements Recoil ions Structural damage Thin films
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