Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering
The performance of a ZnO‐based multilayer varistor (MLV) is affected strongly by the homogeneity of its microstructure. In this study, a homogeneous microstructure of ZnO‐based MLV was attained by using constrained sintering when nonreactive borosilicate glass +90 wt% alumina (Al2O3) was used as a c...
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Veröffentlicht in: | Journal of the American Ceramic Society 2007-10, Vol.90 (10), p.3296-3298 |
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description | The performance of a ZnO‐based multilayer varistor (MLV) is affected strongly by the homogeneity of its microstructure. In this study, a homogeneous microstructure of ZnO‐based MLV was attained by using constrained sintering when nonreactive borosilicate glass +90 wt% alumina (Al2O3) was used as a constraining layer laminated on both sides of the multilayer ZnO‐based MLV. The mean grain size and the distribution of grain size of ZnO‐based MLVs are both reduced because by constrained sintering, an in‐plane tensile stress results from constrained sintering in the x–y plane of a multilayer device, which could modify the densification rate of the dielectric materials. |
doi_str_mv | 10.1111/j.1551-2916.2007.01854.x |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_31914076</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>31914076</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4744-c723fbb7ce4a847b6f1daec08e509616cf099c68a37859ff0c22c6d522c61c703</originalsourceid><addsrcrecordid>eNqNkUtr3DAURkVpodOk_0EUWrqxqytLlrQqkyGPhkmy6AuyEbJGDpp6rESy6cy_rzwTUuiiRAs9uOceuPoQwkBKyOvTugTOoaAK6pISIkoCkrNy-wLNngov0YwQQgshKXmN3qS0zk9Qks1QMx8G43vf32GDL8Im3LnehTHhK29jSEMc7TBGh0Ob67f9TXFiklvhq7EbfGd2LuIfJvo0hIibHV6EPrdkX0a--n5wMYuP0avWdMm9fTyP0Pez02-Li2J5c_5lMV8WlgnGCito1TaNsI4ZyURTt7AyzhLpOFE11LYlStlamkpIrtqWWEptveLTDlaQ6gh9OHjvY3gYXRr0xifrus7sJ9IVKGBE1Bn8-F8QiKSgKJcio-_-QddhjH0eQ1MQikpOJkgeoOnHUnStvo9-Y-Ium_QUkl7rKQs9ZaGnkPQ-JL3Nre8f_SZZ07XR9Nanv_0KQAJTmft84H77zu2e7deX88Xp_p4NxcGQw3LbJ4OJv3QtKsH1z-tzfbakgokTom-rPyzKs-A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>217928507</pqid></control><display><type>article</type><title>Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering</title><source>Wiley Online Library Journals Frontfile Complete</source><creator>Lee, Wen-His ; Chen, Wei-Ting ; Su, Chi-Yi</creator><creatorcontrib>Lee, Wen-His ; Chen, Wei-Ting ; Su, Chi-Yi</creatorcontrib><description>The performance of a ZnO‐based multilayer varistor (MLV) is affected strongly by the homogeneity of its microstructure. In this study, a homogeneous microstructure of ZnO‐based MLV was attained by using constrained sintering when nonreactive borosilicate glass +90 wt% alumina (Al2O3) was used as a constraining layer laminated on both sides of the multilayer ZnO‐based MLV. The mean grain size and the distribution of grain size of ZnO‐based MLVs are both reduced because by constrained sintering, an in‐plane tensile stress results from constrained sintering in the x–y plane of a multilayer device, which could modify the densification rate of the dielectric materials.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/j.1551-2916.2007.01854.x</identifier><identifier>CODEN: JACTAW</identifier><language>eng</language><publisher>Malden, USA: Blackwell Publishing Inc</publisher><subject>Aluminum oxide ; Applied sciences ; Building materials. Ceramics. Glasses ; Ceramic industries ; Ceramic sintering ; Ceramics ; Chemical industry and chemicals ; Conductors, resistors (including thermistors, varistors, and photoresistors) ; Constraints ; Electronic devices ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Electrotechnical and electronic ceramics ; Exact sciences and technology ; Glass ; Grain size ; Materials science ; Microstructure ; Multilayers ; Sintering ; Technical ceramics ; Varistors</subject><ispartof>Journal of the American Ceramic Society, 2007-10, Vol.90 (10), p.3296-3298</ispartof><rights>2007 INIST-CNRS</rights><rights>Copyright American Ceramic Society Oct 2007</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4744-c723fbb7ce4a847b6f1daec08e509616cf099c68a37859ff0c22c6d522c61c703</citedby><cites>FETCH-LOGICAL-c4744-c723fbb7ce4a847b6f1daec08e509616cf099c68a37859ff0c22c6d522c61c703</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1111%2Fj.1551-2916.2007.01854.x$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,776,780,1411,27901,27902,45551</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=19118149$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Lee, Wen-His</creatorcontrib><creatorcontrib>Chen, Wei-Ting</creatorcontrib><creatorcontrib>Su, Chi-Yi</creatorcontrib><title>Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering</title><title>Journal of the American Ceramic Society</title><description>The performance of a ZnO‐based multilayer varistor (MLV) is affected strongly by the homogeneity of its microstructure. In this study, a homogeneous microstructure of ZnO‐based MLV was attained by using constrained sintering when nonreactive borosilicate glass +90 wt% alumina (Al2O3) was used as a constraining layer laminated on both sides of the multilayer ZnO‐based MLV. The mean grain size and the distribution of grain size of ZnO‐based MLVs are both reduced because by constrained sintering, an in‐plane tensile stress results from constrained sintering in the x–y plane of a multilayer device, which could modify the densification rate of the dielectric materials.</description><subject>Aluminum oxide</subject><subject>Applied sciences</subject><subject>Building materials. Ceramics. Glasses</subject><subject>Ceramic industries</subject><subject>Ceramic sintering</subject><subject>Ceramics</subject><subject>Chemical industry and chemicals</subject><subject>Conductors, resistors (including thermistors, varistors, and photoresistors)</subject><subject>Constraints</subject><subject>Electronic devices</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Electrotechnical and electronic ceramics</subject><subject>Exact sciences and technology</subject><subject>Glass</subject><subject>Grain size</subject><subject>Materials science</subject><subject>Microstructure</subject><subject>Multilayers</subject><subject>Sintering</subject><subject>Technical ceramics</subject><subject>Varistors</subject><issn>0002-7820</issn><issn>1551-2916</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNqNkUtr3DAURkVpodOk_0EUWrqxqytLlrQqkyGPhkmy6AuyEbJGDpp6rESy6cy_rzwTUuiiRAs9uOceuPoQwkBKyOvTugTOoaAK6pISIkoCkrNy-wLNngov0YwQQgshKXmN3qS0zk9Qks1QMx8G43vf32GDL8Im3LnehTHhK29jSEMc7TBGh0Ob67f9TXFiklvhq7EbfGd2LuIfJvo0hIibHV6EPrdkX0a--n5wMYuP0avWdMm9fTyP0Pez02-Li2J5c_5lMV8WlgnGCito1TaNsI4ZyURTt7AyzhLpOFE11LYlStlamkpIrtqWWEptveLTDlaQ6gh9OHjvY3gYXRr0xifrus7sJ9IVKGBE1Bn8-F8QiKSgKJcio-_-QddhjH0eQ1MQikpOJkgeoOnHUnStvo9-Y-Ium_QUkl7rKQs9ZaGnkPQ-JL3Nre8f_SZZ07XR9Nanv_0KQAJTmft84H77zu2e7deX88Xp_p4NxcGQw3LbJ4OJv3QtKsH1z-tzfbakgokTom-rPyzKs-A</recordid><startdate>200710</startdate><enddate>200710</enddate><creator>Lee, Wen-His</creator><creator>Chen, Wei-Ting</creator><creator>Su, Chi-Yi</creator><general>Blackwell Publishing Inc</general><general>Blackwell</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope><scope>7QF</scope></search><sort><creationdate>200710</creationdate><title>Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering</title><author>Lee, Wen-His ; Chen, Wei-Ting ; Su, Chi-Yi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4744-c723fbb7ce4a847b6f1daec08e509616cf099c68a37859ff0c22c6d522c61c703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Aluminum oxide</topic><topic>Applied sciences</topic><topic>Building materials. Ceramics. Glasses</topic><topic>Ceramic industries</topic><topic>Ceramic sintering</topic><topic>Ceramics</topic><topic>Chemical industry and chemicals</topic><topic>Conductors, resistors (including thermistors, varistors, and photoresistors)</topic><topic>Constraints</topic><topic>Electronic devices</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Electrotechnical and electronic ceramics</topic><topic>Exact sciences and technology</topic><topic>Glass</topic><topic>Grain size</topic><topic>Materials science</topic><topic>Microstructure</topic><topic>Multilayers</topic><topic>Sintering</topic><topic>Technical ceramics</topic><topic>Varistors</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Wen-His</creatorcontrib><creatorcontrib>Chen, Wei-Ting</creatorcontrib><creatorcontrib>Su, Chi-Yi</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Aluminium Industry Abstracts</collection><jtitle>Journal of the American Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Wen-His</au><au>Chen, Wei-Ting</au><au>Su, Chi-Yi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering</atitle><jtitle>Journal of the American Ceramic Society</jtitle><date>2007-10</date><risdate>2007</risdate><volume>90</volume><issue>10</issue><spage>3296</spage><epage>3298</epage><pages>3296-3298</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><coden>JACTAW</coden><abstract>The performance of a ZnO‐based multilayer varistor (MLV) is affected strongly by the homogeneity of its microstructure. In this study, a homogeneous microstructure of ZnO‐based MLV was attained by using constrained sintering when nonreactive borosilicate glass +90 wt% alumina (Al2O3) was used as a constraining layer laminated on both sides of the multilayer ZnO‐based MLV. The mean grain size and the distribution of grain size of ZnO‐based MLVs are both reduced because by constrained sintering, an in‐plane tensile stress results from constrained sintering in the x–y plane of a multilayer device, which could modify the densification rate of the dielectric materials.</abstract><cop>Malden, USA</cop><pub>Blackwell Publishing Inc</pub><doi>10.1111/j.1551-2916.2007.01854.x</doi><tpages>3</tpages></addata></record> |
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subjects | Aluminum oxide Applied sciences Building materials. Ceramics. Glasses Ceramic industries Ceramic sintering Ceramics Chemical industry and chemicals Conductors, resistors (including thermistors, varistors, and photoresistors) Constraints Electronic devices Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Electrotechnical and electronic ceramics Exact sciences and technology Glass Grain size Materials science Microstructure Multilayers Sintering Technical ceramics Varistors |
title | Attaining a Homogeneous Microstructure of a ZnO-Based Multilayer Varistor by Constrained Sintering |
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