XPS characterization of sensitized n-TiO2 thin films for dye-sensitized solar cell applications

XPS characterization of sensitized n-TiO2 thin films for dye-sensitized solar cell applications

TiO2 thin films, employed in dye-sensitized solar cells, were prepared by the sol-gel method or directly by Degussa P25 oxide and their surfaces were characterized by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The effect of adsorption of the cis-[Ru(dcbH2)2(NCS)2]...

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Veröffentlicht in:Applied surface science 2008-01, Vol.254 (6), p.1874-1879
Hauptverfasser: Patrocínio, Antonio Otávio T., Paniago, Eucler B., Paniago, Roberto M., Iha, Neyde Y. Murakami
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container_issue 6
container_start_page 1874
container_title Applied surface science
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creator Patrocínio, Antonio Otávio T.
Paniago, Eucler B.
Paniago, Roberto M.
Iha, Neyde Y. Murakami
description TiO2 thin films, employed in dye-sensitized solar cells, were prepared by the sol-gel method or directly by Degussa P25 oxide and their surfaces were characterized by X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The effect of adsorption of the cis-[Ru(dcbH2)2(NCS)2] dye, N3, on the surface of films was investigated. From XPS spectra taken before and after argon-ion sputtering procedure, the surface composition of inner and outer layers of sensitized films was obtained and a preferential etching of Ru peak in relation to the Ti and N ones was identified. The photoelectrochemical parameters were also evaluated and rationalized in terms of the morphological characteristics of the films.
doi_str_mv 10.1016/j.apsusc.2007.07.185
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title XPS characterization of sensitized n-TiO2 thin films for dye-sensitized solar cell applications
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