Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints

The effects of multiple reflows on the microstructural variation and joint strength of the flip chip solder joints were investigated. Conventional Sn–37Pb and a representative Pb-free Sn–3.0Ag–0.5Cu were used, and a popular low cost under bump metallurgy (UBM) of immersion Au/electroless Ni–P platin...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of alloys and compounds 2008-06, Vol.458 (1), p.253-260
Hauptverfasser: Kim, Dae-Gon, Kim, Jong-Woong, Ha, Sang-Su, Noh, Bo-In, Koo, Ja-Myeong, Park, Dong-Woon, Ko, Myung-Wan, Jung, Seung-Boo
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 260
container_issue 1
container_start_page 253
container_title Journal of alloys and compounds
container_volume 458
creator Kim, Dae-Gon
Kim, Jong-Woong
Ha, Sang-Su
Noh, Bo-In
Koo, Ja-Myeong
Park, Dong-Woon
Ko, Myung-Wan
Jung, Seung-Boo
description The effects of multiple reflows on the microstructural variation and joint strength of the flip chip solder joints were investigated. Conventional Sn–37Pb and a representative Pb-free Sn–3.0Ag–0.5Cu were used, and a popular low cost under bump metallurgy (UBM) of immersion Au/electroless Ni–P plating was employed. In case of Sn–37Pb, only Ni 3Sn 4 intermetallic compound layer was formed during multiple reflows. In case of Sn–3.0Ag–0.5Cu, (Cu,Ni) 6Sn 5 intermetallic compound layer was observed after a single reflow, while (Ni,Cu) 3Sn 4 layer was additionally settled at the interface between the (Cu,Ni) 6Sn 5 layer and Ni–P UBM. The thicknesses of the intermetallic compound layers increased and coarsened. The shear force of the both joints slightly decreased during the multiple reflows. The decrease of the joint strength was caused by different softening phenomena between the two cases, and that is discussed in the main text.
doi_str_mv 10.1016/j.jallcom.2007.04.042
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_32828462</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0925838807008511</els_id><sourcerecordid>32828462</sourcerecordid><originalsourceid>FETCH-LOGICAL-c436t-d39346a3011e150aae61ee3ef80a094aec76db441efc20382fee0271f148543c3</originalsourceid><addsrcrecordid>eNqFkE1rGzEQhkVpIW7SnxDQpbmtM_rYXe2phJA2gUAvzVmMtaNYi7xypXVL_31kbHoNDDOHed75eBm7FrAWILrbaT1hjC7t1hKgX4OuIT-wlTC9anTXDR_ZCgbZNkYZc8E-lzIBgBiUWLHNg_fkFp48z-Rj-svnw25DufA082VLPMwLZY8uYKwEuiXUBs4jL1vCzMuSaX5dtscBPoY9d9uaSoojZT6lqi5X7JPHWOjLuV6yl-8Pv-4fm-efP57u754bp1W3NKMalO5QgRAkWkCkThAp8gYQBo3k-m7caC3IOwnKSE8EshdeaNNq5dQluznN3ef0-0BlsbtQHMWIM6VDsUoaaXQnK9ieQJdTKfVtu89hh_mfFWCPjtrJnh21R0ct6BpH3dfzAiwOo884u1D-i-tR2pi-rdy3E0f12z-Bsi0u0OxoDLl6bccU3tn0BhM_j7Q</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>32828462</pqid></control><display><type>article</type><title>Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints</title><source>Elsevier ScienceDirect Journals Complete</source><creator>Kim, Dae-Gon ; Kim, Jong-Woong ; Ha, Sang-Su ; Noh, Bo-In ; Koo, Ja-Myeong ; Park, Dong-Woon ; Ko, Myung-Wan ; Jung, Seung-Boo</creator><creatorcontrib>Kim, Dae-Gon ; Kim, Jong-Woong ; Ha, Sang-Su ; Noh, Bo-In ; Koo, Ja-Myeong ; Park, Dong-Woon ; Ko, Myung-Wan ; Jung, Seung-Boo</creatorcontrib><description>The effects of multiple reflows on the microstructural variation and joint strength of the flip chip solder joints were investigated. Conventional Sn–37Pb and a representative Pb-free Sn–3.0Ag–0.5Cu were used, and a popular low cost under bump metallurgy (UBM) of immersion Au/electroless Ni–P plating was employed. In case of Sn–37Pb, only Ni 3Sn 4 intermetallic compound layer was formed during multiple reflows. In case of Sn–3.0Ag–0.5Cu, (Cu,Ni) 6Sn 5 intermetallic compound layer was observed after a single reflow, while (Ni,Cu) 3Sn 4 layer was additionally settled at the interface between the (Cu,Ni) 6Sn 5 layer and Ni–P UBM. The thicknesses of the intermetallic compound layers increased and coarsened. The shear force of the both joints slightly decreased during the multiple reflows. The decrease of the joint strength was caused by different softening phenomena between the two cases, and that is discussed in the main text.</description><identifier>ISSN: 0925-8388</identifier><identifier>EISSN: 1873-4669</identifier><identifier>DOI: 10.1016/j.jallcom.2007.04.042</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Applied sciences ; Brazing. Soldering ; Exact sciences and technology ; Flip chip ; Interfacial reaction ; Joining, thermal cutting: metallurgical aspects ; Metals. Metallurgy ; Shear force ; Sn–3.0Ag–0.5Cu ; Sn–37Pb</subject><ispartof>Journal of alloys and compounds, 2008-06, Vol.458 (1), p.253-260</ispartof><rights>2007 Elsevier B.V.</rights><rights>2008 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c436t-d39346a3011e150aae61ee3ef80a094aec76db441efc20382fee0271f148543c3</citedby><cites>FETCH-LOGICAL-c436t-d39346a3011e150aae61ee3ef80a094aec76db441efc20382fee0271f148543c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jallcom.2007.04.042$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>315,781,785,3551,27928,27929,45999</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=20348875$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Kim, Dae-Gon</creatorcontrib><creatorcontrib>Kim, Jong-Woong</creatorcontrib><creatorcontrib>Ha, Sang-Su</creatorcontrib><creatorcontrib>Noh, Bo-In</creatorcontrib><creatorcontrib>Koo, Ja-Myeong</creatorcontrib><creatorcontrib>Park, Dong-Woon</creatorcontrib><creatorcontrib>Ko, Myung-Wan</creatorcontrib><creatorcontrib>Jung, Seung-Boo</creatorcontrib><title>Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints</title><title>Journal of alloys and compounds</title><description>The effects of multiple reflows on the microstructural variation and joint strength of the flip chip solder joints were investigated. Conventional Sn–37Pb and a representative Pb-free Sn–3.0Ag–0.5Cu were used, and a popular low cost under bump metallurgy (UBM) of immersion Au/electroless Ni–P plating was employed. In case of Sn–37Pb, only Ni 3Sn 4 intermetallic compound layer was formed during multiple reflows. In case of Sn–3.0Ag–0.5Cu, (Cu,Ni) 6Sn 5 intermetallic compound layer was observed after a single reflow, while (Ni,Cu) 3Sn 4 layer was additionally settled at the interface between the (Cu,Ni) 6Sn 5 layer and Ni–P UBM. The thicknesses of the intermetallic compound layers increased and coarsened. The shear force of the both joints slightly decreased during the multiple reflows. The decrease of the joint strength was caused by different softening phenomena between the two cases, and that is discussed in the main text.</description><subject>Applied sciences</subject><subject>Brazing. Soldering</subject><subject>Exact sciences and technology</subject><subject>Flip chip</subject><subject>Interfacial reaction</subject><subject>Joining, thermal cutting: metallurgical aspects</subject><subject>Metals. Metallurgy</subject><subject>Shear force</subject><subject>Sn–3.0Ag–0.5Cu</subject><subject>Sn–37Pb</subject><issn>0925-8388</issn><issn>1873-4669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><recordid>eNqFkE1rGzEQhkVpIW7SnxDQpbmtM_rYXe2phJA2gUAvzVmMtaNYi7xypXVL_31kbHoNDDOHed75eBm7FrAWILrbaT1hjC7t1hKgX4OuIT-wlTC9anTXDR_ZCgbZNkYZc8E-lzIBgBiUWLHNg_fkFp48z-Rj-svnw25DufA082VLPMwLZY8uYKwEuiXUBs4jL1vCzMuSaX5dtscBPoY9d9uaSoojZT6lqi5X7JPHWOjLuV6yl-8Pv-4fm-efP57u754bp1W3NKMalO5QgRAkWkCkThAp8gYQBo3k-m7caC3IOwnKSE8EshdeaNNq5dQluznN3ef0-0BlsbtQHMWIM6VDsUoaaXQnK9ieQJdTKfVtu89hh_mfFWCPjtrJnh21R0ct6BpH3dfzAiwOo884u1D-i-tR2pi-rdy3E0f12z-Bsi0u0OxoDLl6bccU3tn0BhM_j7Q</recordid><startdate>20080630</startdate><enddate>20080630</enddate><creator>Kim, Dae-Gon</creator><creator>Kim, Jong-Woong</creator><creator>Ha, Sang-Su</creator><creator>Noh, Bo-In</creator><creator>Koo, Ja-Myeong</creator><creator>Park, Dong-Woon</creator><creator>Ko, Myung-Wan</creator><creator>Jung, Seung-Boo</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>20080630</creationdate><title>Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints</title><author>Kim, Dae-Gon ; Kim, Jong-Woong ; Ha, Sang-Su ; Noh, Bo-In ; Koo, Ja-Myeong ; Park, Dong-Woon ; Ko, Myung-Wan ; Jung, Seung-Boo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c436t-d39346a3011e150aae61ee3ef80a094aec76db441efc20382fee0271f148543c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Applied sciences</topic><topic>Brazing. Soldering</topic><topic>Exact sciences and technology</topic><topic>Flip chip</topic><topic>Interfacial reaction</topic><topic>Joining, thermal cutting: metallurgical aspects</topic><topic>Metals. Metallurgy</topic><topic>Shear force</topic><topic>Sn–3.0Ag–0.5Cu</topic><topic>Sn–37Pb</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kim, Dae-Gon</creatorcontrib><creatorcontrib>Kim, Jong-Woong</creatorcontrib><creatorcontrib>Ha, Sang-Su</creatorcontrib><creatorcontrib>Noh, Bo-In</creatorcontrib><creatorcontrib>Koo, Ja-Myeong</creatorcontrib><creatorcontrib>Park, Dong-Woon</creatorcontrib><creatorcontrib>Ko, Myung-Wan</creatorcontrib><creatorcontrib>Jung, Seung-Boo</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of alloys and compounds</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kim, Dae-Gon</au><au>Kim, Jong-Woong</au><au>Ha, Sang-Su</au><au>Noh, Bo-In</au><au>Koo, Ja-Myeong</au><au>Park, Dong-Woon</au><au>Ko, Myung-Wan</au><au>Jung, Seung-Boo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints</atitle><jtitle>Journal of alloys and compounds</jtitle><date>2008-06-30</date><risdate>2008</risdate><volume>458</volume><issue>1</issue><spage>253</spage><epage>260</epage><pages>253-260</pages><issn>0925-8388</issn><eissn>1873-4669</eissn><abstract>The effects of multiple reflows on the microstructural variation and joint strength of the flip chip solder joints were investigated. Conventional Sn–37Pb and a representative Pb-free Sn–3.0Ag–0.5Cu were used, and a popular low cost under bump metallurgy (UBM) of immersion Au/electroless Ni–P plating was employed. In case of Sn–37Pb, only Ni 3Sn 4 intermetallic compound layer was formed during multiple reflows. In case of Sn–3.0Ag–0.5Cu, (Cu,Ni) 6Sn 5 intermetallic compound layer was observed after a single reflow, while (Ni,Cu) 3Sn 4 layer was additionally settled at the interface between the (Cu,Ni) 6Sn 5 layer and Ni–P UBM. The thicknesses of the intermetallic compound layers increased and coarsened. The shear force of the both joints slightly decreased during the multiple reflows. The decrease of the joint strength was caused by different softening phenomena between the two cases, and that is discussed in the main text.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jallcom.2007.04.042</doi><tpages>8</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0925-8388
ispartof Journal of alloys and compounds, 2008-06, Vol.458 (1), p.253-260
issn 0925-8388
1873-4669
language eng
recordid cdi_proquest_miscellaneous_32828462
source Elsevier ScienceDirect Journals Complete
subjects Applied sciences
Brazing. Soldering
Exact sciences and technology
Flip chip
Interfacial reaction
Joining, thermal cutting: metallurgical aspects
Metals. Metallurgy
Shear force
Sn–3.0Ag–0.5Cu
Sn–37Pb
title Effect of reflow numbers on the interfacial reaction and shear strength of flip chip solder joints
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T08%3A52%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Effect%20of%20reflow%20numbers%20on%20the%20interfacial%20reaction%20and%20shear%20strength%20of%20flip%20chip%20solder%20joints&rft.jtitle=Journal%20of%20alloys%20and%20compounds&rft.au=Kim,%20Dae-Gon&rft.date=2008-06-30&rft.volume=458&rft.issue=1&rft.spage=253&rft.epage=260&rft.pages=253-260&rft.issn=0925-8388&rft.eissn=1873-4669&rft_id=info:doi/10.1016/j.jallcom.2007.04.042&rft_dat=%3Cproquest_cross%3E32828462%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=32828462&rft_id=info:pmid/&rft_els_id=S0925838807008511&rfr_iscdi=true