Structural and dielectric properties of Ba0.80Sr0.20Ti1 − xSnxO3 ceramics
The Ba 0.80 Sr 0.20 Ti 1 − x Sn x O 3 (BSTS) ceramics were prepared by conventional ceramic method. The crystalline structure and morphology were studied by X-ray diffraction and scanning electron microscopy, respectively. The dielectric constant and loss as a function of temperature and external b...
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Veröffentlicht in: | Journal of electroceramics 2008-12, Vol.21 (1-4), p.561-564 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
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Zusammenfassung: | The Ba
0.80
Sr
0.20
Ti
1 −
x
Sn
x
O
3
(BSTS) ceramics were prepared by conventional ceramic method. The crystalline structure and morphology were studied by X-ray diffraction and scanning electron microscopy, respectively. The dielectric constant and loss as a function of temperature and external bias electric field were investigated. Experimental results show that with the increasing of sintering temperature, the peak permittivity increases dramatically and tanδ increases at ferroelectric state while does not change apparently at paraelectric state. With the increasing of the Sn
4+
concentration in the BSTS structure, the Curie temperature decreases. |
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ISSN: | 1385-3449 1573-8663 |
DOI: | 10.1007/s10832-008-9511-5 |