Microstructure characterization of titanium-base aluminium alloys by X-ray diffraction using Warren–Averbach and Rietveld method

Present study considers microstructural characterization of titanium-base aluminium (Ti–Al) alloys, which are widely used in the aviation industry due to its excellent combination of strength and ductility. The microstructural parameters like domain size, microstrain within the domain, dislocation d...

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Veröffentlicht in:	Journal of alloys and compounds 2008-04, Vol.453 (1-2), p.131-137
Hauptverfasser:	Ghosh, J., Chattopadhayay, S.K., Meikap, A.K., Chatterjee, S.K.
Format:	Artikel
Sprache:	eng
Schlagworte:	Metals and alloys Microstructure Rietveld method Warren–Averbach X-ray diffraction
Online-Zugang:	Volltext
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