Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides

Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides

Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted r...

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Veröffentlicht in:International journal of electronics and communications 2006-10, Vol.60 (9), p.677-680
Hauptverfasser: Şimşek, Serkan, Işık, Cevdet, Topuz, Ercan, Esen, Bayram
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Sprache:eng
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Complex permittivity measurement
Scattering from dielectric obstacles in rectangular waveguides
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container_end_page 680
container_issue 9
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container_title International journal of electronics and communications
container_volume 60
creator Şimşek, Serkan
Işık, Cevdet
Topuz, Ercan
Esen, Bayram
description Determination of the complex permittivity of materials via transmission/reflection measurement in rectangular waveguides is formulated as an inverse scattering problem. The presented approach is directly applicable to measurements performed with various sample sizes and orientations. The predicted results are compared with measurements and good agreement is obtained.
doi_str_mv 10.1016/j.aeue.2006.02.010
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source ScienceDirect Journals (5 years ago - present)
subjects Complex permittivity measurement
Scattering from dielectric obstacles in rectangular waveguides
title Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides
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